Volume 36; Issue 10A

Journal of Physics D Applied Physics

Volume 36; Issue 10A

1

Devices for low frequency stroboscopic x-ray diffraction imaging

Lorut, F, Pernot, E, Pernot-Rejm nkov , P, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 409 KB

english, 2003

2

Visualization of short surface acoustic waves by stroboscopic x-ray topography: analysis of contrast

Shilo, D, Zolotoyabko, E

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 262 KB

english, 2003

3

The influence of in situ photoexcitation on a defect structure generation in Ar implanted GaAs(001) crystals revealed by high-resolution x-ray diffraction and Rutherford backscattering spectroscopy

Chtcherbatchev, K D, Bublik, V T, Markevich, A S, Mordkovich, V N, Alves, E, Barradas, N P, Sequeira, A D

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 142 KB

english, 2003

4

X-ray interference topography investigation of Si/Ge x Si 1 x /Si(001) heterosystem

Fedorov, A A, Trukhanov, E M, Vasilenko, A P, Kolesnikov, A V, Revenko, M A

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 422 KB

english, 2003

5

Mathematical analysis of the high-resolution reciprocal space map

Godwod, K, ymierska, D, Auleytner, J

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 177 KB

english, 2003

6

Preliminary in situ and real-time study of directional solidification of metallic alloys by x-ray imaging techniques

Thi, H Nguyen, Jamgotchian, H, Gastaldi, J, H rtwig, J, Schenk, T, Klein, H, Billia, B, Baruchel, J, Dabo, Y

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 221 KB

english, 2003

7

Determination of Ga interdiffusion in InAs : GaAs(001) islands by x-ray reciprocal space mapping

Malachias, A, Rodrigues, W N, Moreira, M V B, Kycia, S, Magalh es-Paniago, R

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 168 KB

english, 2003

8

Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC

Dudley, Michael, Huang, XianRong, Vetter, William M

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 1.06 MB

english, 2003

9

Exploiting the x-ray refraction contrast with an analyser: the state of the art

Bravin, Alberto

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 302 KB

english, 2003

10

A novel digital x-ray topography system

Bowen, D K, Wormington, M, Feichtinger, P

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 392 KB

english, 2003

11

Development of x-ray topographic microscopy for the study of electromigration in interconnects

Solak, H H, David, C, Gobrecht, J, Drakopoulos, M

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 186 KB

english, 2003

12

Dynamical diffraction in layered systems - a quest for the final formula

Hol, V, Fewster, P F

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 266 KB

english, 2003

13

X-ray microscopy in Zernike phase contrast mode at 4 keV photon energy with 60 nm resolution

Neuh usler, U, Schneider, G, Ludwig, W, Meyer, M A, Zschech, E, Hambach, D

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 815 KB

english, 2003

14

New investigation of the low asymmetric x-ray Bragg diffraction by a bent crystal

Shevchenko, M B, Pobydaylo, O V, Molodkin, V B

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 75 KB

english, 2003

15

A new DEI algorithm capable of investigating sub-pixel structures

Rigon, Luigi, Besch, Hans-Juergen, Arfelli, Fulvia, Menk, Ralf-Hendrik, Heitner, Gabriele, Plothow-Besch, Hartmute

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 200 KB

english, 2003

16

Investigation of GaAs based layers through the measurement of very weak x-ray reflections

Kowalski, G, Frymark, I, Kami ska, M

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 101 KB

english, 2003

17

Strain evolution in hydrogen-implanted silicon

Miclaus, C, Goorsky, M S

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 133 KB

english, 2003

18

X-ray imaging study of lattice defects related to diffusion of helium in quartz

Argunova, T S, Sorokin, L M, Pevzner, B Z, Je, J H, Hwu, Y, Tsai, W-L

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 813 KB

english, 2003

19

Two-dimensional x-ray magnification based on a monolithic beam conditioner

Koryt r, D, Mikul k, P, Ferrari, C, Hrd , J, Baumbach, T, Freund, A, Kubena, A

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 419 KB

english, 2003

20

Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping

Mikul k, P, L bbert, D, Koryt r, D, Pernot, P, Baumbach, T

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 187 KB

english, 2003

21

Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II

Panzner, T, Leitenberger, W, Grenzer, J, Bodenthin, Y, Geue, Th, Pietsch, U, M hwald, H

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 565 KB

english, 2003

22

SiC substrate defects and III-N heteroepitaxy

Poust, B D, Koga, T S, Sandhu, R, Heying, B, Hsing, R, Wojtowicz, M, Khan, A, Goorsky, M S

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 428 KB

english, 2003

23

Asymmetric Bragg reflection as x-ray magnifier

Sch fer, P, K hler, R

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 599 KB

english, 2003

24

Observation of the phase coexistence in -Fe 2 O 3 at the Morin transition by synchrotron radiation white beam section topography

Schetinkin, S A, Wheeler, E, Kvardakov, V V, Schlenker, M, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 527 KB

english, 2003

25

Opalescence of quartz: a study by high energy x-ray diffraction

Bastie, P, Dolino, G, Hamelin, B

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 256 KB

english, 2003

26

High energy x-ray scattering studies of strongly correlated oxides

Hatton, Peter D, Wilkins, S B, Spencer, P D, Zimmermann, M v, d'Almeida, T

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 673 KB

english, 2003

27

X-ray diffraction determination of the interface structure of CdSe/BeTe superlattices

Kyutt, R N, Shubina, T V, Sorokin, S V, Solnyshkov, D D, Ivanov, S V, Willander, M

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 177 KB

english, 2003

28

Kinetics of the field induced commensurate to ferro-electric phase transition in thiourea

Liss, K-D, Kaiser, M, Hlinka, J, Denoyer, F, Hock, R, Currat, R

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 167 KB

english, 2003

29

GaN polarity domains spatially resolved by x-ray standing wave microscopy

Drakopoulos, M, Zegenhagen, J, Lee, T-L, Snigirev, A, Snigireva, I, Cimalla, V, Ambacher, O

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 166 KB

english, 2003

30

Grazing incidence x-ray diffraction at free-standing nanoscale islands: fine structure of diffuse scattering

Grigoriev, D, Hanke, M, Schmidbauer, M, Sch fer, P, Konovalov, O, K hler, R

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 474 KB

english, 2003

31

Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy

Hase, T P A, Ho, E M, Freijo, J-J, Thompson, S M, Petford-Long, A K, Tanner, B K

Journal:

Journal of Physics D Applied Physics

Year:

2003

Language:

english

File:

PDF, 465 KB

english, 2003