Volume 59; Issue 7

Measurement Techniques

Volume 59; Issue 7
3

Measurement of the Parameters of On-Wafer Semiconductor Devices

Year:
2016
Language:
english
File:
PDF, 390 KB
english, 2016
6

Studies of Thermophysical Properties of Ferrofluids

Year:
2016
Language:
english
File:
PDF, 142 KB
english, 2016
11

Linearization of the Frequency Response of a Microwave Sensor by Means of a Virtual Time Scale

Year:
2016
Language:
english
File:
PDF, 503 KB
english, 2016