Microstructural Characterization and Phase Development at...

Microstructural Characterization and Phase Development at the Interface Between Aluminum Nitride and Titanium After Annealing at 1300°–1500°C

Chia-Hsiang Chiu, Chien-Cheng Lin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
89
Year:
2006
Language:
english
Pages:
10
DOI:
10.1111/j.1551-2916.2005.00880.x
File:
PDF, 1.37 MB
english, 2006
Conversion to is in progress
Conversion to is failed