Issues in Biometrics: Offset Potentials and the Electrical...

Issues in Biometrics: Offset Potentials and the Electrical Stability of Ag/AgCl Electrodes

Louis G. Tassinary, Thomas R. Geen, John T. Cacioppo, Robert Edelberg
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Volume:
27
Year:
1990
Pages:
7
DOI:
10.1111/j.1469-8986.1990.tb00376.x
File:
PDF, 1.78 MB
1990
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