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Volume 245; Issue 2
Main
Journal of Microscopy
Volume 245; Issue 2
Journal of Microscopy
Volume 245; Issue 2
1
Optimization of EBSD parameters for ultra-fast characterization
Y. CHEN
,
J. HJELEN
,
S.S. GIREESH
,
H.J. ROVEN
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.21 MB
Your tags:
english, 2012
2
Mechanical properties of asphalt binders evaluated by atomic force microscopy
E.R. DOURADO
,
R.A. SIMAO
,
L.F.M. LEITE
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.85 MB
Your tags:
english, 2012
3
Analytical electron microscopy of black carbon and microaggregated mineral matter in Amazonian dark Earth
C.H. CHIA
,
P. MUNROE
,
S.D. JOSEPH
,
Y. LIN
,
J. LEHMANN
,
D.A. MULLER
,
H.L. XIN
,
E. NEVES
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.07 MB
Your tags:
english, 2012
4
Segmentation of virus particle candidates in transmission electron microscopy images
G. KYLBERG
,
M. UPPSTRÖM
,
K.-O. HEDLUND
,
G. BORGEFORS
,
I.-M. SINTORN
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 884 KB
Your tags:
english, 2012
5
Digital correction of motion artefacts in microscopy image sequences collected from living animals using rigid and nonrigid registration
K. S. LORENZ
,
P. SALAMA
,
K. W. DUNN
,
E. J. DELP
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.24 MB
Your tags:
english, 2012
6
High-resolution cell outline segmentation and tracking from phase-contrast microscopy images
M.E. AMBÜHL
,
C. BREPSANT
,
J.-J. MEISTER
,
A.B. VERKHOVSKY
,
I.F. SBALZARINI
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.04 MB
Your tags:
english, 2012
7
Backscattered electron detection in environmental SEM
G.D. DANILATOS
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2012
8
TEM image analysis and modelling: application to boehmite nanoparticles
M. MOREAUD
,
D. JEULIN
,
V. MORARD
,
R. REVEL
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.36 MB
Your tags:
english, 2012
9
A pattern recognition method for lattice distortion measurement from HRTEM images
P. PRZYBYŁA
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 950 KB
Your tags:
english, 2012
10
A 2D MEMS mirror with sidewall electrodes applied for confocal MACROscope imaging
Y. BAI
,
M. PALLAPA
,
A. CHEN
,
P. CONSTANTINOU
,
S. DAMASKINOS
,
B.C. WILSON
,
J.T.W. YEOW
Journal:
Journal of Microscopy
Year:
2012
Language:
english
File:
PDF, 1.81 MB
Your tags:
english, 2012
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