Properties of FIRBACK–ELAIS 175-μm sources in the ELAIS N2...

Properties of FIRBACK–ELAIS 175-μm sources in the ELAIS N2 region

E. L. Taylor, R. G. Mann, A. N. Efstathiou, T. S. R. Babbedge, M. Rowan-Robinson, G. Lagache, A. Lawrence, S. Mei, M. Vaccari, Ph. Héraudeau, S. J. Oliver, M. Dennefeld, I. Perez-Fournon, S. Serjeant,
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Volume:
361
Year:
2005
Language:
english
Pages:
23
DOI:
10.1111/j.1365-2966.2005.09273.x
File:
PDF, 1.61 MB
english, 2005
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