Volume 39; Issue 12

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Measurement Techniques
Volume 39; Issue 12

Measurement Techniques

Volume 39; Issue 12

1

Method for determination of strong interaction constants from hadronic mass spectra

V. V. Khrushchev

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 233 KB

english, 1996

2

Determination of the computational component of measurement error in measurement information systems

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 338 KB

english, 1996

3

Computation of reliability indicators for measurement monitoring of multi-parametric systems

N. S. Kulish, V. M. Konopatskii

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 455 KB

english, 1996

4

Approach to optimization of metrological support for self-testing automatic measurement systems

S. V. Strelov, T. V. Shaloshnikova

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 265 KB

english, 1996

5

Sensor-96 Conference

V. N. Azarov, A. F. Kaperko

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 67 KB

english, 1996

6

Measurement methods using the properties of nonlinear dynamics systems

S. S. Voronov, L. V. Kolpakova, V. A. Kuznetsov

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 327 KB

english, 1996

7

Normative, methodical, and information assurance of tests and certification of sensors

V. N. Khramenkov, A. Yu. Kuzin

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 345 KB

english, 1996

8

Use of microprocessors in devices utilizing fiber-optic sensors

Yu. I. Gudkov, E. A. Zak

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 385 KB

english, 1996

9

Method of determining the angular position of parts of an object relative to its center

A. L. Drzhevetskiį, G. G. Belikov

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 160 KB

english, 1996

10

Measurement of the divergence angle of the electron microprobe of a scanning electron microscope

Yu. A. Novikov, A. V. Rakov, I. Yu. Stekolin

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 176 KB

english, 1996

11

Photoelectric method of measuring the rotation period of a turbine drive shaft

M. I. Kiselev, A. P. Kozlov, A. N. Morozov, A. L. Hazolin, V. I. Pronyakin, A. V. Solov'ev

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 139 KB

english, 1996

12

Procedure for computing the scattering indicatrix in the optical range on the basis of a reflection coefficient etalon

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 101 KB

english, 1996

13

Increasing the accuracy of optoelectronic time-pulse measuring instruments for angular and linear deviations

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 316 KB

english, 1996

14

Magnetometric determination of the angular position of an object

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 253 KB

english, 1996

15

Effect of power supply failure on the metrological characteristics of solid-state voltage standards

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 205 KB

english, 1996

16

Direct algorithms for data analysis in the location of sources of radiation from measured differences in distance: Model experiment

A. N. Eremenko, N. L. Stal', A. V. Fabrikov

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 411 KB

english, 1996

17

Frequency-time method of correcting measurements of the radiation patterns of antennas

I. L. Andreev, A. V. Kuz'ma

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 226 KB

english, 1996

18

Method of measuring the parameters of microwave transistors

S. I. Podkovyrin

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 199 KB

english, 1996

19

Computer-aided system for measuring the static parameters of semiconductor devices

V. N. Petrov, M. N. Petrov

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 375 KB

english, 1996

20

Identification of the parameters of the materials of the carrier structures of radio-electronic systems using a computer-aided measuring bench

Yu. N. Kofanov, A. S. Shalumov, N. I. Gladyshev

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 332 KB

english, 1996

21

Progress in increasing the reliability of radioactive aerosol measurements

Journal:

Measurement Techniques

Year:

1996

Language:

english

File:

PDF, 257 KB

english, 1996