Molecularly thin films of metallodendrimers
Wilhelm T. S. Huck, Frank C. J. M. van Veggel, Sergei S. Sheiko, Martin Möller, David N. ReinhoudtVolume:
11
Year:
1998
Language:
english
Pages:
6
DOI:
10.1002/(sici)1099-1395(199808/09)11:8/93.0.co;2-8
File:
PDF, 3.09 MB
english, 1998