Joint Modeling of Progression of HIV Resistance Mutations...

Biometrics 2007 Vol. 63; Iss. 1

Joint Modeling of Progression of HIV Resistance Mutations Measured with Uncertainty and Failure Time Data

Chengcheng Hu, Victor De Gruttola
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Volume:
63
Year:
2007
Language:
english
Pages:
9
DOI:
10.1111/j.1541-0420.2006.00635.x
File:
PDF, 180 KB
english, 2007
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