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Volume 22; Issue 2
Main
Microelectronics Reliability
Volume 22; Issue 2
Microelectronics Reliability
Volume 22; Issue 2
1
Editorial
Clifford M Ryerson
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 42 KB
Your tags:
english, 1982
2
A Kolmogorov - Smirnov goodness-of-fit test for the two-parameter weibull distribution when the parameters are estimated from the data
F.G Parsons
,
P.H Wirsching
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 240 KB
Your tags:
english, 1982
3
Improved cost effectiveness for new satellite systems
François F Behmann
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 373 KB
Your tags:
english, 1982
4
The common thread for operational reliability and failure physics
Kam L Wong
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 508 KB
Your tags:
english, 1982
5
Punch-through gate protection of M.O.S. devices
C.A Miller
,
S.J Poole
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 237 KB
Your tags:
english, 1982
6
Test device structures for integrated circuit design, process technology development and evaluation
A Srivastava
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 458 KB
Your tags:
english, 1982
7
Quality improvement program addressed to M.O.S. microprocessors
Charles L Hutchins
,
B.J Paicius
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 440 KB
Your tags:
english, 1982
8
The first passage time distribution of brownian motion and its applications
Y.S Sherif
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 411 KB
Your tags:
english, 1982
9
The application of marginal voltage measurements to detect and locate defects in digital microcircuits
D.J Ager
,
G.F Cornwell
,
I.W Stanley
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 7.81 MB
Your tags:
english, 1982
10
Systems safety: A survey
Balbir S Dhillon
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 390 KB
Your tags:
english, 1982
11
Some stress-strength reliability models
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 164 KB
Your tags:
english, 1982
12
Estimation of total errors in software
M Islam
,
F Lombardi
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 177 KB
Your tags:
english, 1982
13
Preventive maintenance of a 1-unit system with two types of repair
Masasi Kowada
,
Athushi Bando
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 212 KB
Your tags:
english, 1982
14
Availability modelling of ring microcomputer systems
F Lombardi
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 416 KB
Your tags:
english, 1982
15
Reliability evaluation of some fault-tolerant computer architectures: by Shunji Osaki and Toshihiko Nishio Publishers : Springer-Verlag Berlin Heidelberg New York Springer-Verlag GmbH & Co. KB Heidelberger Platz 3, Postfach D-1000 Berlin 33, Germany. 1980. 129 pages. Soft Cover DM 18. - approx. US $ 10. 70. (ISBN 3-540-10274-4)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 52 KB
Your tags:
english, 1982
16
Stochastic and deterministic averaging processors: P. Mars and W.J. Poppelbaum Publishers : Peter Peregrinus Limited, Publishing Division, P.O. Box 8, Southgate House, Stevenage, Herts, SG1 1HQ, England. Price : U.K. £18.00 $ 52.50 (ISBN: 0 906048 44 3)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 46 KB
Your tags:
english, 1982
17
Practical reliability engineering: Patrick D.T. O'Connor Publishers : Heyden & Son Ltd., Spectrum House, Hillview Gardens, London, NW4 2JQ, England. Price : U.K. £12.00 $ 29.00 (ISBN 0 85501 496 2)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1982
18
An introduction to mini and micro computers: Fabian Monds and Robert McLaughlin Publishers : Peter Peregrinus Limited, Publishing Division, P.O. Box 8, Southgate House, Stevenage, Herts, SG1 1HQ, England. Price : U.K. £9.00 $ 27.50 (ISBN: 0 906048 48 6)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 114 KB
Your tags:
english, 1982
19
An introduction to thick film component technology: Keith E.G. Pitt Publishers : Mackintosh Publications Limited, Mackintosh House, Napier Road, Luton, Lu1 IRG, England. Price : U.K. £10.50 (ISBN 0 904705 37 4)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 110 KB
Your tags:
english, 1982
20
Engineering reliability: New techniques and applications: B. S. Dhillon and C. Singh Publishers: John Wiley & Sons, Inc., 605, Third Avenue, New York, N.Y. 10158, United States of America. (ISBN 0 471 05014-8)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 67 KB
Your tags:
english, 1982
21
Handbook of printed circuit design, manufacture, components and assembly: G. Leonida Publishers : Electrochemical Publications Limited, 29, Barns Street, AYR, Scotland, KA7 1XB. Price : £ 42.00 (plus £1. 60 postage and packaging) (ISBN 0 901150 09 6)
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 66 KB
Your tags:
english, 1982
22
Modeling systems with high early failure occurrence patterns
Y.S Sherif
,
N.A Kheir
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 114 KB
Your tags:
english, 1982
23
Sequential evaluation of terminal pair reliability in a reliability network
Santosh Kumar
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 380 KB
Your tags:
english, 1982
24
On a model for software reliability performance
Kjell Strandberg
,
Hans Andersson
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 541 KB
Your tags:
english, 1982
25
Step-repeat pattern generation technique
Awatar Singh
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 68 KB
Your tags:
english, 1982
26
Reliability and maintainability of electronic systems: Edited by : J. E. Arsenault & J. A. Roberts Publishers : Computer Science Press, Inc., 11, Taft Court Rockville, Maryland 20850, USA, (1980) 584 pages. $ 28. 95, plus $ 1. 25 postage and handling
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1982
Language:
english
File:
PDF, 58 KB
Your tags:
english, 1982
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