Volume 26; Issue 4

Journal of Materials Research

Volume 26; Issue 4
1

Improved electrical and dielectric properties of La-doped Co ferrite

Year:
2011
Language:
english
File:
PDF, 673 KB
english, 2011
15

Electromigration-induced strain relaxation in Cu conductor lines

Year:
2011
Language:
english
File:
PDF, 478 KB
english, 2011
17

JMR volume 26 issue 4 Cover and Front matter

Year:
2011
Language:
english
File:
PDF, 198 KB
english, 2011
18

JMR volume 26 issue 4 Cover and Back matter

Year:
2011
Language:
english
File:
PDF, 922 KB
english, 2011