Volume 20; Issue 4

Main
Measurement
Volume 20; Issue 4

Measurement

Volume 20; Issue 4

1

Television diagnostics of microobjects at vibrating excitation

D.A. Usanov, V.P. Ryabukho, A.V. Skripal

Journal:

Year:

1997

Language:

english

File:

PDF, 489 KB

english, 1997

2

Thin thickness measurements by means of a wavelet transform-based method

L. Angrisani, P. Daponte

Journal:

Year:

1997

Language:

english

File:

PDF, 1.05 MB

english, 1997

3

Roughness measurement by electronic speckle correlation and mechanical profilometry

Guiseppe Schirripa Spagnolo, Domenica Paoletti, Alfonso Paoletti, Dario Ambrosini

Journal:

Year:

1997

Language:

english

File:

PDF, 421 KB

english, 1997

4

Coordinate measuring machines and systems: John A. Bosch (Ed.), Marcel Dekker, Inc., New York/Basel/Hong Kong, 1995, 1st Edition, xi + 444 pp., ISBN 0-8247-9581-4, price: 125,00 US$

Journal:

Year:

1997

Language:

english

File:

PDF, 80 KB

english, 1997

5

Accurate neural model identification of measurement devices

Andrea Bernieri, Pasquale Daponte, Domenico Grimaldi

Journal:

Year:

1997

Language:

english

File:

PDF, 514 KB

english, 1997

6

Creative measurement in view of the scope of metrology

Krzystof Gniotek

Journal:

Year:

1997

Language:

english

File:

PDF, 631 KB

english, 1997

7

Neural networks applied for the identification and fault diagnosis of process valves and actuators

Joseph McGhee, Ian A. Henderson, Alistair Baird

Journal:

Year:

1997

Language:

english

File:

PDF, 697 KB

english, 1997

8

A VXI instrument for real-time tracking of impedances

L. Angrisani, A. Baccigalupi, A. Pietrosanto

Journal:

Year:

1997

Language:

english

File:

PDF, 676 KB

english, 1997

9

Author index volume 20

Journal:

Year:

1997

Language:

english

File:

PDF, 132 KB

english, 1997

10

Contents volume 20

Journal:

Year:

1997

Language:

english

File:

PDF, 96 KB

english, 1997