Volume 45; Issue 3

Metrologia

Volume 45; Issue 3
1

Estimation and uncertainty in fitting straight lines to data: different techniques

Year:
2008
Language:
english
File:
PDF, 213 KB
english, 2008
2

Avoiding a complex reference value

Year:
2008
Language:
english
File:
PDF, 70 KB
english, 2008
6

RF spectrum of a carrier with a random phase modulation of arbitrary slope

Year:
2008
Language:
english
File:
PDF, 429 KB
english, 2008
7

Effect of rotational skew on a symmetrical cross capacitor

Year:
2008
Language:
english
File:
PDF, 564 KB
english, 2008
12

Construction and validation of a platinum–carbon eutectic fixed point

Year:
2008
Language:
english
File:
PDF, 1.15 MB
english, 2008
14

Measurand: a cornerstone concept in metrology

Year:
2008
Language:
english
File:
PDF, 400 KB
english, 2008
15

Electron and fine structure constant II

Year:
2008
Language:
english
File:
PDF, 659 KB
english, 2008