Volume 245; Issue 2

Journal of Microscopy

Volume 245; Issue 2
1

Optimization of EBSD parameters for ultra-fast characterization

Year:
2012
Language:
english
File:
PDF, 1.21 MB
english, 2012
2

Mechanical properties of asphalt binders evaluated by atomic force microscopy

Year:
2012
Language:
english
File:
PDF, 1.85 MB
english, 2012
7

Backscattered electron detection in environmental SEM

Year:
2012
Language:
english
File:
PDF, 1.13 MB
english, 2012
8

TEM image analysis and modelling: application to boehmite nanoparticles

Year:
2012
Language:
english
File:
PDF, 1.36 MB
english, 2012
9

A pattern recognition method for lattice distortion measurement from HRTEM images

Year:
2012
Language:
english
File:
PDF, 950 KB
english, 2012