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Microstructural Characterization and Phase Development at the Interface Between Aluminum Nitride and Titanium After Annealing at 1300°–1500°C
Chia-Hsiang Chiu, Chien-Cheng LinVolume:
89
Year:
2006
Language:
english
Pages:
10
DOI:
10.1111/j.1551-2916.2005.00880.x
File:
PDF, 1.37 MB
english, 2006