Volume 102; Issue 3

International Journal of Fracture

Volume 102; Issue 3
1

Interface crack interacting with a microvoid in the near-tip process zone

Han Jian-Jun, Chen Yi-Heng
Journal:
International Journal of Fracture
Year:
2000
Language:
english
File:
PDF, 148 KB
english, 2000
4

Dislocation emission criterion for a wedge crack under mixed mode loading

Bi-Trong Chen, Sanboh Lee
Journal:
International Journal of Fracture
Year:
2000
Language:
english
File:
PDF, 168 KB
english, 2000
5

Mode

A.Y.T. Leung, K.L. Tsang
Journal:
International Journal of Fracture
Year:
2000
Language:
english
File:
PDF, 98 KB
english, 2000
8

Correction methods of an apparent negative crack growth phenomenon

Chang-Sung Seok
Journal:
International Journal of Fracture
Year:
2000
Language:
english
File:
PDF, 101 KB
english, 2000