Volume 20; Issue 6

Microelectronics Reliability

Volume 20; Issue 6

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 118 KB

english, 1980

2

Publications, notices, calls forpapers, etc.

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 1008 KB

english, 1980

3

The failure rate function estimated from parameter drift measurements

Jørgen Møltoft

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 543 KB

english, 1980

4

Experimental characterization of most's scaled down to the 1 μm level

Hideo Sunami, Yasuo Wada, Norikazu Hashimoto

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 691 KB

english, 1980

5

On human reliability trends in digital communication systems

Inder M. Soi, K.K. Aggarwal

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 467 KB

english, 1980

6

A repairable system with N failure modes and one standby unit

Mitsuo Yamashiro

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 162 KB

english, 1980

7

Digital filter analysis with personal computer

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 325 KB

english, 1980

8

Effect of shunt capacitance on tapered distributed RC network characteristics

K.D. Au, C.A. Miller

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 200 KB

english, 1980

9

Realization of frequency dependent negative resistance

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 146 KB

english, 1980

10

Checking request policies for a one-unit system and their comparisons

Shigeru Yamada, Shunji Osaki

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 623 KB

english, 1980

11

Multi-state homogeneous Markov models in reliability analysis

Andrea Bobbio, Amedeo Premoli, Olimpio Saracco

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 531 KB

english, 1980

12

Hardware vs software reliability—A comparative study

Inder M. Soi, Krishna Gopal

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 517 KB

english, 1980

13

Optimum preventive maintenance policies for a 2-unit redundant system with repair and post-repair

S.M. Sinha, D.V.S. Kapil

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 257 KB

english, 1980

14

First uptime and disappointment time joint distribution of an intermittently used system

K.R. Kapoor, P.K. Kapur

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 130 KB

english, 1980

15

On the decision to replace a unit early or late—A graphical solution

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 145 KB

english, 1980

16

The responsibility of the consumer. The pendulum has swung too far : Irving Deutsch. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 468 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

17

Products liability: defective conditions : C. O. Smith. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 470 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

18

Management benefits and burdens in regulatory legalisms : Herman D. Rue. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 11 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

19

Japanese make quality-control pitch : Ray Connolly. Electronics, 10 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

20

Draft DoD directive 5000.xx, Reliability and Maintainability : Ben H. Swett, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 19 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

21

Product liability prevention—an engineer's viewpoint : Raymond Goldstein, Quality Prog. p. 24 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

22

Preliminary evaluation of DIP/socket connection reliability : Gordon W. Mills. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2 (4) 476 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 237 KB

english, 1980

23

Electromigration mechanism in aluminium conductors : G. M. von Staszewski and N. E. Walsoe de Reca. Solid-St. Electron., 23, 481 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

24

Reliability design and quality assurance system for solid tantalum capacitor : Takeshi Asada, Koichi Shirai, Itsuyo Kageyama and Yorio Hasegawa. NEC Res. Dev. (Jpn), 56, 190 (January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

25

Reliability study of high-power microwave GaAs MESFETs : Hideaki Kohzu, Isamu Nagasako, Masahide Nakajima and Makoto Takeuchi. NEC Res. Dev. (Jpn), 56, 184 (January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

26

Behaviour of line contacts upon the effect of fault currents : Istvan Molnar and Gyorgy Lelovics. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 191 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

27

Degradation of thermocompression bonds to Ti-Cu-Au and Ti-Cu thin films by thermal aging : Leonard G. Feinstein and Ronald J. Pagano. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 134 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

28

The use of an industrial X-ray source for electronic component radiation effects work : Leonard Adams and Ian Thompson. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-3 (1) 144 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

29

Reversible breakdown voltage collapse in silicon gate-controlled diodes : A. Rusu, O. Pietrareanu and C. Bulucea. Solid-St. Electron., 23, 473 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

30

Procurement specification requirements for protection against electromigration failures in aluminium metallizations : S. P. Sim. Microelectron. Reliab., 19, 207 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

31

Some fundamental properties of aluminum-aluminum electrical contacts : R. S. Timsit. IEEE Trans. Components, Hybrids, Mfg Technol., Chmt-3 (1) 71 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

32

Real-time monitoring of semiconductor process uniformity : D. S. Perloff, T. F. Hasan and E. R. Blome. Solid-St. Technol., 81 (February 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

33

Ultrasonic in-line inspection technique for contact materials : Ernest Jost and Gerard Fontaine. IEEE Trans. Components, Hybrids, Mfg. Technol., Chmt-3 (1) 79 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

34

Hardening RAMs against soft errors : Mark Brodsky. Electronics, 117 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 141 KB

english, 1980

35

A survey of corrosion failure mechanisms in microelectronic devices : George L. Schnable, Robert B. Comizzoli, Werner Kern and Lawrence K. White. RCA Review, 40, 416 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 272 KB

english, 1980

36

Transient damage resulting in failure of a component exposed to ionizing radiation environment : R. P. S. Yadav and Krishan Lal. Microelectron. Reliab., 19, 223 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

37

Model for failure rate curves : G. Bosch. Microelectron. Reliab., 19, 371 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

38

Fault-tolerant system optimization : John Rose. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 95 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

39

A guidebook for software reliability assessment : Alan Sukert and Amrit L. Goel. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 186 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

40

Field maintenance organization analysis models : Ronald Braff. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 24 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

41

Effect of switch failure on 2 redundant systems : Jai Singh. IEEE Trans. Reliab.R-29 (1) 82 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

42

Age replacement policies for Weibull failure times : Pandu R. Tadikamalla. IEEE Trans. Reliab.R-29 (1) 88 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

43

Asymptotic distribution of downtime for a cold-standby system : Ole Platz. IEEE Trans. Reliab.R-29 (1) 79 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 131 KB

english, 1980

44

Reliability improvement of multiterminal networks : J. M. Kontoleon. IEEE Trans. Reliab.R-29 (1) 75 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 268 KB

english, 1980

45

Performance/availability model of shared resource multiprocessors : T. C. K. Chou and J. A. Abraham. IEEE Trans. Reliab.R-29 (1) 70 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

46

Maximum likelihood estimation of linear failure rate : Anthony A. Salvia. IEEE Trans. Reliab.R-29 (1) 49 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

47

Optimization system reliability via redundancy and/or design considerations : L. C. Frair, P. M. Ghare and K. L. Frair. IEEE Trans. Reliab.R-29 (1) 33 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

48

Reliability evaluation of a flow network : S. H. Lee. IEEE Trans. Reliab.R-29 (1) 24 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

49

Probability plots for life test data based on optimum spacing method : Masaaki Tsujitani, Hiroshi Ohta and Shigeo Kase. IEEE Trans. Reliab.R-29 (1) 66 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

50

Estimation of the guarantee time in an exponential failure model : Danny Dyer and Jerome Keating. IEEE Trans. Reliab.R-29 (1) 63 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

51

General failure model applied to preventive maintenance policies : Frank Beichelt and Klaus Fischer. IEEE Trans. Reliab.R-29 (1) 39 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

52

Sequential destruction method for Monte Carlo evaluation of system reliability : Malcolm C. Easton and C. K. Wong. IEEE Trans. Reliab.R-29 (1) 27 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

53

Confidence intervals for comparing two life distributions : Elisa T. Lee and David R. Thomas. IEEE Trans. Reliab.R-29 (1) 51 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 271 KB

english, 1980

54

Optimization of maintained systems : P. K. W. Chan and T. Downs. IEEE Trans. Reliab.R-29 (1) 42 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

55

Ground-hypotheses for beta distribution as Bayesian prior : A. G. Colombo and D. Constantini. IEEE Trans. Reliab.R-29 (1) 17 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

56

Reliability bounds for decomposable multi-component systems : N. Singh and S. Kumar. IEEE Trans. Reliab.R-29 (1) 22 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

57

Log-rank vs x test for exponentiality : Crayton C. Walker, Dennis W. McLeavey and Warren Rogers. IEEE Trans. Reliab.R-29 (1) 45 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

58

On the specification of repair time requirements : Sherrie E. Emoto and Ray E. Schafer. IEEE Trans. Reliab.R-29 (1) 13 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

59

Achieving high reliability in sonar power supplies : Jerome C. Bobrowski. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 55 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

60

A generalized computer program for the estimation of the optimum number of trials for establishing a systems reliability : V. Swaminathan, S. Rajagopalan and C. M. Chacko. QR J, India, 17 (January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 135 KB

english, 1980

61

Difficulties in fault-tree synthesis for process plant : P. K. Andow. IEEE Trans. Reliab.R-29 (1) 2 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 273 KB

english, 1980

62

Cost analyses for avionics acquisition : Edward F. Toohey and Alberto B. Calvo. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 85 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

63

An analysis of MIL-STD-471 test methods : David A. Heiser. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 43 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

64

A study of three environmental reliability tests : John C. Warner. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 226 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

65

No. 4 ESS—Reliability and maintainability experience : P. K. Giloth. Proc. Annual Reliability and Maintainability Symposium, San Francisco. p. 388 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

66

Computer-aided determination of tests for the detection and localisation of faults in electronic circuits and systems : U. Fruhauf and P. Slowig. Nachrichtentechnik Elektronik30 4, 144 (1980). (In German)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

67

Some facts about environmental stress screening : Irving Quart and Dean Edgerton, Jr.Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 220 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

68

Common cause failures—a dilemma in perspective : Anthony M. Smith and Ian A. Watson. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 332 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

69

Reliability problems with the store switching circuit U 253 : D. Grosse and B. Junghans. Nachrichtentechnik Elektronik30 112 (1980). (In German)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

70

Hardware and software: an analytical approach : William L. Bunce. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 209 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 273 KB

english, 1980

71

Software and hardware R & M: What are the differences : Melvin B. Kline. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 179 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

72

L'aide à la maintenance des systèmes: le moniteur MOSTAM: J. Cerf and J. P. Bertrand. Rev. Tech. Thomson-CSF, 12, (1) p. 201 (March 1980). (In French)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

73

The decision to replace a unit early or late in an age replacement problem : T. Nakagawa. Microelectron. Reliab.19, 265 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

74

Digraphs and their applications in fault tree analysis : Y. C. Chopra and K. K. Aggarwal. Microelectron. Reliab.19, 269 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

75

Implementation constraints in self-checking integrated circuits : Y. Crouzet and C. Landrault. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 58

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

76

Failure analysis on a 65 K MOS RAM with a new type of memory display : W. Nasswetter. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 113

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

77

k-out-of-n:G system with simultaneous failure and three repair policies: Kouichi Adachi and Masanori Kodama. Microelectron. Reliab.19, 351 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

78

Common-cause failure analysis of a three-state device system : Balbir S. Dhillon, A. Sambhi and M. R. Khan. Microelectron. Reliab.19, 345 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 268 KB

english, 1980

79

On reliability of a computer network : Inder M. Soi. Microelectron. Reliab.19, 237 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

80

Simulation comparisons of point estimation methods in the 2-parameter Weibull distribution : Shoji Kuchii, Naoto Kaio and Shunji Osaki. Microelectron. Reliab.19, 333 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

81

Some aspects of reliable software packages : Inder M. Soi and Krishna Gopal. Microelectron. Reliab.19, 379 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

82

Repairable systems with one standby unit : E. A. Elsayed and Balbir S. Dhillon. Microelectron. Reliab.19, 243 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

83

The effect of alpha-particle-induced soft errors on memory systems with error correction : D. J. W. Noorlag, L. M. Terman and A. G. Konheim. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn. 178, p. 86

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

84

On a basic equation of reliability theory : F. Beichelt and K. Fischer. Microelectron. Reliab.19, 367 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

85

Path enumeration using flow graphs : Suresh Rai and K. K. Aggarwal. Microelectron. Reliab.19, 391 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

86

Accelerated versus real time aging tests : E. W. Kimball. Proc. Annual Reliability and Maintainability Symposium, San Francisco. p. 51 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

87

Digital system diagnostics-design/evaluation : Gregory A. Conley, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 38. (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

88

Reliability assurance programs to meet regulatory requirements in the electric power and process industries : Robert H. Gauger. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 1 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

89

Observed reliability of FLIR common modules and systems : Edward P. Des Plas. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 61 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 266 KB

english, 1980

90

Data needs for software reliability modelling : Lorraine Duvall, Jon Martens, Dorothy Swearingen and John Donahoo, Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 200 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

91

INTELSAT system reliability : Irwan A. Feigenbaum. Proc. Annual Reliability and Maintainability Symposium, San Francisco, p. 415 (22–24 January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

92

A computational technique for maximum likelihood estimation with Weibull models : Norman P. Archer. IEEE Trans. Reliab.R-29, (1) 57 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

93

The fail-safe feature of the Lapp & Powers fault tree : Mitchell O. Locks. IEEE Trans. Reliab.R-29, (1) 10 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

94

VLSI with a vengeneance : Larry W. Sumney. IEEE Spectrum. 24 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

95

VLSI/LSI circuit functions: their challenges, rewards and problems : Joseph J. DiGiacomo. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 94 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

96

Research and development of IC technology in Japan : T. Sugano. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 139

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

97

Microelectronics—the revolution in consumer equipment : J. C. van Vessem. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 20

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

98

VLSI—directions and impact : B. T. Murphy. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 70

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

99

Soft errors in VLSI: present and future : Timothy C. May. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 377 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

100

Large-scale integration latches onto the phone system : Harvey J. Hindin. Electronics. 113 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

101

Programmable components: the shape of VLSI to come : James L. Fischer. Electronics. 138 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

102

Built-in test for complex digital integrated circuits : B. Konemann, J. Mucha and G. Zwiehoff. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 89

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

103

The promotion of VLSI and microlithography in Germany : H. Beneking. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 94

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

104

Quantitative comparison of electronic component/solder joint stress relief in encapsulated assemblies : Dennis A. Cummings. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2, (4) 454 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

105

Cost effective semiconductor memory testing : R. W. Stevens and J. R. Brailsford. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 82

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 133 KB

english, 1980

106

I. C. layout—the automatic approach : K. J. Loosemore. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 48

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 269 KB

english, 1980

107

A high speed 64 × 4 bit 100K-compatible ECL-RAM with 6 NS access time: H. v. Witsch and H. Ernst. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn.178, 102

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

108

Current aspects of CAD for integrated circuits : J. P. Avenier. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 43

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

109

The MOM 400 single-chip microcomputer : A. B. Guyot, M. Henry and M. E. Vergniault. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 150

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

110

Design aspects and reliability of a synchronizer made in MOS technology : H. J. M. Veendrick. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 8

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

111

Methods, equipment and materials for the wire contacting of semiconductor chips : F. Rudolf, G. Heinke and J. Labs. Nachrichtentechnik Elektronik30, 115 (1980). (In German)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

112

A high speed multiplier using subnanosecond bipolar VLSI technologies : T. Takahashi, S. Wakamatsu and K. Kimura. Fifth Solid Circuits Conference—ESSCIRC 79, IEE Publn.178, 110

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

113

Reliable Multiwire circuits with small gauge wires : EtsujiHybrids Mfg Technol.Chmt-2, (4) 532 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 138 KB

english, 1980

114

A ULA is more than silicon : J. A. Vernon, N. R. Crocker and J. P. Singleton. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 51

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

115

Advances in wafer process control : Klaus Schuegraf. Solid-St. Technol. 87 (February 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

116

Thermal studies of a plastic dual-in-line package : Curtis Mitchell and Howard M. Berg. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 500 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

117

Experimental investigation of mounting thermal resistance of flatpacks on circuit boards : Thomas F. Movius, Ivan R. Jones and James M. Kallis. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 512 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

118

The performance of plastic-encapsulated CMOS microcircuits in a humid environment : Paul W. Peterson. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 422 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

119

Gold/chromium metallizations for electronics devices : Paul H. Holloway. Solid-St. Technol. 109 (February 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

120

Computer aided design of LSI: an I2L case study : C. P. Lincoln and R. J. Crispin. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 64

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

121

A 500-picosecond system design capability : S. Hollock. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 79

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 142 KB

english, 1980

122

Universal logic gates for custom-design I.C. requiremeats : S. L. Hurst, Microelectron. Reliab.19, 457 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

123

IBM multichip multilayer ceramic modules for LSI chips—design for performance and density : Bernard T. Clark and Yates M. Hill. IEEE Trans. Components, Hybrids Mfg Technology. Chmt-3, (1) 89 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

124

Electrothermal effects in integrated circuits : D. J. Hamilton and W. J. Kerwin. Microelectron. J.11, (2) 5 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

125

High density uncommitted arrays using an advanced CMOS technology : W. T. Alexander, S. J. Boardman, P. Krebs and A. T. P. MacArthur. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 76

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

126

A GaAs MESFET sample and hold switch : P. H. Saul. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publ.178, 5

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

127

Fully automated integrated circuit wire bonding system : Masayuki Naruse. Susumu Miyazaki, Tatsuru Yamada, Kouichi Kawata, Yasuo Sakagawa and Ken-ichi Igarashi. NEC Res. Dev. (Jpn), 56, 163 (January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

128

Polysilicon self-aligned technology—A new approach for bipolar LSIs : Kenji Okada, Kunio Aomura, Toshio Nakamura and Hiroshi Shiba. NEC Res. Dev. (Jpn). 56, 170 (January 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 270 KB

english, 1980

129

Advances in GaAs LSI/VLSI processing technology : Bryant M. Welch. Solid-St. Technol. 95 (February 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

130

Chip carrier packaging applications : John A. Bauer. IEEE Trans. on Components, Hybrids Mfg Technol.Chmt-3, (1) 120 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

131

Aluminium alloy as an interconnecting material in the fabrication of integrated circuits : Tapan Kumar Gupta. Microelectron. Reliab.19, 337 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

132

Circuit-board packaging considerations for optimum utilization of chip carriers : Daniel I. Amey and John W. Balde. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 105 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

133

The BCML circuit and packaging system : Herbert Stopper. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 110 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

134

A new air film technique for low contact handling of silicon wafers : J. A. Paivanas and J. K. Hassan. Solid-St. Technol. 148 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

135

Optical end-point detection for the plasma etching of aluminum : B. J. Curtis. Solid-St. Technol. 129 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

136

Loading effect and temperature dependence of etch rate of silicon materials in CF4 plasma : Tatsuya Enomoto. Solid-St. Technol. 117 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

137

Plasma etching for SiO2 profile control : J. A. Bondur and H. A. Clark. Solid-St. Technol. 122 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

138

Multiple-drain MOS packs in very fast logic gates : Kenneth Dreyfack. Electronics 73 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

139

Decoding scheme smooths 18-bit converter's nonlinearity : Samuel Wilensky. Electronics 128 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 134 KB

english, 1980

140

Plasma deposited polycrystalline silicon films : Kalluri R. Sarma. Solid-St. Technol. 143 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 258 KB

english, 1980

141

Simple process propels bipolar PROMs to 16-K density and beyond : Robert K. Wallace and Arthur J. Learn. Electronics. 147 (27 March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

142

Integrated circuit characteristics at 260°C for aircraft engine-control applications : Leslie J. Palkuti, John L. Prince and Andrew S. Glista, Jr.IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 405 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

143

C-MOS multiplier speeds task for microprocessors : Kevin Smith. Electronics 7E (24 April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

144

16-bit microprocessor enters virtual memory domain : Yohav Lavi, Asher Kaminker, Ayram Menachem and Subhash Bal. Electronics. 123 (24 April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

145

The steady-state distribution of signal charge in charge-coupled devices : Stefan Opalski and Marek Syrzycki. Electron Technol.12, (2) 3 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

146

A review of microprocessor software : A. R. Rundle. Microelectron. Reliab.19, 541 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

147

A new ultra low power ULA and its application : P. Forshaw. Microelectron. Reliab.19, 463 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

148

An integrated circuit v.h.f. radio receiver : I. A. W. Vance. Radio Electron. Eng.50, (4) 158 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

149

Chips make fast math a snap for microprocessors : Krishna Rallapalli and Joe Kroeger. Electronics. 153 (24 April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

150

Intelligent memories and the silicon chip : I. Aleksander. Electron. Power. 324 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

151

Advances in c.c.d. scanners with on-chip signal processing for electronic imaging : Savvas G. Chamberlain. Radio Electron. Engr.50, (5) 249 (May 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 126 KB

english, 1980

152

Custom ECL chips boost performance in smaller mainframes : Anthony Durniak. Electronics. 39 (24 April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

153

Technical and practical considerations of incorporating microprocessors in OEM products—a management view : S. Sambell. Microelectron. Reliab.19, 523 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

154

Control chip handles error checking and character-hased protocols easily : Alan J. Weissberger, John Yarborough, Suresh Vasa and Yesh Mehta. Electronics. 151 (27 March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

155

Analogue sampling ICs in data acquisition systems : Derek F. Bowers. Microelectron. Reliab.19, 497 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

156

Minicomputer fills mainframe's shows : Carl J. Alsing, Kenneth D. Holberger, Charles J. Holland, Edward J. Rasala and Steven J. Wallach. Electronics. 130 (22 May 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

157

Mainframe builders making more ICs : Larry Marion. Electronics. 106 (22 May 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

158

Two-chip radio link pilots toys and models : Martin Giles, Kerry Lacanette, Dennis Monticelli and Ron Page. Electronics. 145 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

159

Distributed computer network takes charge in IC faeility : David P. Clemens and Gary L. Castleman. Electronics. 151 (5 June 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

160

An investigation of the valley splitting in n-channel silicon (100) inversion layers: R. J. Nicholas, K. von Klitzing and Th. Englert. Solid St. Commun.34, 51 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

161

Aluminum-silicon OHMIC contact on “shallow” n + /p junctions: M. Finetti, P. Ostoja, S. Solmi and G. Soncini. Solid-St. Electron.23, 255 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

162

On the mobility of polycrystalline semiconductors : J. Martinez and J. Piqueras. Solid-St. Electron.23, 297 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

163

Observation of valley splitting in (111) n-type silicon inversion layers: Th. Englert, D. C. Tsui and G. Landwehr. Solid St. Commun.33, 1167 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 128 KB

english, 1980

164

An investigation of the interface state density in metal-silieon nitride-silicon structures : J. P. Bigorgne, M. Favre, G. Salace and J. Despujols. Solid-St. Electron.23, 243 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 274 KB

english, 1980

165

Avalanche injection in MNOS gate controlled diodes : Phillip Rutter. Solid St. Electron.23, 441 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

166

An influence of the rate of epitaxial growth on physical properties of gallium nitride : Danuta Dobosz and Jerzy Petryk. Electron Technol.12, (2) 103 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

167

The effects of phosphorus diffusion cooling rate on I2L gain : Bernard L. Morris. Solid St. Electron. 23, 457 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

168

Preoxidation gettering of oxidation-induced stacking faults in silicon by the phosphorus diffusion process : Jhy-Horng Chen and Mao-Chieh Chen. Int. J. Electron.47, (6) 555 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

169

Characterization of surface states in HCL-grown oxides using MOS transient currents : Paul D. Esqueda and Mukunda B. Das. Solid-St. Electron.23, 365 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

170

Charge injection from a surface depletion region—the Al2O3-silicon system : J. Kolk and E. L. Heasell. Solid-St. Electron.23, 223 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

171

Paraconductivity of Ge-covered tin films : R. S. Parashar and P. N. Dheer. Solid St. Commun.34, 113 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

172

Properties of plasma enhanced CVD silicon nitride: measurements and interpretations : Kenneth M. Mar and Gay M. Samuelson. Solid St. Technol. 137 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

173

Semi-empirical APW calculation of the band structure of silicon : D. A. Papaconstantopoulos and B. M. Klein. Solid St. Commun.34, 511 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

174

TCR control of Ni/Cr resistors : Ronald A. Thiel and Edward H. Maurer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 467 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

175

Fabrication of passive components for high-temperature instrumentation : Leonard S. Raymond, Louis N. Nelson, Douglas J. Hamilton and William J. Kerwin. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 395 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

176

Development of the thick-film capacitor and its application for hybrid circuit modules : Katsuo Abe, Akira Ikegami, Nobuyuki Sugishita, Noriyuki Taguchi, Tokio Isogal, Ichiro Tsubokawa and Hiroshi Ohtsu. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 434 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

177

Performance of the porcelain-metal substrate at microwaves : Alfred Schwarzmann. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 451 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

178

Thick-film fine pattern formation by a photolithographic process : Yutaka Watanabe, Atsushi Aritomo and Katsuhiko Watanabe. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 428 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

179

The role of hybrids in LSI systems : Charles T. Goddard. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 367 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 139 KB

english, 1980

180

Interdiffusion processes and oxidation phenomena in NiCr/Au films : A. Scatamacchia and G. Ottaviani. Solid St. Technol. 116 (February 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 285 KB

english, 1980

181

Alloyed thick-film gold conductor for high reliability high-yield wire bonding : Samuel J. Horowitz, John J. Felten and Donald J. Gerry. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 460 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

182

Influence of the substrate on the electrical properties of thick-film resistors : Aldo Cattaneo, Luisa Pirozzi, Bruno Morten and Maria Prudenziati. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 181 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

183

Extension of high-temperature electronics : Bruce L. Draper and David W. Palmer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 399 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

184

Large scale digital hybrid microcircuits for new military systems : Dennis R. Kling and Robert W. Ilgenfritz. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-2, (4) 372 (December 1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 149 KB

english, 1980

185

Molecular beam epitaxy : Morton G. Panish and Alfred Y. Cho. IEEE Spectrum. 18 (April 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

186

Piezoresistance tensor coefficients of phosphorus implanted silicon thin films : Janusz Rybinski. Electron Technol.12, (2) 59 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

187

Photoexcitation effects during laser trimming of thin-film resistors on silicon : Ami Kestenbaum and Thomas F. Baer. IEEE Trans. Components, Hybrids Mfg Technol.Chmt-3, (1) 166 (March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

188

Ionization assisted annealing of boron implanted silicon : Henryk Rzewuski, Jan Suski and Janusz Krynicki. Electron Technol.12, (2) 67 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

189

Ion beams promise practical systems for submicrometer wafer lithography : Robert L. Seliger and Paul A. Sullivan. Electronics. 142 (27 March 1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

190

A study of PtSi formation : Danuta Brzezinska and Michel Zaborowski. Electron Technol.12, (2) 93 (1979)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980

191

Thin layer high-voltage devices (resurf devices) : J. A. Appels, M. G. Collet, P. A. H. Hart, H. M. J. Vaes and J. F. C. M. Verhoeven. Philips J. Res.35, (1) 1 (1980)

Journal:

Microelectronics Reliability

Year:

1980

Language:

english

File:

PDF, 99 KB

english, 1980