Efficient Raytracing of Deforming Point-Sampled Surfaces

Efficient Raytracing of Deforming Point-Sampled Surfaces

Bart Adams, Richard Keiser, Mark Pauly, Leonidas J. Guibas, Markus Gross, Philip Dutré
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Volume:
24
Year:
2005
Language:
english
Pages:
8
DOI:
10.1111/j.1467-8659.2005.00892.x
File:
PDF, 1.48 MB
english, 2005
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