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Evaluation of Grain-Boundary Conduction of Dense AlN–SiC Solid Solution by Scanning Nonlinear Dielectric Microscopy
Ryota Kobayashi, Junichi Tatami, Toru Wakihara, Katsutoshi Komeya, Takeshi Meguro, Rong Tu, Takashi GotoVolume:
93
Year:
2010
Language:
english
Pages:
4
DOI:
10.1111/j.1551-2916.2010.04230.x
File:
PDF, 1.14 MB
english, 2010