Volume 18; Issue 6

Microelectronics Reliability

Volume 18; Issue 6

1

Calendar of International Conferences, Symposia, Lectures and Meetings of Interest

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 192 KB

english, 1978

2

Calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 431 KB

english, 1978

3

Recent patents on microelectronics

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 323 KB

english, 1978

4

Conference report

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Microelectronics Reliability

Year:

1978

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english

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PDF, 105 KB

english, 1978

5

Products liability—Current state of the law : John J. Kircher. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 1

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

6

Standards development for technical aspects of products liability litigation : Henry R. Piehler. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 109

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

7

Bibliography of literature on fault trees : Balbir S. Dhillon and C. Singh. Microelectron. Reliab.17, 501 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

8

Laboratory accreditation and its relation to product liability : Howard I. Forman. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 65

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

9

Product liability in Europe : Borge Dahl. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 11

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

10

Decision tools for use by management : C. M. Ryerson. Microelectron. Reliab.17, 527 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 102 KB

english, 1978

11

Human reliability engineering : H. Kragt. IEEE Trans. Reliab.R-27, (3) 195 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 225 KB

english, 1978

12

The Federal Government and product liability : Kay Klatt. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 15

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 124 KB

english, 1978

13

Reed switch reliability : R. K. Saraf and Ivan B. Ram. Microelectron. Reliab.17, 431 (1978)

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 124 KB

english, 1978

14

The construction and reliability of Schottky diodes : D. C. Croft. Microelectron. Reliab.17, 455 (1978)

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 124 KB

english, 1978

15

Life characteristics of plastic encapsulated semiconductor devices : Bernard Reich. Microelectron. Reliab.17, 513 (1978)

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 124 KB

english, 1978

16

A study of accelerated storage test conditions applicable to semiconductor devices and microcircuits : Bernard Reich. IEEE Trans. Reliab.R-27, (3) 178 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 124 KB

english, 1978

17

Probability of displacement damage in a component exposed to nuclear radiation stress from the viewpoint of reliability : Krishan Lal. Microelectron. Reliab.17, 435 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 124 KB

english, 1978

18

Miner's rule in mechanical tests of electronic parts : Antoni Czechowski and Arno Lenk. IEEE Trans. Reliab.R-27, (3) 183 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 124 KB

english, 1978

19

Electromigration failure under pulse test conditions : R. J. Miller. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 241

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 250 KB

english, 1978

20

H-MOS reliability : S. Rosenberg, D. Crook and B. Euzent. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 19

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 127 KB

english, 1978

21

Ceramic capacitor insulation resistance failures accelerated by low voltage : Thomas F. Brennan. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 68

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

22

Failure of small thin film conductors due to high current-density pulses : E. Kinsbron, C. M. Melliar-Smith, A. T. English and T. Chynoweth. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 248

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 127 KB

english, 1978

23

Reliability evaluation program and results for a 4K dynamic RAM : H. A. Batdorf, D. H. Hensler and R. D. Wasson. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 14

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

24

Reliability of dynamic fatigue data for plastic coated fused silica optical waveguide fibers : John T. Krause and A. Carnevale. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978) p. 213

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

25

Test chips in LSI reliability assurance : T. W. Griswold. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 88

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

26

New concerns about integrated circuit reliability : D. S. Peck. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 1

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 258 KB

english, 1978

27

VMOS electrostatic protection : I. S. Bhatti, E. Fuller and F. B. Jenne. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 140

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

28

Failure analysis of passive devices : John E. Mann. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 89

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

29

Electrical overstress failure analysis in microcircuits : J. S. Smith. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 41

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 132 KB

english, 1978

30

Accelerated reliability evaluation of trimetal integrated circuit chips in plastic packages : L. J. Gallace, H. J. Khajezadeh and A. S. Rose. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 224

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

31

A reliable dry ceramic dual in-line package (CERDIP) : R. K. Lowry, C. J. Van Leeuwen, B. L. Kennimer and L. A. Miller. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 207

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

32

Corrosion of in-base solders : Ram Kossowsky, R. C. Pearson and L. T. Christovich, Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 200

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

33

Analytical techniques for electronic materials—A comparative evaluation : R. Kossowsky. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 112

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

34

Accelerated life testing for LSI failure mechanisms : C. H. Zierdt, Jr. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 76

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 132 KB

english, 1978

35

Process testing for reliability control : Walter H. Schroen. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 81

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 253 KB

english, 1978

36

Reliability study of high efficiency gallium arsenide avalanche diodes : John L. Heaton, Robert E. Walline and John F. Carroll. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 261

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 123 KB

english, 1978

37

Testing for reliability qualification of semiconductor memory devices : J. Reese Brown. Jr. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 79

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 123 KB

english, 1978

38

Reliability study of microwave GaAs field-effect transistors : Ronald E. Lundgren and Glenn O. Ladd.Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 255

Journal:

Microelectronics Reliability

Year:

1978

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english

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PDF, 123 KB

english, 1978

39

Microcircuit analysis techniques using field effect liquid crystals : Daniel J. Burns. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 101

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

40

Reliability of epoxy and silicone molded tape-carrier silicon integrated circuits with various chip-protective coatings : N. J. Chaplin and A. J. Masessa. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 187

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 123 KB

english, 1978

41

Influence of electrical bias level on 85/85 test results of plastic encapsulated 4K RAMS : John W. Peeples. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 154

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 249 KB

english, 1978

42

Accelerated testing in FAMOS Devices—8K EPROM : Robert M. Alexander. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 229

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

43

Degradation of PVF2 capacitors during accelerated test : J. W. Burough, W. G. Brammer and John Burnham. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 219

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

44

Multi-level self-diagnosis and fault tolerance in a multimicroprocessor system : R. Negrini and M. G. Sami. Alta Freq.XLVII, (7) 557 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

45

A moment approach to evaluation and optimization of complex system reliability : R. Krishnan Iyer and T. Downs. IEEE Trans. Reliab.R-27, (3) 226 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

46

Reliability analysis of multistate device networks : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. IEEE Trans. Reliab.R-27, (3) 233 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

47

Symbolic reliability evaluation using logical signal relations : K. K. Aggarwal and Suresh Rai. IEEE Trans. Reliab.R-27, (3) 202 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

48

Availability of a reduadant system : R. Subramanian and N. Ravichandran. IEEE Trans. Reliab.R-27, (3) 237 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 127 KB

english, 1978

49

Simulation model of mission effectiveness for military systems : F. A. Tillman, C. H. Lie and C. L. Hwang. IEEE Trans. Reliab.R-27, (3) 191 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 248 KB

english, 1978

50

Experimental determination of a more powerful burn-in : Anthony Coppola. IEEE Trans. Reliab.R-27, (3) 181 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

51

Auditing—A product liability prevention tool : George W. Corley and Francis X. Brown. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 45

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

52

A go-not-go reliability assessment procedure—“HI-FMECA” : Katsushige Onodera, Minoru Miki, Keizo Nukada and Abe M. Okun. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 161

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

53

Staggered testing of electronic systems revisited : Winfrid G. Schneeweiss. Microelectron. Reliab.17, 523 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

54

Assessing product liability through material failure analysis : Edward R. Lewin. Proc. PLP-78, Product Liability Prevention Conf., Philadelphia, PA (21/23 August 1978), p. 83

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

55

An efficient simple algorithm for fault tree automatic synthesis from the reliability graph : P. Camarda, F. Corsi and A. Trentadue. IEEE Trans. Reliab.R-27, (3) 215 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

56

An efficient method for reliability evaluation of a general network : Suresh Rai and K. K. Aggarwal. IEEE Trans. Reliab.R-27, (3) 206 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

57

Reliability analysis of standby repairable systems when an emergency occurs : T. Nakagawa. Microelectron. Reliab.17, 461 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

58

Behaviour of a two correlated units redundant system with many types of failure : Takashi Itoi, Masanori Kodama and Toshio Nishida. Microelectron. Reliab.17, 517 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 244 KB

english, 1978

59

Reliability engineering in microelectronics : C. E. Jowett. Microelectron. Reliab.17, 505 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

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60

Evaluating system reliability : Paul F. Albrecht. IEEE Spectrum, p. 43 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

61

Bayesian approach to the prediction problem in the exponential population : G. S. Lingappaiah. IEEE Trans. Reliab.R-27, (3) 222 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

62

A delta-star transformation approach for reliability evaluation : Hariom Gupta and Jaydev Sharma. IEEE Trans. Reliab.R-27, (3) 212 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

63

Quantitative H2O determination in components using a plasma chromatograph—mass spectrometer : Timothy W. Carr, Edwin A. Corl, Chiu-Lian Liu and Carl G. Majtenyi. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 59

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

64

Semiconductor component reliability in an equipment operating in electromechanical telephone exchanges : F. H. Reynolds and J. W. Stevens. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 7

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

65

A new physical mechanism for soft errors in dynamic memories : Timothy C. May and Murray H. Woods. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 33

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

66

Microcomputers invade the linear world : Robert L. Morrison. IEEE Spectrum p. 38 (July 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

67

Some package reliability implications of current trends in large scale silicon integrated circuits : L. K. Anderson. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 121

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 122 KB

english, 1978

68

Solid-state devices and the age of indelence : D. H. Roberts. Electron. Power p. 661 (September 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 242 KB

english, 1978

69

Solid-state serial memories—The role of bubbles and c.c.d.s. : K. Baker. Electron. Power p. 647 (September 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

70

Solutions for the process engineering and circuit technique of LSI circuits : H. Eigler. Nachrichtentechnik Elektronik28, (8) 319 (1978). (In German.)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

71

Photoresist technology and processing techniques for fine dimensional control : Kenneth G. Clark. Solid St. Technol. p. 73 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

72

Double-sided photolithography : R. A. Heinz, J. T. Chuss and C. M. Schroeder. Solid St. Technol. p. 55 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

73

Reduction of waste resulting from mask defects : G. W. W. Stevens. Solid St. Technol. p. 68 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

74

Measurement of series resistance of a pn junction diode and its applications in the analysis of integrated curcuits : M. Narayanan. Solid St. Technol. p. 80 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 120 KB

english, 1978

75

The distributed RC variable-frequency phase-shift oscillator : C. A. Miller and D. L. Waller. Microelectron. Reliab.17, 457 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 120 KB

english, 1978

76

Dependence of the operating point on h.f. characteristics of bipolar integrated transistors : P. Baumann, W. Moller and G. Seidel. Nachrichtentechnik Elektronik28, (8) 315 (1978). (In German.)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 298 KB

english, 1978

77

Determination of strain in 10 μm spots using a microdiffractometer : G. A. Walker and C. C. Goldsmith. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 56

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

78

Advances in ceramic chip carriers and multilayer substrate technologies : Jim F. Wade. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 130

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

79

Tape assembled components. A packaging option : Galen F. Fritz. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 124

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

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PDF, 132 KB

english, 1978

80

The reduction of Au-Al intermetallic formation and electromigration in hydrogen environments : Da-Yuan Shih and P. J. Ficalora. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 268

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

81

Cross-modulation and intermodulation performance of MOS-FET's in tuned high-frequency amplifiers : Omar A. Dogha and Mukunda B. Das. Int. J. Electron.45, (3) 307 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

82

Ultra-high density VLSI modules : Joseph A. Ciccio and Rudolf E. Thun. IEEE Trans. Components, Hybrids, mfg Technol.Chmt-1, (3) 242 (September 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

83

An operating system for a microprocessor-based interactive graphic terminal : M. G. Sami and C. Serrelli. Alta Freq.XLVII, (7) 566 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

84

Double level metallurgy defect study : A. J. Gregoritsch. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 28

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

85

New acceleration factors for temperature, humidity, bias testing : N. L. Sbar and R. P. Kozakiewicz. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 161

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

86

Model for MOS field-time-dependent breakdown : S. P. Li, S. Prussin and J. Maserjian. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 132

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

87

A new electrostatic discharge failure mode : M. H. Woods and G. Gear. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 146

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

88

The application of electrical overstress models to gate protective networks : D. C. Wunsch. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 47

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

89

Electrostatic damage susceptibility of semiconductor devices : L. A. Schreier. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 151

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

90

Developing an approach to semiconductor failure analysis and curve tracer interpretation : J. M. Patterson. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 93

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

91

Near IR absorption in films of silicon containing oxygen : S. O. Sari, P. Hollingsworth Smith and H. Oona. J. Phys. Chem. Solids39, 957 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 116 KB

english, 1978

92

A study of Al/PtSi/Si thin film reaction kinetics by X-ray diffraction : C. C. Goldsmith, G. A. Walker and M. J. Sullivan. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 64

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 239 KB

english, 1978

93

Improved reliability and yield in thin thermal SiO2: S. T. Wang, E. Harari and W. Y. Nielsen. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 137

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

94

Electromigration of Al-Si alloy films : James R. Black. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 233

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

95

Electron transport in very thin multilayers of Al-Al2O3: Sadao Takabe, Kanji Yasui and Shigeo Kaneda. Int. J. Electron.45, (3) 257 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

96

Capacitors of thin insulating films of photoresist materials : Awatar Singh. Microelectron. Reliab.17, 441 (1978)

Journal:

Microelectronics Reliability

Year:

1978

File:

PDF, 124 KB

1978

97

Aging of highly N-doped α-Ta thin-film capacitors : Peter W. Wyatt. IEEE Trans. Components, Hybrids, mfg Technol.Chmt-1, (2) 148 (June 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

98

Reliability testing of fluorinated polymeric materials (FNP) for hybrid encapsulation : A. Christou, J. R. Griffith and W. Wilkins. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 194

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

99

Electrical properties of (SN)x films: W. Beyer, W. D. Gill and G. B. Street. Solid St. Commun.27, 343 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 124 KB

english, 1978

100

Automatic registration in an electron-beam lithographic system : D. E. Davis, M. C. Williams, R. D. Moore and O. C. Woodard. Solid St. Technol. p. 61 (August 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

101

A two-gun ion beam system for dynamic recoil implantation : G. Fischer, A. E. Hill and J. S. Colligon. Vacuum28, (6/7) 277 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

102

Scanning eletron microscopy for complex microcircuit analysis : John J. Bart. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 108

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

103

Graded band-gap pAlxGa1−xAs−GaAs heterojunction solar cells prepared by molecular beam epitaxy: Nobutoshi Matsunaga and Kiyoshi Takahashi. Int. J. Electron.45, (3) 273 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

104

Analysis of the interaction of an electron beam with a solar cell—I : Soldwig Von Roos. Solid-St. Electron.21, 1063 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

105

Analysis of the interaction of an electron beam with solar cell—II : Soldwig Von Roos. Solid-St. Electron.21, 1069 (1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 108 KB

english, 1978

106

The development of heavy current electricity in the United Kingdom: By Lord Hinton of Bankside, O.M., K.B.E., F.R.S., Published by Pergamon Press Limited, Headington Hill Hall, Oxford OX3 OBW, England Price: Paperback: £2.50 ($5.00); Hardcover: £5.00 ($10.00)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 49 KB

english, 1978

107

Introduction to microelectronics, 2nd edition: by D. Roddy Pergamon Press, Oxford 228 papes (Hardcover) $ 20.00 £ 10.00 (Flexicover) $ 10.00 £ 5.00

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 30 KB

english, 1978

108

Noise analysis study of semiconductor devices for reliability improvement

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 265 KB

english, 1978

109

The reliability of a system subject to revealed and unrevealed faults

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 590 KB

english, 1978

110

Evaluation of epitaxial planar transistors based on their double diffused impurity profile distribution

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 465 KB

english, 1978

111

The use of laser and infrared scanning techniques in reliability assurance

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 2.01 MB

english, 1978

112

Some aspects of cost minimization of a thick film hybrid high-power device

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 455 KB

english, 1978

113

New hazard rate functions

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 86 KB

english, 1978

114

On common-cause failures—Bibliography

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 102 KB

english, 1978

115

Optimum preventive maintenance policy for two-unit priority standby redundant system with minimal repair

Mamoru Ohashi, Koichi Adachi, Masanori Kodama

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 211 KB

english, 1978

116

Water vaper penetration rate into enclosures with known air leak rates : Aaron DerMarderosian and Vincent Gionet. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 179

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978

117

Chip carriers as a means for high-density packaging : Jon S. Prokop and Dale W. Williams. IEEE Trans. Components, Hybrids, mfg Technol.Chmt-1, (3) 297 (September 1978)

Journal:

Microelectronics Reliability

Year:

1978

Language:

english

File:

PDF, 132 KB

english, 1978