Volume 54; Issue 1

Main
Journal of Electrostatics
Volume 54; Issue 1

Journal of Electrostatics

Volume 54; Issue 1

1

Generalized model of electrostatic discharge (ESD) for bodies in approach: analyses of multiple discharges and speed of approach

William D Greason

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 184 KB

english, 2002

2

ESD-level circuit simulation impact of interconnect RC-delay on HBM and CDM behavior

Markus P.J Mergens, Wolfgang Wilkening, Gerhard Kiesewetter, Stephan Mettler, Heinrich Wolf, Jürgen Hieber, Wolfgang Fichtner

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 472 KB

english, 2002

3

Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry

S. Voldman, D. Hui, D. Young, R. Williams, D. Dreps, J. Howard, M. Sherony, F. Assaderaghi, G. Shahidi

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 444 KB

english, 2002

4

Layout design to minimize voltage-dependent variation on input capacitance of an analog ESD protection circuit

Ming-Dou Ker, Tung-Yang Chen

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 808 KB

english, 2002

5

The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

Vladimir Kraz, Albert Wallash

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 415 KB

english, 2002

6

Editorial

William D. Greason

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 46 KB

english, 2002

7

Calendar

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 52 KB

english, 2002

8

Measurement technique developed to evaluate transient EMI in a photo bay

Andrew C. Rudack, Michael Pendley, Larry Levit

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 202 KB

english, 2002

9

Investigation on different ESD protection strategies devoted to 3.3 V RF applications (2 GHz) in a 0.18 μm CMOS process

C Richier, P Salome, G Mabboux, I Zaza, A Juge, P Mortini

Journal:

Journal of Electrostatics

Year:

2002

Language:

english

File:

PDF, 668 KB

english, 2002

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