Single Crystal X-Ray Diffraction Study of CsHSi2O5.

ChemInform 2003 Vol. 34; Iss. 33

Single Crystal X-Ray Diffraction Study of CsHSi2O5.

Guido Doersam, Volker Kahlenberg, Reinhard X. Fischer
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Volume:
34
Year:
2003
Pages:
1
DOI:
10.1002/chin.200333009
File:
PDF, 73 KB
2003
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