Scanning electron microscopic examination of different...

Scanning electron microscopic examination of different cleaners: surface contaminant removal from dentures

Y. KULAK, A. ARIKAN, S. ALBAK, I. OKAR, E. KAZAZOĞLU
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Volume:
24
Year:
1997
Language:
english
Pages:
7
DOI:
10.1111/j.1365-2842.1997.tb00315.x
File:
PDF, 7.44 MB
english, 1997
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