Volume 36; Issue 9

Microelectronics Journal

Volume 36; Issue 9
2

Compaction-based concurrent error detection for digital circuits

Year:
2005
Language:
english
File:
PDF, 119 KB
english, 2005
3

International Symposium on Quality Electronic Design

Year:
2005
Language:
english
File:
PDF, 47 KB
english, 2005
5

Testing high resolution ΣΔ ADC's by using the quantizer input as test access

Year:
2005
Language:
english
File:
PDF, 455 KB
english, 2005