Model-based measurement of latent risk in time series with applications
Frits Bijleveld, Jacques Commandeur, Phillip Gould, Siem Jan KoopmanVolume:
171
Year:
2008
Language:
english
Pages:
13
DOI:
10.1111/j.1467-985x.2007.00496.x
File:
PDF, 610 KB
english, 2008