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Volume 20; Issue 6
Main
Microelectronics Reliability
Volume 20; Issue 6
Microelectronics Reliability
Volume 20; Issue 6
1
Calendar of international conferences, symposia, lectures and meetings of interest
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 118 KB
Your tags:
english, 1980
2
Publications, notices, calls forpapers, etc.
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 1008 KB
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english, 1980
3
The failure rate function estimated from parameter drift measurements
Jørgen Møltoft
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 543 KB
Your tags:
english, 1980
4
Experimental characterization of most's scaled down to the 1 μm level
Hideo Sunami
,
Yasuo Wada
,
Norikazu Hashimoto
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 691 KB
Your tags:
english, 1980
5
On human reliability trends in digital communication systems
Inder M. Soi
,
K.K. Aggarwal
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 467 KB
Your tags:
english, 1980
6
A repairable system with N failure modes and one standby unit
Mitsuo Yamashiro
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 162 KB
Your tags:
english, 1980
7
Digital filter analysis with personal computer
S.M. Bozic
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 325 KB
Your tags:
english, 1980
8
Effect of shunt capacitance on tapered distributed RC network characteristics
K.D. Au
,
C.A. Miller
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 200 KB
Your tags:
english, 1980
9
Realization of frequency dependent negative resistance
R.I. Salawu
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 146 KB
Your tags:
english, 1980
10
Checking request policies for a one-unit system and their comparisons
Shigeru Yamada
,
Shunji Osaki
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 623 KB
Your tags:
english, 1980
11
Multi-state homogeneous Markov models in reliability analysis
Andrea Bobbio
,
Amedeo Premoli
,
Olimpio Saracco
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 531 KB
Your tags:
english, 1980
12
Hardware vs software reliability—A comparative study
Inder M. Soi
,
Krishna Gopal
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 517 KB
Your tags:
english, 1980
13
Optimum preventive maintenance policies for a 2-unit redundant system with repair and post-repair
S.M. Sinha
,
D.V.S. Kapil
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 257 KB
Your tags:
english, 1980
14
First uptime and disappointment time joint distribution of an intermittently used system
K.R. Kapoor
,
P.K. Kapur
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1980
15
On the decision to replace a unit early or late—A graphical solution
Bo Bergman
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 145 KB
Your tags:
english, 1980
16
The responsibility of the consumer. The pendulum has swung too far : Irving Deutsch. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 468 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
17
Products liability: defective conditions : C. O. Smith. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 470 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
18
Management benefits and burdens in regulatory legalisms : Herman D. Rue. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 11 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
19
Japanese make quality-control pitch : Ray Connolly. Electronics, 10 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
20
Draft DoD directive 5000.xx, Reliability and Maintainability : Ben H. Swett, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 19 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
21
Product liability prevention—an engineer's viewpoint : Raymond Goldstein, Quality Prog. p. 24 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
22
Preliminary evaluation of DIP/socket connection reliability : Gordon W. Mills. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2 (4) 476 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 237 KB
Your tags:
english, 1980
23
Electromigration mechanism in aluminium conductors : G. M. von Staszewski and N. E. Walsoe de Reca. Solid-St. Electron., 23, 481 (1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
24
Reliability design and quality assurance system for solid tantalum capacitor : Takeshi Asada, Koichi Shirai, Itsuyo Kageyama and Yorio Hasegawa. NEC Res. Dev. (Jpn), 56, 190 (January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
25
Reliability study of high-power microwave GaAs MESFETs : Hideaki Kohzu, Isamu Nagasako, Masahide Nakajima and Makoto Takeuchi. NEC Res. Dev. (Jpn), 56, 184 (January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
26
Behaviour of line contacts upon the effect of fault currents : Istvan Molnar and Gyorgy Lelovics. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 191 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
27
Degradation of thermocompression bonds to Ti-Cu-Au and Ti-Cu thin films by thermal aging : Leonard G. Feinstein and Ronald J. Pagano. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 134 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
28
The use of an industrial X-ray source for electronic component radiation effects work : Leonard Adams and Ian Thompson. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 144 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
29
Reversible breakdown voltage collapse in silicon gate-controlled diodes : A. Rusu, O. Pietrareanu and C. Bulucea. Solid-St. Electron., 23, 473 (1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
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english, 1980
30
Procurement specification requirements for protection against electromigration failures in aluminium metallizations : S. P. Sim. Microelectron. Reliab., 19, 207 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
31
Some fundamental properties of aluminum-aluminum electrical contacts : R. S. Timsit. IEEE Trans. Components, Hybrids, Mfg Technol., Chmt-3 (1) 71 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
32
Real-time monitoring of semiconductor process uniformity : D. S. Perloff, T. F. Hasan and E. R. Blome. Solid-St. Technol., 81 (February 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
33
Ultrasonic in-line inspection technique for contact materials : Ernest Jost and Gerard Fontaine. IEEE Trans. Components, Hybrids, Mfg. Technol., Chmt-3 (1) 79 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
34
Hardening RAMs against soft errors : Mark Brodsky. Electronics, 117 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1980
35
A survey of corrosion failure mechanisms in microelectronic devices : George L. Schnable, Robert B. Comizzoli, Werner Kern and Lawrence K. White. RCA Review, 40, 416 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 272 KB
Your tags:
english, 1980
36
Transient damage resulting in failure of a component exposed to ionizing radiation environment : R. P. S. Yadav and Krishan Lal. Microelectron. Reliab., 19, 223 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
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english, 1980
37
Model for failure rate curves : G. Bosch. Microelectron. Reliab., 19, 371 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
38
Fault-tolerant system optimization : John Rose. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 95 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
39
A guidebook for software reliability assessment : Alan Sukert and Amrit L. Goel. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 186 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
40
Field maintenance organization analysis models : Ronald Braff. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 24 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
41
Effect of switch failure on 2 redundant systems : Jai Singh. IEEE Trans. Reliab.R-29 (1) 82 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
42
Age replacement policies for Weibull failure times : Pandu R. Tadikamalla. IEEE Trans. Reliab.R-29 (1) 88 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
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english, 1980
43
Asymptotic distribution of downtime for a cold-standby system : Ole Platz. IEEE Trans. Reliab.R-29 (1) 79 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 131 KB
Your tags:
english, 1980
44
Reliability improvement of multiterminal networks : J. M. Kontoleon. IEEE Trans. Reliab.R-29 (1) 75 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 268 KB
Your tags:
english, 1980
45
Performance/availability model of shared resource multiprocessors : T. C. K. Chou and J. A. Abraham. IEEE Trans. Reliab.R-29 (1) 70 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
46
Maximum likelihood estimation of linear failure rate : Anthony A. Salvia. IEEE Trans. Reliab.R-29 (1) 49 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
47
Optimization system reliability via redundancy and/or design considerations : L. C. Frair, P. M. Ghare and K. L. Frair. IEEE Trans. Reliab.R-29 (1) 33 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
48
Reliability evaluation of a flow network : S. H. Lee. IEEE Trans. Reliab.R-29 (1) 24 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
49
Probability plots for life test data based on optimum spacing method : Masaaki Tsujitani, Hiroshi Ohta and Shigeo Kase. IEEE Trans. Reliab.R-29 (1) 66 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
50
Estimation of the guarantee time in an exponential failure model : Danny Dyer and Jerome Keating. IEEE Trans. Reliab.R-29 (1) 63 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
51
General failure model applied to preventive maintenance policies : Frank Beichelt and Klaus Fischer. IEEE Trans. Reliab.R-29 (1) 39 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
52
Sequential destruction method for Monte Carlo evaluation of system reliability : Malcolm C. Easton and C. K. Wong. IEEE Trans. Reliab.R-29 (1) 27 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
53
Confidence intervals for comparing two life distributions : Elisa T. Lee and David R. Thomas. IEEE Trans. Reliab.R-29 (1) 51 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 271 KB
Your tags:
english, 1980
54
Optimization of maintained systems : P. K. W. Chan and T. Downs. IEEE Trans. Reliab.R-29 (1) 42 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
55
Ground-hypotheses for beta distribution as Bayesian prior : A. G. Colombo and D. Constantini. IEEE Trans. Reliab.R-29 (1) 17 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
56
Reliability bounds for decomposable multi-component systems : N. Singh and S. Kumar. IEEE Trans. Reliab.R-29 (1) 22 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
57
Log-rank vs x test for exponentiality : Crayton C. Walker, Dennis W. McLeavey and Warren Rogers. IEEE Trans. Reliab.R-29 (1) 45 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
58
On the specification of repair time requirements : Sherrie E. Emoto and Ray E. Schafer. IEEE Trans. Reliab.R-29 (1) 13 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
59
Achieving high reliability in sonar power supplies : Jerome C. Bobrowski. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 55 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
60
A generalized computer program for the estimation of the optimum number of trials for establishing a systems reliability : V. Swaminathan, S. Rajagopalan and C. M. Chacko. QR J, India, 17 (January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1980
61
Difficulties in fault-tree synthesis for process plant : P. K. Andow. IEEE Trans. Reliab.R-29 (1) 2 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 273 KB
Your tags:
english, 1980
62
Cost analyses for avionics acquisition : Edward F. Toohey and Alberto B. Calvo. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 85 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
63
An analysis of MIL-STD-471 test methods : David A. Heiser. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 43 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
64
A study of three environmental reliability tests : John C. Warner. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 226 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
65
No. 4 ESS—Reliability and maintainability experience : P. K. Giloth. Proc. Annual Reliability and Maintainability Symposium, San Francisco. p. 388 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
66
Computer-aided determination of tests for the detection and localisation of faults in electronic circuits and systems : U. Fruhauf and P. Slowig. Nachrichtentechnik Elektronik30 4, 144 (1980). (In German)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
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english, 1980
67
Some facts about environmental stress screening : Irving Quart and Dean Edgerton, Jr.Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 220 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1980
68
Common cause failures—a dilemma in perspective : Anthony M. Smith and Ian A. Watson. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 332 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
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english, 1980
69
Reliability problems with the store switching circuit U 253 : D. Grosse and B. Junghans. Nachrichtentechnik Elektronik30 112 (1980). (In German)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 138 KB
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english, 1980
70
Hardware and software: an analytical approach : William L. Bunce. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 209 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 273 KB
Your tags:
english, 1980
71
Software and hardware R & M: What are the differences : Melvin B. Kline. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 179 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1980
72
L'aide à la maintenance des systèmes: le moniteur MOSTAM: J. Cerf and J. P. Bertrand. Rev. Tech. Thomson-CSF, 12, (1) p. 201 (March 1980). (In French)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
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english, 1980
73
The decision to replace a unit early or late in an age replacement problem : T. Nakagawa. Microelectron. Reliab.19, 265 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
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english, 1980
74
Digraphs and their applications in fault tree analysis : Y. C. Chopra and K. K. Aggarwal. Microelectron. Reliab.19, 269 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
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english, 1980
75
Implementation constraints in self-checking integrated circuits : Y. Crouzet and C. Landrault. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 58
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
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english, 1980
76
Failure analysis on a 65 K MOS RAM with a new type of memory display : W. Nasswetter. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 113
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1980
77
k-out-of-n:G system with simultaneous failure and three repair policies: Kouichi Adachi and Masanori Kodama. Microelectron. Reliab.19, 351 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1980
78
Common-cause failure analysis of a three-state device system : Balbir S. Dhillon, A. Sambhi and M. R. Khan. Microelectron. Reliab.19, 345 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 268 KB
Your tags:
english, 1980
79
On reliability of a computer network : Inder M. Soi. Microelectron. Reliab.19, 237 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
80
Simulation comparisons of point estimation methods in the 2-parameter Weibull distribution : Shoji Kuchii, Naoto Kaio and Shunji Osaki. Microelectron. Reliab.19, 333 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
81
Some aspects of reliable software packages : Inder M. Soi and Krishna Gopal. Microelectron. Reliab.19, 379 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
82
Repairable systems with one standby unit : E. A. Elsayed and Balbir S. Dhillon. Microelectron. Reliab.19, 243 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
83
The effect of alpha-particle-induced soft errors on memory systems with error correction : D. J. W. Noorlag, L. M. Terman and A. G. Konheim. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 86
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
84
On a basic equation of reliability theory : F. Beichelt and K. Fischer. Microelectron. Reliab.19, 367 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
85
Path enumeration using flow graphs : Suresh Rai and K. K. Aggarwal. Microelectron. Reliab.19, 391 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
86
Accelerated versus real time aging tests : E. W. Kimball. Proc. Annual Reliability and Maintainability Symposium, San Francisco. p. 51 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
87
Digital system diagnostics-design/evaluation : Gregory A. Conley, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 38. (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1980
88
Reliability assurance programs to meet regulatory requirements in the electric power and process industries : Robert H. Gauger. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 1 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
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89
Observed reliability of FLIR common modules and systems : Edward P. Des Plas. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 61 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
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90
Data needs for software reliability modelling : Lorraine Duvall, Jon Martens, Dorothy Swearingen and John Donahoo, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 200 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
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91
INTELSAT system reliability : Irwan A. Feigenbaum. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 415 (22–24 January 1980)
Journal:
Microelectronics Reliability
Year:
1980
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92
A computational technique for maximum likelihood estimation with Weibull models : Norman P. Archer. IEEE Trans. Reliab.R-29, (1) 57 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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93
The fail-safe feature of the Lapp & Powers fault tree : Mitchell O. Locks. IEEE Trans. Reliab.R-29, (1) 10 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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94
VLSI with a vengeneance : Larry W. Sumney. IEEE Spectrum. 24 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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95
VLSI/LSI circuit functions: their challenges, rewards and problems : Joseph J. DiGiacomo. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 94 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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96
Research and development of IC technology in Japan : T. Sugano. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 139
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Microelectronics Reliability
Year:
1980
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97
Microelectronics—the revolution in consumer equipment : J. C. van Vessem. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 20
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Microelectronics Reliability
Year:
1980
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98
VLSI—directions and impact : B. T. Murphy. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 70
Journal:
Microelectronics Reliability
Year:
1980
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99
Soft errors in VLSI: present and future : Timothy C. May. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 377 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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100
Large-scale integration latches onto the phone system : Harvey J. Hindin. Electronics. 113 (5 June 1980)
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Microelectronics Reliability
Year:
1980
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101
Programmable components: the shape of VLSI to come : James L. Fischer. Electronics. 138 (5 June 1980)
Journal:
Microelectronics Reliability
Year:
1980
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102
Built-in test for complex digital integrated circuits : B. Konemann, J. Mucha and G. Zwiehoff. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 89
Journal:
Microelectronics Reliability
Year:
1980
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103
The promotion of VLSI and microlithography in Germany : H. Beneking. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 94
Journal:
Microelectronics Reliability
Year:
1980
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english
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104
Quantitative comparison of electronic component/solder joint stress relief in encapsulated assemblies : Dennis A. Cummings. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2, (4) 454 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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105
Cost effective semiconductor memory testing : R. W. Stevens and J. R. Brailsford. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 82
Journal:
Microelectronics Reliability
Year:
1980
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106
I. C. layout—the automatic approach : K. J. Loosemore. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 48
Journal:
Microelectronics Reliability
Year:
1980
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english
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107
A high speed 64 × 4 bit 100K-compatible ECL-RAM with 6 NS access time: H. v. Witsch and H. Ernst. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn.178, 102
Journal:
Microelectronics Reliability
Year:
1980
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english
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108
Current aspects of CAD for integrated circuits : J. P. Avenier. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 43
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
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109
The MOM 400 single-chip microcomputer : A. B. Guyot, M. Henry and M. E. Vergniault. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 150
Journal:
Microelectronics Reliability
Year:
1980
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110
Design aspects and reliability of a synchronizer made in MOS technology : H. J. M. Veendrick. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 8
Journal:
Microelectronics Reliability
Year:
1980
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111
Methods, equipment and materials for the wire contacting of semiconductor chips : F. Rudolf, G. Heinke and J. Labs. Nachrichtentechnik Elektronik30, 115 (1980). (In German)
Journal:
Microelectronics Reliability
Year:
1980
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english
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112
A high speed multiplier using subnanosecond bipolar VLSI technologies : T. Takahashi, S. Wakamatsu and K. Kimura. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn.178, 110
Journal:
Microelectronics Reliability
Year:
1980
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113
Reliable Multiwire circuits with small gauge wires : EtsujiHybrids Mfg Technol.Chmt-2, (4) 532 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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english
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114
A ULA is more than silicon : J. A. Vernon, N. R. Crocker and J. P. Singleton. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 51
Journal:
Microelectronics Reliability
Year:
1980
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115
Advances in wafer process control : Klaus Schuegraf. Solid-St. Technol. 87 (February 1980)
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Microelectronics Reliability
Year:
1980
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116
Thermal studies of a plastic dual-in-line package : Curtis Mitchell and Howard M. Berg. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 500 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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english
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117
Experimental investigation of mounting thermal resistance of flatpacks on circuit boards : Thomas F. Movius, Ivan R. Jones and James M. Kallis. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 512 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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english
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118
The performance of plastic-encapsulated CMOS microcircuits in a humid environment : Paul W. Peterson. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 422 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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119
Gold/chromium metallizations for electronics devices : Paul H. Holloway. Solid-St. Technol. 109 (February 1980)
Journal:
Microelectronics Reliability
Year:
1980
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120
Computer aided design of LSI: an I2L case study : C. P. Lincoln and R. J. Crispin. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 64
Journal:
Microelectronics Reliability
Year:
1980
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121
A 500-picosecond system design capability : S. Hollock. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 79
Journal:
Microelectronics Reliability
Year:
1980
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122
Universal logic gates for custom-design I.C. requiremeats : S. L. Hurst, Microelectron. Reliab.19, 457 (1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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123
IBM multichip multilayer ceramic modules for LSI chips—design for performance and density : Bernard T. Clark and Yates M. Hill. IEEE Trans. Components, Hybrids Mfg Technology. Chmt-3, (1) 89 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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124
Electrothermal effects in integrated circuits : D. J. Hamilton and W. J. Kerwin. Microelectron. J.11, (2) 5 (1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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125
High density uncommitted arrays using an advanced CMOS technology : W. T. Alexander, S. J. Boardman, P. Krebs and A. T. P. MacArthur. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 76
Journal:
Microelectronics Reliability
Year:
1980
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126
A GaAs MESFET sample and hold switch : P. H. Saul. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publ.178, 5
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Microelectronics Reliability
Year:
1980
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127
Fully automated integrated circuit wire bonding system : Masayuki Naruse. Susumu Miyazaki, Tatsuru Yamada, Kouichi Kawata, Yasuo Sakagawa and Ken-ichi Igarashi. NEC Res. Dev. (Jpn), 56, 163 (January 1980)
Journal:
Microelectronics Reliability
Year:
1980
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128
Polysilicon self-aligned technology—A new approach for bipolar LSIs : Kenji Okada, Kunio Aomura, Toshio Nakamura and Hiroshi Shiba. NEC Res. Dev. (Jpn). 56, 170 (January 1980)
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Microelectronics Reliability
Year:
1980
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129
Advances in GaAs LSI/VLSI processing technology : Bryant M. Welch. Solid-St. Technol. 95 (February 1980)
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Microelectronics Reliability
Year:
1980
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130
Chip carrier packaging applications : John A. Bauer. IEEE Trans. on Components, Hybrids Mfg Technol.Chmt-3, (1) 120 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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131
Aluminium alloy as an interconnecting material in the fabrication of integrated circuits : Tapan Kumar Gupta. Microelectron. Reliab.19, 337 (1979)
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Microelectronics Reliability
Year:
1980
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132
Circuit-board packaging considerations for optimum utilization of chip carriers : Daniel I. Amey and John W. Balde. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 105 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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133
The BCML circuit and packaging system : Herbert Stopper. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 110 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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134
A new air film technique for low contact handling of silicon wafers : J. A. Paivanas and J. K. Hassan. Solid-St. Technol. 148 (April 1980)
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Microelectronics Reliability
Year:
1980
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135
Optical end-point detection for the plasma etching of aluminum : B. J. Curtis. Solid-St. Technol. 129 (April 1980)
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Microelectronics Reliability
Year:
1980
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136
Loading effect and temperature dependence of etch rate of silicon materials in CF4 plasma : Tatsuya Enomoto. Solid-St. Technol. 117 (April 1980)
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Microelectronics Reliability
Year:
1980
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137
Plasma etching for SiO2 profile control : J. A. Bondur and H. A. Clark. Solid-St. Technol. 122 (April 1980)
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Microelectronics Reliability
Year:
1980
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138
Multiple-drain MOS packs in very fast logic gates : Kenneth Dreyfack. Electronics 73 (5 June 1980)
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Microelectronics Reliability
Year:
1980
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139
Decoding scheme smooths 18-bit converter's nonlinearity : Samuel Wilensky. Electronics 128 (5 June 1980)
Journal:
Microelectronics Reliability
Year:
1980
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140
Plasma deposited polycrystalline silicon films : Kalluri R. Sarma. Solid-St. Technol. 143 (April 1980)
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Microelectronics Reliability
Year:
1980
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english
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141
Simple process propels bipolar PROMs to 16-K density and beyond : Robert K. Wallace and Arthur J. Learn. Electronics. 147 (27 March 1980)
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Microelectronics Reliability
Year:
1980
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english
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142
Integrated circuit characteristics at 260°C for aircraft engine-control applications : Leslie J. Palkuti, John L. Prince and Andrew S. Glista, Jr.IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 405 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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143
C-MOS multiplier speeds task for microprocessors : Kevin Smith. Electronics 7E (24 April 1980)
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Microelectronics Reliability
Year:
1980
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144
16-bit microprocessor enters virtual memory domain : Yohav Lavi, Asher Kaminker, Ayram Menachem and Subhash Bal. Electronics. 123 (24 April 1980)
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Microelectronics Reliability
Year:
1980
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english
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145
The steady-state distribution of signal charge in charge-coupled devices : Stefan Opalski and Marek Syrzycki. Electron Technol.12, (2) 3 (1979)
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Microelectronics Reliability
Year:
1980
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146
A review of microprocessor software : A. R. Rundle. Microelectron. Reliab.19, 541 (1980)
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Microelectronics Reliability
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1980
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147
A new ultra low power ULA and its application : P. Forshaw. Microelectron. Reliab.19, 463 (1980)
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Microelectronics Reliability
Year:
1980
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148
An integrated circuit v.h.f. radio receiver : I. A. W. Vance. Radio Electron. Eng.50, (4) 158 (April 1980)
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Microelectronics Reliability
Year:
1980
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149
Chips make fast math a snap for microprocessors : Krishna Rallapalli and Joe Kroeger. Electronics. 153 (24 April 1980)
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Microelectronics Reliability
Year:
1980
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150
Intelligent memories and the silicon chip : I. Aleksander. Electron. Power. 324 (April 1980)
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Microelectronics Reliability
Year:
1980
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151
Advances in c.c.d. scanners with on-chip signal processing for electronic imaging : Savvas G. Chamberlain. Radio Electron. Engr.50, (5) 249 (May 1980)
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Microelectronics Reliability
Year:
1980
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english
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152
Custom ECL chips boost performance in smaller mainframes : Anthony Durniak. Electronics. 39 (24 April 1980)
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Microelectronics Reliability
Year:
1980
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153
Technical and practical considerations of incorporating microprocessors in OEM products—a management view : S. Sambell. Microelectron. Reliab.19, 523 (1980)
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Microelectronics Reliability
Year:
1980
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154
Control chip handles error checking and character-hased protocols easily : Alan J. Weissberger, John Yarborough, Suresh Vasa and Yesh Mehta. Electronics. 151 (27 March 1980)
Journal:
Microelectronics Reliability
Year:
1980
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155
Analogue sampling ICs in data acquisition systems : Derek F. Bowers. Microelectron. Reliab.19, 497 (1980)
Journal:
Microelectronics Reliability
Year:
1980
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156
Minicomputer fills mainframe's shows : Carl J. Alsing, Kenneth D. Holberger, Charles J. Holland, Edward J. Rasala and Steven J. Wallach. Electronics. 130 (22 May 1980)
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Microelectronics Reliability
Year:
1980
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157
Mainframe builders making more ICs : Larry Marion. Electronics. 106 (22 May 1980)
Journal:
Microelectronics Reliability
Year:
1980
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158
Two-chip radio link pilots toys and models : Martin Giles, Kerry Lacanette, Dennis Monticelli and Ron Page. Electronics. 145 (5 June 1980)
Journal:
Microelectronics Reliability
Year:
1980
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english
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159
Distributed computer network takes charge in IC faeility : David P. Clemens and Gary L. Castleman. Electronics. 151 (5 June 1980)
Journal:
Microelectronics Reliability
Year:
1980
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160
An investigation of the valley splitting in n-channel silicon (100) inversion layers: R. J. Nicholas, K. von Klitzing and Th. Englert. Solid St. Commun.34, 51 (1980)
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Microelectronics Reliability
Year:
1980
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161
Aluminum-silicon OHMIC contact on “shallow” n + /p junctions: M. Finetti, P. Ostoja, S. Solmi and G. Soncini. Solid-St. Electron.23, 255 (1980)
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1980
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162
On the mobility of polycrystalline semiconductors : J. Martinez and J. Piqueras. Solid-St. Electron.23, 297 (1980)
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Year:
1980
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163
Observation of valley splitting in (111) n-type silicon inversion layers: Th. Englert, D. C. Tsui and G. Landwehr. Solid St. Commun.33, 1167 (1980)
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Microelectronics Reliability
Year:
1980
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164
An investigation of the interface state density in metal-silieon nitride-silicon structures : J. P. Bigorgne, M. Favre, G. Salace and J. Despujols. Solid-St. Electron.23, 243 (1980)
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Microelectronics Reliability
Year:
1980
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165
Avalanche injection in MNOS gate controlled diodes : Phillip Rutter. Solid St. Electron.23, 441 (1980)
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Microelectronics Reliability
Year:
1980
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166
An influence of the rate of epitaxial growth on physical properties of gallium nitride : Danuta Dobosz and Jerzy Petryk. Electron Technol.12, (2) 103 (1979)
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Year:
1980
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167
The effects of phosphorus diffusion cooling rate on I2L gain : Bernard L. Morris. Solid St. Electron. 23, 457 (1980)
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Microelectronics Reliability
Year:
1980
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168
Preoxidation gettering of oxidation-induced stacking faults in silicon by the phosphorus diffusion process : Jhy-Horng Chen and Mao-Chieh Chen. Int. J. Electron.47, (6) 555 (1979)
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Year:
1980
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169
Characterization of surface states in HCL-grown oxides using MOS transient currents : Paul D. Esqueda and Mukunda B. Das. Solid-St. Electron.23, 365 (1980)
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Microelectronics Reliability
Year:
1980
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170
Charge injection from a surface depletion region—the Al2O3-silicon system : J. Kolk and E. L. Heasell. Solid-St. Electron.23, 223 (1980)
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Microelectronics Reliability
Year:
1980
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171
Paraconductivity of Ge-covered tin films : R. S. Parashar and P. N. Dheer. Solid St. Commun.34, 113 (1980)
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Year:
1980
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172
Properties of plasma enhanced CVD silicon nitride: measurements and interpretations : Kenneth M. Mar and Gay M. Samuelson. Solid St. Technol. 137 (April 1980)
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Microelectronics Reliability
Year:
1980
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173
Semi-empirical APW calculation of the band structure of silicon : D. A. Papaconstantopoulos and B. M. Klein. Solid St. Commun.34, 511 (1980)
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Microelectronics Reliability
Year:
1980
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174
TCR control of Ni/Cr resistors : Ronald A. Thiel and Edward H. Maurer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 467 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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175
Fabrication of passive components for high-temperature instrumentation : Leonard S. Raymond, Louis N. Nelson, Douglas J. Hamilton and William J. Kerwin. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 395 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
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176
Development of the thick-film capacitor and its application for hybrid circuit modules : Katsuo Abe, Akira Ikegami, Nobuyuki Sugishita, Noriyuki Taguchi, Tokio Isogal, Ichiro Tsubokawa and Hiroshi Ohtsu. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 434 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 139 KB
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177
Performance of the porcelain-metal substrate at microwaves : Alfred Schwarzmann. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 451 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
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178
Thick-film fine pattern formation by a photolithographic process : Yutaka Watanabe, Atsushi Aritomo and Katsuhiko Watanabe. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 428 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
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179
The role of hybrids in LSI systems : Charles T. Goddard. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 367 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 139 KB
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180
Interdiffusion processes and oxidation phenomena in NiCr/Au films : A. Scatamacchia and G. Ottaviani. Solid St. Technol. 116 (February 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 285 KB
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english, 1980
181
Alloyed thick-film gold conductor for high reliability high-yield wire bonding : Samuel J. Horowitz, John J. Felten and Donald J. Gerry. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 460 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 149 KB
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english, 1980
182
Influence of the substrate on the electrical properties of thick-film resistors : Aldo Cattaneo, Luisa Pirozzi, Bruno Morten and Maria Prudenziati. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 181 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 149 KB
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183
Extension of high-temperature electronics : Bruce L. Draper and David W. Palmer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 399 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 149 KB
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184
Large scale digital hybrid microcircuits for new military systems : Dennis R. Kling and Robert W. Ilgenfritz. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 372 (December 1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 149 KB
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english, 1980
185
Molecular beam epitaxy : Morton G. Panish and Alfred Y. Cho. IEEE Spectrum. 18 (April 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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english, 1980
186
Piezoresistance tensor coefficients of phosphorus implanted silicon thin films : Janusz Rybinski. Electron Technol.12, (2) 59 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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english, 1980
187
Photoexcitation effects during laser trimming of thin-film resistors on silicon : Ami Kestenbaum and Thomas F. Baer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 166 (March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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188
Ionization assisted annealing of boron implanted silicon : Henryk Rzewuski, Jan Suski and Janusz Krynicki. Electron Technol.12, (2) 67 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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english, 1980
189
Ion beams promise practical systems for submicrometer wafer lithography : Robert L. Seliger and Paul A. Sullivan. Electronics. 142 (27 March 1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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english, 1980
190
A study of PtSi formation : Danuta Brzezinska and Michel Zaborowski. Electron Technol.12, (2) 93 (1979)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
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english, 1980
191
Thin layer high-voltage devices (resurf devices) : J. A. Appels, M. G. Collet, P. A. H. Hart, H. M. J. Vaes and J. F. C. M. Verhoeven. Philips J. Res.35, (1) 1 (1980)
Journal:
Microelectronics Reliability
Year:
1980
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1980
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