Volume 33; Issue 8

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Microelectronics Journal
Volume 33; Issue 8

Microelectronics Journal

Volume 33; Issue 8

1

Neural network based modeling of diffusion process for high-speed avalanche photodiodes fabrication

Young-Don Ko, Yong Hwan Kwon, Kyung Sook Hyun, Changhyun Yi, Ilgu Yun

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 211 KB

english, 2002

2

RETRACTED: Normalized mutual integral difference operator: a novel experimental method for extracting threshold voltage of MOSFETs

Jin He, Xing Zhang, Yangyuan Wang, Xuemei Xi, Mansun Chan, Chenming Hu

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 290 KB

english, 2002

3

Novel method of low-vacuum plasma triode sputtering

G Golan, A Axelevitch

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 366 KB

english, 2002

4

Optimization of a 0.6 μm, single polysilicon emitter bipolar technology versus narrow emitter effects

M Ullán, M Lozano, J Santander, E Lora-Tamayo, S Nigrin

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 153 KB

english, 2002

5

Effect of different etching processes on edge breakdown suppression for planar InP/InGaAs avalanche photodiodes

Bongyong Lee, Ilgu Yun

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 417 KB

english, 2002

6

An analytical 2D model for drain-induced barrier lowering in subquarter micrometer gate length InAlAs/InGaAs/InAlAs/InP LMHEMT

Jyotika Jogi, Sujata Sen, Mridula Gupta, R.S. Gupta

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 166 KB

english, 2002

7

Patents alert 33/7

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 72 KB

english, 2002

8

Weak light effect in multicrystalline silicon solar cells

He Wang, Hong Yang, Huacong Yu, Jianping Xi, Hongxun Hu, Guangde Chen

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 82 KB

english, 2002

9

Validation of a novel dielectric constant simulation model and the determination of its physical parameters

Michael G Todd, Frank G Shi

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 209 KB

english, 2002

10

Thermal model of thin film anemometer

A. Giani, F. Mailly, R. Bonnot, F. Pascal-Delannoy, A. Foucaran, A. Boyer

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 367 KB

english, 2002

11

Principles of Electronic Materials and Devices (Second Edition): S.O. Kasap: McGraw-Hill, 2002. 745 pp, ISBN 0-07-112237-0

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 44 KB

english, 2002

12

Characterization of interface degradation in deep submicron MOSFETs by gate-controlled-diode measurement

J Huang, T.P Chen, M.S Tse, C.H Ang

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 163 KB

english, 2002

13

Thickness dependent soft-breakdown phenomena of low dielectric constant thin films and corresponding activation energy

Shih-Wei Lee, Hyungkun Kim, Frank G Shi, Bin Zhao

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 182 KB

english, 2002

14

High-voltage solutions in CMOS technology

P.M Santos, A.P Casimiro, M Lança, M.I Castro Simas

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 282 KB

english, 2002