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Volume 105
Main
Microelectronics Reliability
Volume 105
Microelectronics Reliability
Volume 105
1
Impact of layout and profile optimization for inverse-mode SiGe HBT on SET and TID responses
Wei, Jia-Nan
,
He, Chao-Hui
,
Li, Pei
,
Li, Yong-Hong
,
Guo, Hong-Xia
Journal:
Microelectronics Reliability
Year:
2020
Language:
english
File:
PDF, 3.00 MB
Your tags:
english, 2020
2
Effect of γ-ray irradiation on Schottky and ohmic contacts on AlGaN/GaN hetero-structures
Sharma, Chandan
,
Visvkarma, Ajay Kumar
,
Laishram, Robert
,
Kumar, Ashish
,
Rawal, Dipendra Singh
,
Vinayak, Seema
,
Singh, Rajendra
Journal:
Microelectronics Reliability
Year:
2020
Language:
english
File:
PDF, 2.87 MB
Your tags:
english, 2020
3
Impact of layout and profile optimization for inverse-mode SiGe HBT on SET and TID responses
Wei, Jia-Nan
,
He, Chao-Hui
,
Li, Pei
,
Li, Yong-Hong
,
Guo, Hong-Xia
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 3.00 MB
Your tags:
2020
4
Effect of γ-ray irradiation on Schottky and ohmic contacts on AlGaN/GaN hetero-structures
Sharma, Chandan
,
Visvkarma, Ajay Kumar
,
Laishram, Robert
,
Kumar, Ashish
,
Rawal, Dipendra Singh
,
Vinayak, Seema
,
Singh, Rajendra
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 2.87 MB
Your tags:
2020
5
Thermal mapping at the cell level of chips in power modules through the silicone gel using thermoreflectance
Metayrek, Y.
,
Kociniewski, T.
,
Khatir, Z.
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 3.44 MB
Your tags:
2020
6
A comprehensive evaluation of radiation hardening by applying negative body bias and back-gate bias in 130 nm PDSOI technology
Xie, Xin
,
Zhu, Huilong
,
Bi, Dawei
,
Hu, Zhiyuan
,
Ren, JiangChuan
,
Zhang, Haineng
,
Zhang, Zhengxuan
,
Zou, Shichang
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 3.10 MB
Your tags:
2020
7
EMI modeling considering the impedance behavior of isolated off-line converter
Kerrouche, Bouzid
,
Bensetti, Mohamed
,
Zaoui, Abdelhalim
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 4.74 MB
Your tags:
2020
8
Editorial Board
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 40 KB
Your tags:
2020
1
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