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Volume 39; Issue 12
Main
Measurement Techniques
Volume 39; Issue 12
Measurement Techniques
Volume 39; Issue 12
1
Method for determination of strong interaction constants from hadronic mass spectra
V. V. Khrushchev
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 233 KB
Your tags:
english, 1996
2
Determination of the computational component of measurement error in measurement information systems
S. M. Ermishin
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 338 KB
Your tags:
english, 1996
3
Computation of reliability indicators for measurement monitoring of multi-parametric systems
N. S. Kulish
,
V. M. Konopatskii
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 455 KB
Your tags:
english, 1996
4
Approach to optimization of metrological support for self-testing automatic measurement systems
S. V. Strelov
,
T. V. Shaloshnikova
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 265 KB
Your tags:
english, 1996
5
Sensor-96 Conference
V. N. Azarov
,
A. F. Kaperko
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 67 KB
Your tags:
english, 1996
6
Measurement methods using the properties of nonlinear dynamics systems
S. S. Voronov
,
L. V. Kolpakova
,
V. A. Kuznetsov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 327 KB
Your tags:
english, 1996
7
Normative, methodical, and information assurance of tests and certification of sensors
V. N. Khramenkov
,
A. Yu. Kuzin
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 345 KB
Your tags:
english, 1996
8
Use of microprocessors in devices utilizing fiber-optic sensors
Yu. I. Gudkov
,
E. A. Zak
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 385 KB
Your tags:
english, 1996
9
Method of determining the angular position of parts of an object relative to its center
A. L. Drzhevetskiį
,
G. G. Belikov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 160 KB
Your tags:
english, 1996
10
Measurement of the divergence angle of the electron microprobe of a scanning electron microscope
Yu. A. Novikov
,
A. V. Rakov
,
I. Yu. Stekolin
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 176 KB
Your tags:
english, 1996
11
Photoelectric method of measuring the rotation period of a turbine drive shaft
M. I. Kiselev
,
A. P. Kozlov
,
A. N. Morozov
,
A. L. Hazolin
,
V. I. Pronyakin
,
A. V. Solov'ev
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 139 KB
Your tags:
english, 1996
12
Procedure for computing the scattering indicatrix in the optical range on the basis of a reflection coefficient etalon
A. V. Ustinov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1996
13
Increasing the accuracy of optoelectronic time-pulse measuring instruments for angular and linear deviations
L. S. Priver
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 316 KB
Your tags:
english, 1996
14
Magnetometric determination of the angular position of an object
B. M. Smirnov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 253 KB
Your tags:
english, 1996
15
Effect of power supply failure on the metrological characteristics of solid-state voltage standards
A. V. Aprelev
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 205 KB
Your tags:
english, 1996
16
Direct algorithms for data analysis in the location of sources of radiation from measured differences in distance: Model experiment
A. N. Eremenko
,
N. L. Stal'
,
A. V. Fabrikov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 411 KB
Your tags:
english, 1996
17
Frequency-time method of correcting measurements of the radiation patterns of antennas
I. L. Andreev
,
A. V. Kuz'ma
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 226 KB
Your tags:
english, 1996
18
Method of measuring the parameters of microwave transistors
S. I. Podkovyrin
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 199 KB
Your tags:
english, 1996
19
Computer-aided system for measuring the static parameters of semiconductor devices
V. N. Petrov
,
M. N. Petrov
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 375 KB
Your tags:
english, 1996
20
Identification of the parameters of the materials of the carrier structures of radio-electronic systems using a computer-aided measuring bench
Yu. N. Kofanov
,
A. S. Shalumov
,
N. I. Gladyshev
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 332 KB
Your tags:
english, 1996
21
Progress in increasing the reliability of radioactive aerosol measurements
Journal:
Measurement Techniques
Year:
1996
Language:
english
File:
PDF, 257 KB
Your tags:
english, 1996
1
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