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Volume 36; Issue 9
Main
Microelectronics Journal
Volume 36; Issue 9
Microelectronics Journal
Volume 36; Issue 9
1
Robustness enhancement through chip-package co-design for high-speed electronics
Meigen Shen
,
Jian Liu
,
Li-Rong Zheng
,
Esa Tjukanoff
,
Hannu Tenhunen
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 530 KB
Your tags:
english, 2005
2
Compaction-based concurrent error detection for digital circuits
Sobeeh Almukhaizim
,
Petros Drineas
,
Yiorgos Makris
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 119 KB
Your tags:
english, 2005
3
International Symposium on Quality Electronic Design
Daniela De Venuto
,
Tom Chen
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 47 KB
Your tags:
english, 2005
4
Standby supply voltage minimization for deep sub-micron SRAM
Huifang Qin
,
Yu Cao
,
Dejan Markovic
,
Andrei Vladimirescu
,
Jan Rabaey
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 418 KB
Your tags:
english, 2005
5
Testing high resolution ΣΔ ADC's by using the quantizer input as test access
Daniela De Venuto
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 455 KB
Your tags:
english, 2005
6
Test generation for specification test of analog circuits using efficient test response observation methods
Achintya Halder
,
Abhijit Chatterjee
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 719 KB
Your tags:
english, 2005
7
Timing analysis of network on chip architectures for MP-SoC platforms
Cristian Grecu
,
Partha Pratim Pande
,
André Ivanov
,
Res Saleh
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 267 KB
Your tags:
english, 2005
8
Monolithic voltage conversion in low-voltage CMOS technologies
Volkan Kursun
,
Vivek K. De
,
Eby G. Friedman
,
Siva G. Narendra
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 100 KB
Your tags:
english, 2005
9
Designing leakage tolerant, low power wide-OR dominos for sub-130 nm CMOS technologies
Bhaskar Chatterjee
,
Manoj Sachdev
,
Ram Krishnamurthy
Journal:
Microelectronics Journal
Year:
2005
Language:
english
File:
PDF, 177 KB
Your tags:
english, 2005
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