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Volume 53; Issue 3
Main
Journal of Applied Crystallography
Volume 53; Issue 3
Journal of Applied Crystallography
Volume 53; Issue 3
1
Impact and behavior of Sn during the Ni/GeSn solid-state reaction
Quintero, Andrea
,
Gergaud, Patrice
,
Hartmann, Jean-Michel
,
Delaye, Vincent
,
Reboud, Vincent
,
Cassan, Eric
,
Rodriguez, Philippe
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.60 MB
Your tags:
2020
2
Sub-millisecond time-resolved small-angle neutron scattering measurements at NIST
Glinka, Charles
,
Bleuel, Markus
,
Tsai, Peter
,
Zákutná, Dominika
,
Honecker, Dirk
,
Dresen, Dominique
,
Mees, Flore
,
Disch, Sabrina
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 917 KB
Your tags:
2020
3
SVAT4 : a computer program for visualization and analysis of crystal structures
Li, X.-Z.
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.20 MB
Your tags:
2020
4
SAS PDF: pair distribution function analysis of nanoparticle assemblies from small-angle scattering data
Liu, Chia-Hao
,
Janke, Eric M.
,
Li, Ruipen
,
Juhás, Pavol
,
Gang, Oleg
,
Talapin, Dmitri V.
,
Billinge, Simon J. L.
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.54 MB
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2020
5
Dual-energy crystal-analyzer scheme for spectral tomography
Zolotov, Denis
,
Buzmakov, Alexey
,
Grigoriev, Maxim
,
Schelokov, Igor
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.54 MB
Your tags:
2020
6
Stochastic models of dense or hollow nanoparticles and their scattering properties
Gommes, Cedric J.
,
Chattot, Raphael
,
Drnec, Jakub
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.64 MB
Your tags:
2020
7
Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method
Ida, Takashi
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.26 MB
Your tags:
2020
8
Accurate high-resolution single-crystal diffraction data from a Pilatus3â X CdTe detector
Krause, Lennard
,
Tolborg, Kasper
,
Grønbech, Thomas Bjørn Egede
,
Sugimoto, Kunihisa
,
Iversen, Bo Brummerstedt
,
Overgaard, Jacob
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 2.06 MB
Your tags:
2020
9
Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near Ï
Gureva, P. V.
,
Marchenkov, N. V.
,
Artemev, A. N.
,
Artemiev, N. A.
,
Belyaev, A. D.
,
Demkiv, A. A.
,
Shishkov, V. A.
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 551 KB
Your tags:
2020
10
Full reciprocal-space mapping up to 2000â K under controlled atmosphere: the multipurpose QMAX furnace
Guinebretière, René
,
Arnaud, Stephan
,
Blanc, Nils
,
Boudet, Nathalie
,
Thune, Elsa
,
Babonneau, David
,
Castelnau, Olivier
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.95 MB
Your tags:
2020
11
Information gain from isotopic contrast variation in neutron reflectometry on proteinâmembrane complex structures
Heinrich, Frank
,
Kienzle, Paul A.
,
Hoogerheide, David P.
,
Lösche, Mathias
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 1.59 MB
Your tags:
2020
12
How To Be a Better Scientist . By Andrew C. Johnson and John P. Sumpter. Taylor and Francis, 2018. Pp. 248. Price GBP 15.19 ISBN 9781138731295 (paperback), GBP 76.00 ISBN 9781138731219 (hardback), GBP 12.34 ISBN 9781315189079 (ebook).
Helliwell, John R.
Journal:
Journal of Applied Crystallography
Year:
2020
File:
PDF, 221 KB
Your tags:
2020
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