Volume 17; Issue 2

Microelectronics Reliability

Volume 17; Issue 2

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 161 KB

english, 1978

2

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 212 KB

english, 1978

3

Recent patents on microelectronics

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 352 KB

english, 1978

4

Is MIL-STD-781B A good reliability test specification—Part II : Frank A. Stovall. IEEE Trans. Reliab.R-26, (2) 85 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 101 KB

english, 1978

5

An investigation of flaws in complex CMOS devices by a scanning photoexcitation technique : Dr Miguel E. Levy. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 44

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 101 KB

english, 1978

6

Identification of failure mechanisms and activation energies of OPTO devices : Leon Hamiter and Felminio Villella. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 240

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 101 KB

english, 1978

7

Flex life in cables : Kenneth W. Moll and David R. McCarter. Electron. Prod. p. 11 (July 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 101 KB

english, 1978

8

Reliability evaluation of trimetal integrated circuits in plastic packages : H. Khajezadeh and A. S. Rose. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 244

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 101 KB

english, 1978

9

Ion microprobe analysis of integrated circuit structures : R. D. Dobrott, J. A. Keenan and G. B. Larrabee. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 54

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 220 KB

english, 1978

10

Accelerated testing of class A CMOS integrated circuits : B. Maximow, E. M. Reiss and S. Kukunaris. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 212

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

11

Reliability evaluation of ECL integrated circuits : D. Bartels, A. Capobianco, K. B. Lasch and K. S. Lynch. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 196

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

12

Moisture induced failure mode in a plastic encapsulated dynamic timing circuit : S. Shabde, J. Edwards and W. Meuli. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 33

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

13

Hot carrier injection in the dual polysilicon gate structure and its related reliability effects on dynamic RAM refresh time : M. L. Malwah, J. R. Edwards and M. Bandali. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 23

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

14

A reliability failure mode in dynamic MOS circuits—the unopened metal to polysilicon contact window and the floating gate transistor : W. R. Ortner and J. T. Clements. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 16

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

15

Hot electron reliability effects in lateral PNP transistors : D. L. Bergeron, Z. C. Putney, P. H. Smith and G. B. Stephens. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 10

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

16

Leakage-induced hot carrier instability in phosphorus-doped SiO2 gate IGFET devices : P. K. Chaudhari. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 5

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

17

Accelerated test procedures for semiconductor components : F. H. Reynolds. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 166

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 121 KB

english, 1978

18

Accelerated electrical testing for improved device reliability : Le Roy Hirsch. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 225

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

19

Near-minimal test sets for the detection of single gate faults : Spiros G. Papioannou. Comput. electl Engng4, 105 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

20

Predicting the confidence of passing life tests : Ray E. Schafer and John E. AngusIEEE Trans. Reliab.R-26 (2) 141 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

21

An explicit form for system mean life : T. Downs. IEEE Trans. Reliab.R-26, (2) 138 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

22

The design of highly reliable computer systems to control telephone exchanges : P. Troughton. Proc. Symp. IEE. Heriot-Watt University, Edinburgh. (31 March 1977). p. 7

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

23

Cost optimizing system to evaluate reliability (COSTER) : Dr John P. Solomond and Ms Grace A. Marseglia. Proc. IEEE Reliab. Maintainab. Symp. Philadelphia, (Jan. 18–20 1977). p. 385

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

24

Reliability growth and improvement : Peter H. Mead. Proc. Symp. IEE. Heriot-Watt University, Edinburgh (31 March 1977). p. 8

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

25

Failure analysis of digital system using simulation : Luciano Bertolino and Leif E. Grefarud. Proc. IEEE Reliab. Maintainab. Symp. Philadelphia (Jan. 18–20 1977). p. 432

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 254 KB

english, 1978

26

Equipment availability and logistic principles : Jacques de Colieu. Proc. IEEE Reliab. Maintainab. Symp., Philadelphia, (Jan. 18–20 1977). p. 462

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

27

Fleet reliability assessment program (FRAP) : Robert E. Saum. Proc. IEEE Reliab. Maintainab. Symp., Philadelphia, (Jan. 18–20 1977). p. 454

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

28

Reliability analysis of complex electronic systems : P. G. Thomas. Proc. Symp. IEE Heriot-Watt University, Edinburgh (31 March 1977). p. 3

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

29

Reliability in electronics : A. C. Wesley. Proc. Symp. IEE Heriot-Watt University, Edinburgh (31 March 1977). p. 1

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

30

COMCAN—A computer code for common-cause analysis : G. R. Burdick. IEEE Trans. Reliab.R-26, (2) 100 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

31

Fault tree analysis using bit manipulation : Dean B. Wheeler, Jason S. Hsuan, Ralph R. Duersch and Glenn M. Roe. IEEE Trans. Reliab.R-26, (2) 95 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

32

Correlation between laboratory test and field part failure rates : Jojo Yasuda. IEEE Trans. Reliab.R-26, (2) 82 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 133 KB

english, 1978

33

Microcircuit accelerated testing reveals life limiting failure modes : Gordon M. Johnson and Morton Stitch. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 179

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

34

The future of silicon technology : Glen R Madland. Solid St. Technol. p. 91 (August 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 124 KB

english, 1978

35

Microelectronics—yesterday, today and tomorrow : R. Paul. Nachrichtentecnik-Elektronik27, (H.8) 314 (1977). (In German only.)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

36

The first of the Third Generation Microcomputers : Larry Gross. Solid. St. Technol. p. 42 (July 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

37

Pulse evaluation of integrated circuit metallization as an alternative to SEM : O. J. McAteer. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 217

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

38

On the penetration of gases and water vapour into packages with cavities and on maximum allowable leak rates : D. Stroehle. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 101

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

39

A comparison of some optical microscope measurements of photomask linewidths : Dennis A. Swyt and F. W. Rosberry. Solid St. Technol. p. 70 (August, 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

40

Optical projection printing : J. D. Cuthbert. Solid St. Technol. p. 59 (August 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 253 KB

english, 1978

41

Edge acuity and resolution in positive type photoresist systems : Phillip D. Blais. Solid. St. Technol. (August 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

42

Automatic photo-composition of reticles : Gerald M. Henriksen. Solid St. Technol. p. 81 (August 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

43

Automatic diffusion furnace system using microprocessor control : Donald G. Landis and Joseph C. Maliakal. Solid. St. Technol. p. 34 (July 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

44

Localized plastic deformation of GaAs produced by thermo-compression bonding : B. L. Weiss and H. L. Hartnagel. Int. J. Electron.43 (2) 105 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

45

Decapsulation of epoxy devices using oxygen plasma : D. D. Wilson and J. R. Beall. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 82

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

46

Automation in CVD processing : Richard S. Rosler and Walter C. Benzing. Solid St. Technol. p. 27u (July 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

47

Surface segregation of non-bonding impurities in gold-silicon preforms : Henry F. Gray. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 272

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

48

Characterization of reaction bonded Au and Ag thick film metallizations : R. Kossowsky and J. Mitchell. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 262

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 129 KB

english, 1978

49

Study of a three dimensional model of the mechanisms of exposure and development of a positive photoresin : A. Brochet, G. M. Dubroeucq and M. Lacombat. Rev. Technique Thomson-CSF9, (2) 285 (June 1977). (In French only)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 251 KB

english, 1978

50

Mechanisation of wire bonding for semiconductor devices : O. Frodl. Feinw-Techn. Messtechnik85 6, 243 (1977) (In German only)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

51

Assessment of silicone encapsulation materials: screening techniques : A. Christou and W. Wilkins. 5th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 112

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

52

The role of hybrid construction techniques on sealed moisture levels : D. T. Somerville. 5th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 107

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

53

Properties, advantages and limitations of electronic mask duplication, results achieved : B. Fay. Rev. Technique Thompson-CSF9, (2) 265 (June 1977). (In French only)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

54

Converters adjust to LSI, Bi-fet or amps emerge : Lucinda Mattera. Electronics p. 112 (27 October, 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

55

Micropower consumption handy LSI TV color camera for ENG system : T. Imai, M. Kawasaki, S. Ikeda, Y. Ushiyama, K. Nagai, H. Nakajima, Y. Sugai, S. Yamamoto, I. Matsuo, K. Wakui and T. Mochizuki. NEC Res. Dev. (Japan)45, 72 (April 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

56

A dual-gate GaAs FET RF power limiter : A. Rosen, H. J. Wolkstein, J. Goel and R. J. Matarese. RCA Rev.38, 253 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 123 KB

english, 1978

57

Gap tolerant bubble propagation circuit : I. S. Gergis, P. K. George and T. Kobayashi. Microelectronics8, (2) 9 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 247 KB

english, 1978

58

Analog output chips shrink a-d conversion software : Andrij Mrozowski. Electronics p. 130 (June 23 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 125 KB

english, 1978

59

Ionizing radiation effects on NMOS microprocessors : David K. Myers. Proc. Electron. Components Conf., Arlington, Va. (May 16–18 1977). p. 521

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

60

Stroboscopic observation of bubble dynamics : W. Clegg and M. Farrell. Microelectronics8 (2) 5 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

61

Windingless hybrid repeating coil using photo-coupler : Syojiro Yoneda, Yutaka Fukui, Motoo Miura and Tamotsu Kasai. Proc. Electron. Components Conf., Arlington, Va (May 16–18 1977). p. 549

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

62

Liquid crystal technique for field detection in microwave integrated circuitry : F. Giannini, P. Maltese and R. Sorrentino. Alta Frequenza p. 170 (April 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

63

Designing with nitride-type EAROMs : Brain Cayton. Electronics p. 107 (15 September 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 125 KB

english, 1978

64

Polychip DIPSs: quick-turnaround custom circuit designs : John H. Forster. Bell Lab. Rec.55, (8) 209 (Sept. 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

65

Initial approximations for the numerical solution of the transport equations in semiconductors : Andrzej Pfitzner. Electron Technol. Warsaw.10, (2) 3 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

66

Electron trapping noise in SOS MOS field-effect transistors operated in the linear region : S. T. Hsu. RCA Rev.38, 226 (June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 125 KB

english, 1978

67

Numerical estimation of the doping profile and threshold voltage of the boron isolation region in MOS devices : Y. T. Yeow and J. Mavor. Int. J. Electron.43, (1) 8 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 250 KB

english, 1978

68

Temperature dependence of the radius of electron-hole drops in Ge : B. Grossman, K. L. Shaklee and M. Voos. Solid St. Commun.23, 271 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

69

Characterisation of real surface of silicon by ellipsometry : Anna-Maria Kaminska and Tadeusz Piotrowski. Electron Technol.10, (2) 91 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

70

Distribution function relaxation times in gallium arsenide : R. A. Warriner. Solid St. electron. Devices1, (3) 92 (April 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

71

Charge storage by irradiation with UV light in non-biased MNOS structures : Erwin P. Jacobs and G. Dorda. Solid-St. Electron.20, 361 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

72

Chromium thin film as a barrier to the interaction of Pd2Si with Al : J. O. Olowolafe, M. A. Nicolet and J. W. Mayer. Solid St. Electron.20, 413 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

73

Strain dependence of electronic bands of silicon : Richard M. Martin and H. Wendel. Solid St. Commun.22, 21 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

74

Localized vibrational modes of isolated impurities in germanium : D. N. Talwar and Bal K. Agrawal. Solid St. Commun.22, 79 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

75

Temperature dependence of the magnetoconductivity in the ground Landau level in silicon inversion layers : S. Kawaji and J. Wakabayashi. Solid St. Commun.22, 87 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

76

Hot electron diffusivity in silicon : D. Chattopadhyay and B. R. Nag. Solid St. Commun.22, 569 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

77

Resolved fine structure of exciton complexes bound to phosphorus impurities in silicon : R. R. Parsons. Solid St. Commun.22, 671 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

78

Manifestation of electron-hole exchange effects in magneto-optical spectra of free excitons in III–V semiconductors : W. Ekardt. Solid St. Commun.22, 531 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 250 KB

english, 1978

79

Spin-dependent photoconductivity in n-type and p-type amorphous silicon: I. Solomon. Solid St. Commun.22, 505 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

80

Far infrared resonant magnetoabsorption in low density Si inversion layers : T. A. Kennedy, R. J. Wagner and B. D. McCombe. Solid St. Commun.21, 459 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

81

The effect of oxygen on the electrical properties of silicon : T. S. Glowinke and J. Bruce Wagner, Jr.J. Phys. Chem. Solids38, 963 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

82

Structures for photocells: homojunctions, heterostructures or heterojunctions : E. Fabre. Acta Electron.20, (2) 117 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

83

Silicon for solar cells : J. J. Brissot. Acta Electron.20, (2) 101 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

84

Fabrication and electrical properties of epitaxial layers of GaAs doped with manganese : L. Gouskov, S. Bilac, J. Pimentel and A. Gouskov. Solid-St. Electron.20, 653 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

85

Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon : J. C. White, T. F. Unter and J. G. Smith. Solid St. electron. Devices1 (5) 139 (Sept. 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 124 KB

english, 1978

86

Theoretical effects of surface diffused region lifetime models on silicon solar cells : P. M. Dunbar and J. R. Hauser. Solid-St. Electron.20, 697 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

87

Development and production of hybrid circuits for microwave radio links : Per Chr. Malmin. Electrocomp. Sci. Technol.4, 79 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

88

Conduction processes in high value thick film resistors : J. Robertson. Electrocomp. Sci. Technol.4, 105 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

89

Pulsed photovoltaic effect in thin film MIS devices : F. Morin. Vacuum27, (4) 241

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

90

Resistor geometry comparison with respect to current noise and trim sensitivity : W. Ulbrich. Electrocomp. Sci. Technol.4, 63 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

91

Computerized thermal analysis of hybrid circuits : Dr Richard F. David. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977) p. 324

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

92

Thermal characterization of epoxy and alloy attachment of hybrid components : Thomas W. Elsby. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977) p. 320

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

93

Predict contact performance with film measurements : Robert H. Gosciora. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 269

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 262 KB

english, 1978

94

Hybrid microcircuitry for 300°C operation : David W. PalmerProc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 314

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 135 KB

english, 1978

95

Thick film hybrid circuits for telecommunications equipment : Robert L. Waer. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 307

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 135 KB

english, 1978

96

An evaporation cryostat for electrical and optical measurements on ultra-thin metal film under ultra high vacuum conditions : S. H. Norman and T. G. Andersson. Vacuum27, (3) 97

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 135 KB

english, 1978

97

The reliability of soldered or epoxy bonded chip capacitor interconnections on hybrids : G. A. Dreyer, A. Koudounaris and I. H. Pratt. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 421

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 135 KB

english, 1978

98

Manufacture of super fine finish beryllia : Kenneth A. Walsh. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 404

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 135 KB

english, 1978

99

Electrical properties of uncontaminated PbTe films on Mica substrates prepared by molecular beam deposition : E. H. C. Parker and D. Williams. Solid-St. Electron.20, 567 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 261 KB

english, 1978

100

Testing of thick film technology in ionizing radiation environments : D. R. Johnson, R. E. Knutson and J. T. Grissom. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 524

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

101

Semiconductor memories packaged in hybrid microcircuits : L. Sutton. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 10

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

102

A new approach to the calculation of tight-binding surface density of states in thin films : B. Laks and J. B. Salzberg. Solid St. Commun.22, 417 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

103

Electrical testing of bare silicon chips prior to hybrid fabrication : H. L. Obright. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 141

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

104

Vapor condensation soldering of external leads to thin-film hybrid integrated circuits : L. W. Condra. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 135

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

105

The performance and application of thick film chip resistors on PC boards : P. E. Johnston. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 110

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

106

Reliability study of a high precision thick film resistor network : Y. Nakada and T. L. Schock. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 103

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

107

Corrosion of solder-coated TiPdAu thin-film conductors in a moist chlorine atmosphere : F. N. Fuss and C. T. Hartwig. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 72

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

108

Nichrome passivation coating—help or hindrance : Kermit Heid. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 68

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

109

Improvement of uniformity of sputtered film sheet resistance : A. Aritomo, T. Shirakawa, S. Yoshida and T. Murasumi. Proc. Electron. Component Conf. Arlington, Va., (May 16–18 1977). p. 6

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 257 KB

english, 1978

110

AC electrical properties of magnesium and aluminium fluoride thin films : Y. Danto and J. Salardenne. Vacuum27, (4) 293

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

111

Dielectric dispersion and polarization effects in thin transition metal oxide films : B. Lalevic, N. Annamalai, B. Leung, G. Taylor and W. Slusark, Jr.Vacuum27, (4) 249

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

112

Nonlinearity measurements of thin films : S. Hellstrom and H. Wesemeyer. Vacuum27, (4) 339

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

113

Size effects in thin films of cadmium arsenide : L. Zdanowicz, F. Pocztowski and W. Zdanowicz. Vacuum27, (4) 305

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

114

UHV-deposited amorphous tantalum and tantalum-nickel films : Alfred Schafer and Gunther Menzel. Electrocomp. Sci. Technol.4, 29 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

115

Failure analysis of thin-film conductors stressed with high current density by application of Matthiessen's rule : F. Fischer and J. Fellinger. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 250

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

116

Ageing tests on gold layers and bonded contacts : H. Hieber, F. Betke and K. Pape. Electrocomp. Sci. Technol.4, 89 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

117

Techniques for the examination of thick film resistor microstructures by TEM : D. J. Pedder. Electrocomp. Sci. Technol.4, 85 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 261 KB

english, 1978

118

Grain size dependence of the gauge factor of thin metallic films : C. R. Tellier and A. J. Tosser. Electrocomp. Sci. Technol.4, 9 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

119

Solder dissolution rates of evaporated and sputtered Ti, Pd, Au and NiCr-Au thin films : R. H. Minetti and L. J. Rickabaugh. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 212

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

120

Tantalum thin film applications—a new approach for capacitors : A. Perinati. Electrocomp. Sci. Technol.4, 69 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

121

A high voltage, high performance thick film resistor system : Sidney J. Stein, Cornelius Huang and Allan S. Gelb. Electrocomp. Sci. Technol.4, 95 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

122

Low frequency characteristics of TiO2 (rutile)-glass thick films : B. Liczerski and K. Nitsch. Electrocomp. Sci. Technol.4, 1 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

123

New metallization process for tantalum RC hybrid integrated circuits : R. E. Peterson and K. L. Baurle. Proc. Electron. Component Conf. Arlington, Va., (May 16–18 1977). p. 238

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

124

The application of magnetically enhanced sputtering in a production cylindrical sputtering system : F. R. Arcidiacono. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 232

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 131 KB

english, 1978

125

A new high stability resistor system : J. R. Larry, M. J. Popowich, R. C. Headley and R. M. Rosenberry. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 348

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 257 KB

english, 1978

126

Gold- and silver-based thick-film conductors : T. T. Hitch. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 260

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

127

A production parylene coating process for hybrid microcircuits : V. S. Kale and T. J. Riley. Proc. Electron. Components Conf. Arlington, Va., (May 16–18, 1977). p. 245

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

128

A statistical approach to the analysis of dielectric breakdown strength of thin insulating films : K. Kristiansen. Vacuum27, (4) 227

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

129

Polycrystalline semiconductor thin films : J. C. Anderson. Vacuum27, (4) 263

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

130

Electron beam—now a practical LSI production tool : Nelson C. Yew. Solid St. Technol. 86 (August 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

131

Boron-implanted silicon resistors : S. M. Ku. Solid-St. Electron.20, 803 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 127 KB

english, 1978

132

The sensitivity of threshold voltage of ion-implanted MOSFET's to substrate doping and oxide thickness fluctuations : K. Board. Int. J. Electron.43, (2) 151 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

133

The luminescence measurements of ZnTe implanted by Li, Cl, Al and In ions : Marek S. Kwietniak. Electron Technol.10, (2) 79 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

134

Low cost ICs convert light to current : Bernard Cole. Electronics p. 143 (23 June 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

135

AES investigations of the interface between substrate and chromium films prepared by evaporation and ion plating : C. W. B. Martinson, P. J. Nordlander and S. E. Karlsson. Vacuum27, (3) 119

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

136

Effects in Auger electron spectroscopy due to the probing electrons and sputtering : P. Braun, W. Farber, G. Betz and F. P. Viehbock. Vacuum27, (3) 103

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

137

E-beam systems arrive, flexible circuits fluorish : Jerry Lyman. Electronics p. 134 (27 October 1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

138

Present and foreseeable electronic masking machines : G. Pircher. Rev. Technique Thomson-CSF9, (2) 221 (June 1977). (In French only)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

139

On the design of ion implanted buried channel charge coupled devices (BCCDs) : J. S. T. Huang. Solid-St. Electron.20, 665 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 258 KB

english, 1978

140

Edge emissions of ion-implanted CdS : Yasuhiro Shiraki, Toshikazu Shimada and Kiichi F. Komatsubara. J. Phys. Chem. Solids38, 937 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

141

The effect of argon implantation on the conductivity of boron implanted silicon : I. R. Sanders and B. D. Williams. Solid-St. Electron.20, 703 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

142

Detection and processing of secondary electron signals for pattern re-registration in scanning electron beam exposure : S. O. Alio and C. J. Hardy. Vacuum27, (5/6) 419

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

143

Aspects of electron resist exposure : D. Webb and C. J. Hardy. Vacuum27, (5/6) 413

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

144

The electrocomposer, a high speed integrated circuit mask tracer using an electron beam : J. Trotel, A. Gerard and S. Despergues-Volmier. Rev. Technique Thomson-CSF9, (2) 245 (June 1977). (In French only)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 129 KB

english, 1978

145

Effects of dislocations in silicon transistors with implanted bases : P. Ashburn, C. Bull, K. H. Nicholas and G. R. Brooker. Solid-St. Electron.20, 731 (1977)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 140 KB

english, 1978

146

System reliability modelling and evaluation: by: Chanan Singh and Roy Billinton Published by Hutchinson & Co. (Publishers) Ltd of London at £14.00. 1977

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 42 KB

english, 1978

147

Developments likely to improve the reliability of plastic encapsulated devices

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 432 KB

english, 1978

148

N-unit parallel redundant system with correlated failure and single repair facility

Takashi Itoi, Toshio Nishida, Masanori Kodama, Fumio Ohi

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 361 KB

english, 1978

149

CMOS reliability

L.J Gallace, H.L Pujol, G.L Schnable

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 1.44 MB

english, 1978

150

Threshold voltage instability of MOS field effect transistors

Sesha R. Shankar, Raj P. Misra, Henry T. Rand

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 262 KB

english, 1978

151

Maximization of system reliability by accelerated random search algorithm

B. Bharathi Devi

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 253 KB

english, 1978

152

Determination of optimal overhaul intervals and inspection frequencies—A case study

B.A. Basker, T.M. Husband

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 176 KB

english, 1978

153

Utilization of quality data for cost cutting

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 653 KB

english, 1978

154

Thick photoresist patterns for selective electroplating

J.J. Maes, A.G. van Nie, G.B.A. Hut

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 1.11 MB

english, 1978