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Volume 13; Issue 5
Main
Microelectronics Reliability
Volume 13; Issue 5
Microelectronics Reliability
Volume 13; Issue 5
1
Special seminex 1974 issue
G.W.A. Dummer
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 72 KB
Your tags:
english, 1974
2
Notices and call for papers
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 161 KB
Your tags:
english, 1974
3
Microcircuit generic failure rates: By I. L. Krulac, Reliability Analysis Center. Available from the National Technical Information Service (NTIS), Springfield, CA 22151, U.S.A. for $30.00. Please cite AD-77 763K when ordering
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 44 KB
Your tags:
english, 1974
4
Microcircuit device malfunction report: Published by the Reliability Analysis Center, Department of Defense. Available from the National Technical Information Service (NTIS) Springfield, CA 22151, U.S.A. for $40.00. Please cite AD-779 310K when ordering
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 44 KB
Your tags:
english, 1974
5
Courses
Journal:
Microelectronics Reliability
Year:
1974
File:
PDF, 19 KB
Your tags:
1974
6
LIC technology
N. Doyle
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 3.65 MB
Your tags:
english, 1974
7
IC voltage regulators
N. Doyle
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 1.82 MB
Your tags:
english, 1974
8
Bipolar memories
P. Alfke
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 235 KB
Your tags:
english, 1974
9
Charge coupled device applications
P. Alfke
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 150 KB
Your tags:
english, 1974
10
Mixed-discipline monolithic integrated circuits—Bipolar, MOS and COS/MOS technologies and future trends
L.R. Avery
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 1.08 MB
Your tags:
english, 1974
11
Linear and interface circuits
A.J. Payne
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 257 KB
Your tags:
english, 1974
12
MOS and Bipolar ICs in consumer applications
J.D. Penney
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 500 KB
Your tags:
english, 1974
13
N-channel MOS memories—New possibilities for microprocessor memory design
F. Uebe
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 2.28 MB
Your tags:
english, 1974
14
New applications of linear integrated circuits in the entertainment industry
Aldo Romano
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 443 KB
Your tags:
english, 1974
15
Digital IC applications—Hybrid interconnection of digital circuits
R. Naylor
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 1.11 MB
Your tags:
english, 1974
16
Recent progress in MNOS memory technology
James T. Kendall
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 124 KB
Your tags:
english, 1974
17
The application of MOS memories to replace core storage in large computers
I.K. Chapple
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 77 KB
Your tags:
english, 1974
18
MOS in telecommunications
M.J. Debenham
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1974
19
A systems approach to the design of MOS memory components
G. Shenton
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 303 KB
Your tags:
english, 1974
20
Semiconductor radiation detectors
B.R. Holeman
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 387 KB
Your tags:
english, 1974
21
C-MOS—A status report
A. Bishop
,
P. Jones
Journal:
Microelectronics Reliability
Year:
1974
Language:
english
File:
PDF, 601 KB
Your tags:
english, 1974
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