Volume 180; Issue 3

Journal of Microscopy

Volume 180; Issue 3
1

Introduction

Year:
1995
Language:
english
File:
PDF, 61 KB
english, 1995
2

Recent developments in secondary electron imaging

Year:
1995
Language:
english
File:
PDF, 2.27 MB
english, 1995
3

Near-atomic-resolution EELS in silicon-germanium alloys

Year:
1995
Language:
english
File:
PDF, 1.29 MB
english, 1995
7

Probing the local structure and bonding at interfaces and defects using EELS in the TEM

Year:
1995
Language:
english
File:
PDF, 2.68 MB
english, 1995
10

Spatial resolution in EFTEM elemental maps

Year:
1995
Language:
english
File:
PDF, 1.38 MB
english, 1995
12

Energy losses in colloidal metals

Year:
1995
Language:
english
File:
PDF, 1.05 MB
english, 1995
13

Segregation-induced hole drilling at grain boundaries

Year:
1995
Language:
english
File:
PDF, 1.83 MB
english, 1995
14

Oxygen K near-edge spectra of amorphous silicon suboxides

Year:
1995
Language:
english
File:
PDF, 680 KB
english, 1995
17

Erratum

Year:
1995
Language:
english
File:
PDF, 568 KB
english, 1995