Volume 20; Issue 1-2

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Microelectronics Reliability
Volume 20; Issue 1-2

Microelectronics Reliability

Volume 20; Issue 1-2

1

Volume contents

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 40 KB

english, 1980

2

Chairman's message

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 22 KB

english, 1980

3

The 1980 SRE Canadian Reliability Symposium Committee

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 26 KB

english, 1980

4

Quality assurance and the consumer

Louise A Heslop

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 481 KB

english, 1980

5

Development of the DHC-7 aircraft maintenance program

Journal:

Microelectronics Reliability

Year:

1980

File:

PDF, 18 KB

1980

6

A comparison study of the reliability of the two majority-vote instrumentation systems: Two-of-Three and Three-of-Four Systems

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 323 KB

english, 1980

7

Development of a maintenance plan for the intermediate capacity transit system

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 339 KB

english, 1980

8

Reliability in the dormant condition

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 335 KB

english, 1980

9

Prediction of the reliability of mechanical components subjected to combined alternating and mean stresses with non-constant stress ratio

D Kececioglu, G Lamarre

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 401 KB

english, 1980

10

Establishing and confirming R and M requirements for DND vehicles

A.P Harris, Major F Parsons, J.M Duchesne

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 681 KB

english, 1980

11

Optimum test design strategies

Kailash C Kapur, Leonard R Lamberson

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 264 KB

english, 1980

12

Gidep assists in solving reliability/quality problems

Edwin T Richards

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 433 KB

english, 1980

13

Effect of system peak load forecast uncertainty on annualized reliability indices of composite generation and transmission systems

R Billinton, T.K.P Medicherla

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 624 KB

english, 1980

14

Reliability pays off

William G Kindig, Robert F Dannecker

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 546 KB

english, 1980

15

A system safety approach to the design of an Intermediate Capacity Transit System

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 377 KB

english, 1980

16

Strategies of file redundancy in information systems

I.B Turksen, V.V Kul'ba

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 446 KB

english, 1980

17

The human element in reliable systems

P Cross, P Thompson

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 39 KB

english, 1980

18

A new approach toward evaluation of reliability of electronic equipment during maintenance and designing

Moisey M Lerner

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 208 KB

english, 1980

19

Mechanical component reliability under environmental stress

Balbir S Dhillon

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 294 KB

english, 1980

20

Biographies

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 256 KB

english, 1980

21

Hardware and software reliability and confidence limits for computer-controlled systems

Robert D Haynes, William E Thompson

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 616 KB

english, 1980