Symmetry Detection Using Feature Lines

Symmetry Detection Using Feature Lines

M. Bokeloh, A. Berner, M. Wand, H.-P. Seidel, A. Schilling
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Volume:
28
Year:
2009
Language:
english
Pages:
10
DOI:
10.1111/j.1467-8659.2009.01410.x
File:
PDF, 13.88 MB
english, 2009
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