Volume 52; Issue 3

Materials Chemistry and Physics

Volume 52; Issue 3
2

Elastic moduli prediction and correlation in SiO2-based glasses

Year:
1998
Language:
english
File:
PDF, 384 KB
english, 1998
3

FEOL technology trend

Year:
1998
Language:
english
File:
PDF, 795 KB
english, 1998
5

Imaging defects in metals with a positron re-emission microscope

Year:
1998
Language:
english
File:
PDF, 858 KB
english, 1998
6

The properties of ZnSc layers grown on GaAs and Si substrates by atomic layer epitaxy

Year:
1998
Language:
english
File:
PDF, 770 KB
english, 1998
11

Effects of CTBN on the cure characteristics of DGEBA/MDA/PGE-AcAm system

Year:
1998
Language:
english
File:
PDF, 303 KB
english, 1998