Volume 38; Issue 1-2

Journal of Electrostatics

Volume 38; Issue 1-2
1

Failure analysis of shallow trench isolated ESD structures

James M. Never, Steven H. Voldman
Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 1014 KB
english, 1996
6

Latent gate oxide damages caused by CDM-ESD

Joachim C. Reiner
Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 1.25 MB
english, 1996
7

Melt filaments in n+pn+ lateral bipolar ESD protection devices

Neal K. Clark, Krishna Parat, Timothy J. Maloney, Yudong Kim
Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 1.09 MB
english, 1996
8

ESD: waveform calculation, field and current of human and simulator ESD

David Pommerenke, Martin Aidam
Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 990 KB
english, 1996
9

Editorial Board

Journal:
Journal of Electrostatics
Year:
1996
File:
PDF, 21 KB
1996
10

Editorial

William D. Greason
Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 45 KB
english, 1996
11

Calendar

Journal:
Journal of Electrostatics
Year:
1996
Language:
english
File:
PDF, 39 KB
english, 1996