Volume 24; Issue 5

Microelectronics Reliability

Volume 24; Issue 5

1

Calendar of International Conferences, Symposia, Lectures and Meetings of Interest

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 143 KB

english, 1984

2

On the fabrication of thin film MICs from substrate cleaning to pattern delineation

R.K. Nahar, N.M. Devashrayee

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 398 KB

english, 1984

3

Equivalent matrix parameter functions for two-port sub-networks of non-uniform thin-film Y-Z-KY structure

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 281 KB

english, 1984

4

Matrix parameters of non-uniform distributed parameter thin film C-R-KC micro-systems of circular geometry

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 209 KB

english, 1984

5

Cost analysis of a two-unit standby system with two types of repairmen

Vibha Goyal, K. Murari

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 409 KB

english, 1984

6

Stochastic behaviour of a maintained system with protection system

Ashok Kumar, Vipin B. Kapoor, A.K. Rastogi

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 246 KB

english, 1984

7

Computer-aided design of an eight bit binary counter N-MOS chip for large scale integration (LSI)

Ashok Srivastava, S.N. Gupta, Chandra Shekhar

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 736 KB

english, 1984

8

Reliability analysis of two special three-state devices

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 94 KB

english, 1984

9

Nework topology for maximizing the terminal reliability in a Computer Communication Network

Y.C. Chopra, B.S. Sohi, R.K. Tiwari, K.K. Aggarwal

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 202 KB

english, 1984

10

Software reliability analysis based on a nonhomogeneous error detection rate model

Shigeru Yamada, Hiroyuki Narihisa, Hiroshi Ohtera

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 351 KB

english, 1984

11

Stochastic models for evaluating probability of system failure due to human error

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 230 KB

english, 1984

12

Incoming inspection and delivery quality of integrated circuits

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 644 KB

english, 1984

13

Simplified algorithm for optimum availability allocation and redundancy optimization subject to cost constraint

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 257 KB

english, 1984

14

Power GaAs MESFET: Reliability aspects and failure mechanisms

C. Canali, F. Castaldo, F. Fantini, D. Ogliari, M. Vanzi, M. Zicolillo, E. Zanoni

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 1.45 MB

english, 1984

15

Reliability evaluation of protective system with scheduled and unscheduled maintenance

Takehisa Kohda, Kohji Akinari, Hiromitsu Kumamoto, Koichi Inoue

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 282 KB

english, 1984

16

Sputter etched molybdenum-oxidation technique for fine patterns

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 70 KB

english, 1984

17

Thick film polyester screen on glass as photomask

Awatar Singh, M. Prudenziati

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 446 KB

english, 1984

18

Guidelines for establishing an effective ESD program : Donald L. Denton. Solid St. Technol. 127 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 101 KB

english, 1984

19

Contracting for liability relief : Richard M. Jacobs, PE. and Lawrence A. Hoffman. Proc. a. Reliab. Maintainab. Symp. 67 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 101 KB

english, 1984

20

Reliability of optoelectronic semiconductor components : T. I. Bajenescu. Feinwerktechnik Messtechnik92, (1) 20 (1984) (in German)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 101 KB

english, 1984

21

Factors affecting fiber optics reliability : Claude F. Veraa. Proc. a. Reliab. Maintainab. Symp. 236 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 101 KB

english, 1984

22

Pulse propagation properties of multilayer ceramic multichip modules for VLSI circuits : Panangattur N. Venkatachalam. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 480 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 233 KB

english, 1984

23

Influence of the chip temperature on the moisture-induced failure rate of plastic-encapsulated devices : Dieter Stroehle. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 537 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

24

A program for reliable high power μW transistors (the AN/SPS-40 solid-state transmitter) : Michael H. Diamant. Proc. a. Reliab. Maintainab. Symp. 262 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

25

IC failure rate estimates from field data : Darwin F. Simonaitis. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 568 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

26

Failure analysis in semiconductor devices—rationale, methodology and practice : B. P. Richards and P. K. Footner. Microelectron. J.15 (1), 5 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

27

Nondestructive screening for low voltage failure in multilayer ceramic capacitors : Robert C. Chittick, Edmund Gray, John H. Alexander, Miles P. Drake and Eric L. Bush. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 510 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

28

Event tree modeling on a small computer : James M. Koren, George B. Rothbart and Blake F. Putney. Proc. a. Reliab. Maintainab. Symp. 330 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

29

Maintenance processors for mainframe computers : Tze-Shiu Liu. IEEE Spectrum, 36 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

30

Nonparametric tests for testing the homogeneity of k(>2) exponential, Gamma and Weibull populations using censored data: A. R. Padmanabhan and N. Singh. Microelectron. Reliab.23 (5), 953 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

31

Analysis of series deviance in a parallel state transition diagram and applications to fault tolerant computing : Fabrizio Lombardi and Steve Ratheal. Microelectron. Reliab.23 (5), 963 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

32

Managing test-procedures to achieve reliable software : Peter Kubat and Harvey S. Koch. IEEE Trans. Reliab.R-32 (3), 299 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 256 KB

english, 1984

33

Fuzzy-network planning—FNET : Igor Gazdík. IEEE Trans. Reliab.R-32 (3), 304 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

34

Interval reliability for initiating and enabling events : Colin Dunglinson and Howard Lambert. IEEE Trans. Reliab.R-32 (2), 150 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

35

Fault tree synthesis from a directed graph model for a power distribution network : Daniel L. Cummings, Steven A. Lapp and Gary J. Powers. IEEE Trans. Reliab.R-32 (2), 140 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

36

A variance expression for a security-of-supply model : Ole Platz. IEEE Trans. Reliab.R-32 (2), 191 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

37

The effect of preventive maintenance on a system with imperfect switchover : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (5), 821 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

38

Slection of Weibull shape parameter, based on adaptive estimation : M. Pandey and S. K. Upadhyay. IEEE Trans. Reliab.R-32 (2), 205 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

39

The effect of preventive maintenance on a two-dissimilar unit standby system : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (3), 485 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

40

Shrunken estimators of Weibull shape parameter in censored samples : M. Pandey. IEEE Trans. Reliab.R-32 (2), 200 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

41

Prediction intervals using exceedances for an additional thirdstage sample : D. B. Owen and Youn-Min Chou. IEEE Trans. Reliab.R-32 (3), 314 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 261 KB

english, 1984

42

Computer aided quality management in electronics and production—a challenge for the entire enterprise : B. P. Davis. Feinwerktechnik Messtechnik91 (8), 365 (1983) (in German)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

43

On the determination of all tie sets and minimal cut sets between any two nodes of a graph through Petri nets : G. S. Hura. Microelectron. Reliab.23 (3), 471 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

44

A new technique to optimize system reliability : Ryoichi Sasaki, Tateo Okada and Sadanori Shingai. IEEE Trans. Reliab.R-32 (2), 175 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

45

Credible and HPD intervals of the parameter and reliability of Rayleigh distribution : S. K. Sinha and H. A. Howlader. IEEE Trans. Reliab.R-32 (2), 217 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

46

Folded equations for a Weibull maximum likelihood ratio test : J. Edward Bilikam and Raykun R. Chang. IEEE Trans. Reliab.R-32 (2), 197 (June 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

47

Steiner trees in probabilistic networks : Joseph A. Wald and Charles J. Colbourn. Microelectron. Reliab.23 (5), 837 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

48

Quality control techniques for “Zero Defects” : Thomas W. Calvin. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (3), 323 (September 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 261 KB

english, 1984

49

Availability measures for an intermittently used repairable system : P. K. Kapur, T. V. Natarajan and Debashish Chakrabarty. Microelectron. Reliab.23 (5), 841 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

50

Reliability programs for commercial communication satellites : Francis Edward Erdle, Irwin Arthur Feigenbaum and John Wallace Talcott, Jr., IEEE Trans. Reliab.R-32 (3), 236 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

51

Probabilistic delay evaluation in combinational digital circuits by Petri Nets : Francesco Corsi and B. Castagnolo. Microelectron. Reliab.23 (3), 541 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

52

Busy-period analysis of a two-unit warm standby system with inspection time : R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.23 (2), 341 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

53

A reliability physics model for parallel system : M. N. Gopalan and P. Venkateswarlu. Microelectron. Reliab.23 (2), 367 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

54

Cost limit replacement policy under minimal repair : Kyung S. ParkMicroelectron. Reliab.23 (2), 347 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

55

Stochastic behaviour of a two-unit cold standby system with three modes and allowed down time : S. M. Gupta, N. K. Jaiswal and L. R. Goel. Microelectron. Reliab.23 (2), 333 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 152 KB

english, 1984

56

Analysis of a two-unit repairable system with random inspection subject to two types of failure : R. Subramanyam Naidu and M. N. Gopalan, Microelectron. Reliab.23 (3), 449 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 260 KB

english, 1984

57

Floating redundancy in digital systems : P. G. Anderson and Z. G. Vranesic. Microelectron. Reliab.23 (3), 519 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

58

BIT detectability/reliability in expendable weapons : R. Owen Holbrook. Proc. a. Reliab. Maintainab. Symp. 306 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

59

Determining operating and support costs with USAF D056 maintenance data collection system : Ronald S. Morris and Bruce E. Bartels. Proc. a. Reliab. Maintainab. Symp. 197 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

60

Reliability and maintainability acquisition handbook : Herbert Dagen and Stanley Grubman. Proc. a. Reliab. Maintainab. Symp. 78 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

61

VLSI packaging reliability : Eugene C. Blackburn. Solid St. Technol. 113 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

62

Reliability prediction: improving the crystal ball : Norman Harris and Patrick D. T. O'Connor. Proc. a. Reliab. Maintainab. Symp. 108 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

63

Contractor experience using RADC ORACLE : Charles W. Plotkin. Proc. a. Reliab. Maintainab. Symp. 222 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

64

A Bayes procedure combining black box estimates and laboratory tests : Gary G. Brush, John D. Healy and Burton, S. Liebesman. Proc. a. Reliab. Maintainab. Symp. 242 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

65

On criterion of comparison of reliabilities : Julius Goodman. Proc. a. Reliab. Maintainab. Symp. 231 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

66

Classifying combined hardware/software R models : Jorge L. Romeu and Kieron A. Dey. Proc. a. Reliab. Maintainab. Symp. 282 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

67

Optimization of spares in a maintenance scenario : Robert J. Coughlin. Proc. a. Reliab. Maintainab. Symp. 371 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

68

Storage reliability with periodic test : Eugene C. Martinez. Proc. a. Reliab. Maintainab. Symp. 181 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

69

Low energy electron microscopy utilized in dynamic circuit analysis and failure detection on LSI-VLSI internal circuits : Louis Kotorman. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 527 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

70

A management guide to reliability predictions : Frank A. Stovall. Proc. a. Reliab. Maintainab. Symp. 114 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

71

Generalized acceleration factor in reliability : Der-Yang Guan. Proc. a. Reliab. Maintainab. Symp. 54 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

72

Failure to safety in process-control systems : Donald Smith. Electronics Power, 227 (March 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

73

Common errors in application of MIL-STD-781 : Terrance W. Elliott. Proc. a. Reliab. Maintainab. Symp. 139 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

74

DoD/industry—R & M case study analysis : Paul F. Goree and Thomas A. Musson. Proc. a. Reliab. Maintainab. Symp. 91 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

75

The operational readiness: the reliability and maintainability connection : Martin M. Meth and Kurt Greene. Proc. a. Reliab. Maintainab. Symp. 83 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

76

Predicted vs test MTBF's… why the disparity? : Jeffrey B. Lynch and Lawrence J. Phaller. Proc. a. Reliab. Maintainab. Symp. 117 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

77

A maintenance philosophy for mainframe computers : Harold L. Platzer. Proc. a. Reliab. Maintainab. Symp. 359 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

78

R/M design for long term dormant storage : George Kasouf and David A. McGoye. Proc. a. Reliab. Maintainab. Symp. 168 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 268 KB

english, 1984

79

Establishing realistic requirements for reliability, maintainability, and built-in-test : R. C. Trakas. Proc. a. Reliab. Maintainab. Symp. 103 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

80

Field data: the final measure : Harold S. Balaban and Richard A. Kowalski. Proc. a. Reliab. Maintainab. Symp. 123 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

81

Cost savings by establishing life limits : William Ireland. Proc. a. Reliab. Maintainab. Symp. 72 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

82

Reliability-growth programmes for undersea communication systems : Robert H. Murphy. IEEE Trans. Reliab.R-32 (3), 240 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

83

Quality circles—an experience in Jyoti Limited : A. V. Dandekar. QR J. (India). 107 (September 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

84

Reliability investment and life-cycle cost : James K. Seger. IEEE Trans. Reliab.R-32 (3), 259 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 135 KB

english, 1984

85

Management of logistic support costs in the equipment acquisition phase : Dwight E. Collins. IEEE Trans. Reliab.R-32 (3), 264 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 271 KB

english, 1984

86

Procedures and tables for construction and selection of multiple deferred state (MDS-1) (c1, c2)) plans: V. Soundararajan and Raju. QR J. (India), 101 (September 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

87

Environmental stress screening—lessons learned : Ronald J. Decristoforo. Proc. a. Reliab. Maintainab. Symp. 129 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

88

Optimum warranty policies for nonreparable items : Marlin U. Thomas. IEEE Trans. Reliab.R-32 (3), 282 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

89

CAD's interface between design and mask-making : Semiconductor Int. 128 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

90

Planning of production reliability stress-screening programs : E. Fiorentino and A. E. Saari. IEEE Trans. Reliab.R-32 (3), 247 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 259 KB

english, 1984

91

VLSI test systems: facing the challenge of tomorrow : Peter H. Singer. Semiconductor Int. 82 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

92

Trends in LSI/VLSI testing : Jon Turino and Ray Chapman. Semiconductor Int. 70 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

93

Review: dry etching of silicon oxide : Alfred J. van Roosmalen. Vacuum34 (3–4), 429 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

94

Interconnecting and packaging VLSI chips : A. H. Mones and R. K. Spielberger. Solid St. Technol. 119 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

95

Alcohol modified RTV silicone encapsulation for integrated circuit device packaging : Ching-Ping Wong and Deni M. Rose. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 485 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

96

Hot spots caused by voids and cracks in the chip mount-down medium in power semiconductor packaging : A. J. Yerman, James F. Burgess, Richard O. Carlson and Constantine A. Neugebauer. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 473 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 243 KB

english, 1984

97

Structured copper: a pliable high conductance material for bonding to silicon power devices : Homer H. Glascock, II and Harold F. Webster. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 460 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

98

The quality of die-attachment and its relationship to stresses and vertical die-cracking : C. G. M. van Kessel, Stephen A. Gee and James J. Murphy. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 414 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

99

Parasitic MOSFETs in an oxide-isolated bipolar technology: process-control measurements : E. H. Stevens. Microelectron. J.15 (1), 50 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

100

Solder side up—the move to surface mounting : Roger Dettmer. Electronics Power, 117 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

101

Flexible circuits offer a simple solution to chip-carrier mounting : Peter Kirby. Electronics 149 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

102

Influence of DC bias sputtering during aluminum metallization : James F. Smith. Solid St. Technol. 135 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

103

Development of adhesive die attach technology in cerdip packages; material issues : F. K. Moghadam. Solid St. Technol. 149 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

104

CAD in electronics construction effects on the designing engineer and on the construction result : R. W. Mayer. Feinwerktechnik Messtechnik92 (2), 71 (1984) (in German)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

105

Injection-coupled logic leads bipolar RAMs to VLSI : S. K. Wiedmann, K. Heuber, F. Wernicke, W. Klein, R. Brosch, E. Klink and H. Heimeier. Electronics 139 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

106

Processing linear devices for performance and reliability : Brian E. Hollins. Semiconductor Int. 76 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

107

Monitored burn-in of MOS 64K dynamic RAMs : Jim Eachus, Jon Klema and Scott Walker. Semiconductor Int. 104 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

108

A gaseous detector device for an environmental SEM : G. D. Danilatos. Micron Microscopica Acta.14 (4), 307 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

109

Carrier mobility in inversion layers and rf plasma induced radiation defects at the Si-SiO2 interface : J. Kassabov, E. Atanassova and E. Goranova. Solid-St. Electron.27(1), 13 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

110

On speeding-up of iteration convergence in semiconductor problems : B. S. Polsky. Solid-St. Electron.27 (2), 191 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

111

Theory of the surface depletion region for semiconductors with linearly graded impurity profiles : S. W. Tarasewicz and C. A. T. Salama. Solid-St. Electron.27 (1), 33 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

112

Diffusion length and surface recombination velocity measurements with the scanning electron microscope: the highly-doped emitter of a p-n junction: D. E. Burk and R. Sundaresan. Solid-St. Electron.27 (1), 59 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

113

Computer analysis on the collection of alpha-generated charge for reflecting and absorbing surface conditions around the collector : K. Terrill, C. Hu and A. Neureuther. Solid-St. Electron.27 (1), 45 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

114

Spatially resolved optical spectroscopy of plasma etching systems : D. Field, A. J. Hydes and D. F. Klemperer. Vacuum34 (3–4), 347 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 126 KB

english, 1984

115

Measurement of the tunneling and hopping parameters in RuO2 thick films : N. C. Halder and R. J. Snyder. Electrocomponent Sci. Technol.11, 123 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 126 KB

english, 1984

116

The influence of fast infrared firing on thick film materials : Kenneth R. Bube and Clark Fisher. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 436 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 126 KB

english, 1984

117

Evaporation characteristics of electron beam gun heated sources : Paul C. Baynes and T. Nagarajan. Electrocomponent Sci. Technol.11, 175 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 126 KB

english, 1984

118

Mid-film interconnects for multilayer microcircuit packages : R. Sue and H. M. Naguib. Electrocomponent Sci. Technol.11, 97 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 252 KB

english, 1984

119

Adhesive techniques in microelectronics : M. Hof. Feinwerktechnik Messtechnik92 (2), 67 (1984) (in German)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

120

Fabrication of Schottky-barrier diodes using a thick film technique : R. Sarin and Y. R. Pradeep. Electrocomponent Sci. Technol.11, 173 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

121

Ta-SiC thin film resistors for highly reliable thermal printing heads : Keiji Nunomura, Nobuyoshi Koyama and Tetsujin Matsubara. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 377 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

122

For hybrids: a way to higher chip yields : William K. Garrett. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 421 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

123

Development of nondestructive pull test requirements for gold wires on multilayer thick-film hybrid microcircuits : Roy J. Blazek. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 503 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

124

A comparison of SIMS with other techniques based on ion-beam solid interactions : H. W. Werner and P. R. Boudewijn. Vacuum34 (1–2), 83 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

125

The ion optics of low-energy ion beams : I. W. Drummond. Vacuum34 (1–2), 51 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 261 KB

english, 1984

126

The effects of plasma and ion beam processing on the propertives of n-GaAs Schottky diodes: P. J. Smith and D. A. Allan. Vaccum34 1–2, 209 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

127

Beam-induced broadening effects in sputter depth profiling : Klaus Wittmaack. Vacuum34 (1–2), 119 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

128

Nanometre structures in semiconductors formed by low energy ion implantation : J. M. Shannon and J. B. Clegg. Vacuum34 (1–2), 193 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

129

Shallow ion implantation in gallium arsenide : J. D. Grange, D. C. Bartle, B. R. Brown, C. Dineen, K. S. Knight, J. D. Medland, D. K. Wickenden and M. G. Dowsett. Vacuum34 (1–2), 199 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

130

Plasma enhanced deposition of “silicon nitride” for use as an encapsulant for silicon ion-implanted gallium arsenide : D. C. Bartle, D. C. Andrews, J. D. Grange, P. G. Harris, A. D. Trigg and D. K. Wickenden. Vacuum34 (1–2), 315 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

131

Some mechanisms of sputtered negative ion production : M. C. Underwood. Vacuum34, 1–2, 153 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

132

Ion beam etching GaAs for integrated optical applications : A. P. Webb and C. D. W. WilkinsonVacuum34 (1–2), 159 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

133

Recoil profiles produced by ion implantation through dielectric layers : R. T. Blunt, R. Sweda and I. R. Sanders. Vacuum34 (1–2), 281 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

134

CORDIS—an improved high-current ion source for gases : R. Keller, F. Nöhmayer, P. Spadtke and M-H. Schönenberg. Vacuum34 (1–2), 31 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

135

Process and film characterization of PECVD borophos-phosilicate films for VLSI applications : Jerry E. Tong, Kurt Schertenleib and Ronald A. Carpio. Solid St. Technol. 161 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

136

Capabilities of molecular beam epitaxy and materials prospects : W. Bardsley. Vacuum34 (3–4), 391 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 67 KB

english, 1984

137

Argon and reactive ion beam etching for SAW devices : R. E. Chapman. Vacuum34 (3–4), 417 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 67 KB

english, 1984

138

Publication, Notice, Call for Papers, etc.

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 40 KB

english, 1984

139

Failure modes and effects analysis (FMEA/FMECA)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 52 KB

english, 1984

140

Optimal policies in a two-unit standby system with two types of repairmen

Vibha Goyal, K. Murari

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 420 KB

english, 1984

141

State space representation of Petri nets

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 227 KB

english, 1984

142

Analysis of a two unit standby system with partial failure and two types of repairs

L.R. Goel, Ashok Kumar, A.K. Rastogi

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 223 KB

english, 1984

143

Analysis of a k-out-of-n unit system with two types of failure and preventive maintenance

L.R. Goel, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 228 KB

english, 1984

144

Stochastic analysis of a two-unit parallel system with partial and catastrophic failures and preventive maintenance

L.R. Goel, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 185 KB

english, 1984

145

A fast algorithm to formulate Markov system equations

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 92 KB

english, 1984

146

Algebraical algorithm for computing complex systems reliability

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 146 KB

english, 1984

147

Design of a comprehensive process evaluation vehicle for development of small geometry CMOS process

A. Bandyopadhyay, P.A. Govindacharyulu, M.J. Zarabi

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 446 KB

english, 1984

148

Analysis of systems subject to inspection and repair: A state-of-the-art survey

R. Subramanyam Naidu, M.N. Gopalan

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 690 KB

english, 1984

149

Optimal inspection when the system is repaired upon detection of failure

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 188 KB

english, 1984

150

Some applications of semi-regenerative processes to two-unit warm standby system

Kouya Uematsu, Toshio Nishida, Masashi Kowada

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 459 KB

english, 1984

151

New Information Technology: Author: Alan Burns Publishers: Ellis Horwood Limited, Market Cross House, Cooper Street, Chichester, West Sussex, PO19 1EB, England. Price: £ 8.95. (ISBN 0 85312 674 7)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 439 KB

english, 1984

152

Choosing a practical MTTF model for ECC memory chip : D. Y. Koo and H. B. Chenoweth. Proc. a. Reliab. Maintainab. Symp. 255 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

153

Low firing temperature multilayer glass—ceramic substrate : Yuzo Shimada, Kazuaki Utsumi, M. Suzuki, Hideo Takamizawa, Mitsuru Nitta and Toshihiko Watari. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 382 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

154

Cumulative sum control charts for the mean of an exponential distribution using extremes : H. R. Singh and Gauri Shankar. QR J. (India) 97 (September 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

155

Stochastic behaviour of a standby redundant system with three modes : S. M. Gupta, N. K. Jaiswal and L. R. Goel. Microelectron. Reliab.23 (2), 329 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

156

Analysis of 1-out-of-n: G adjustable operating system: P Sarmah and A. D. DharmadhikariMicroelectron. Reliab.23 (3), 477 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

157

Modified periodic preventive maintenance policies : Toshio Nakagawa, Kenjiro Nishi and Yoshiya Sawa. Microelectron. Reliab.23 (5), 945 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

158

Reliability and availability analysis of systems operating in multiple environments : B. S. Dhillon and J. Natesan. Micro-electron. Reliab. 23 (5), 883 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

159

System comparisons can simplify selection of parametric tester : Michael Levis. Electronics 127 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

160

Worst case reliability bounds : Suresh Govindachar. Microelectron Reliab.23 (5), 855 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

161

Parallel/series dependency and equivalence in generalized Markov's chains : Fabrizio Lombardi. Microelectron. Reliab.23 (3), 501 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

162

Shifting shape-parameter in life tests: a Bayes analysis : G. S. Lingappaiah. IEEE Trans. Reliab.R-32 (3), 317 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 129 KB

english, 1984

163

On profit evaluation in a modular system with two types of failures : M. C. Gupta and Ashok Kumar. Microelectron. Reliab.23 (5), 823 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

164

Software reliability models: a review : J. G. Shanthikumar. Microelectron. Reliab.23 (5), 903 (1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

165

Software configuration management and its contribution to reliability program management : Ray Foulkes and Michael P. Mills. IEEE Trans. Reliab.R-32 (3), 289 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 130 KB

english, 1984

166

Spacecraft anomalies and lifetimes : Charles E. Bloomquist. Proc. a. Reliab. Maintainab. Symp. 186 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

167

Power-system reliability in perspective : R. Billinton and R. N. Allan. Electronics Power 231 (March 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

168

Assessment of reliability prior distribution : A. Zonnenshain and M. Haim. Proc. a. Reliab. Maintainab. Symp. 44 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 267 KB

english, 1984

169

ITAD—A CAD system for environmental reliability design : Arnold H. Mayer. Proc. a. Reliab. Maintainab. Symp. 23 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 134 KB

english, 1984

170

Managerial decision-making in establishing R & M design goals : Anthony F. Czajkowski. IEEE Trans. Reliab.R-32 (3), 253 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

171

Reliability cost estimation: managerial perspectives : T. L. Regulinski and Yash P. Gupta. IEEE Trans. Reliab.R-32 (3), 276 (August 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 138 KB

english, 1984

172

Status report on the JLC panel on automatic testing : Howard A. Churchill and John W. Yates. Proc. a. Reliab. Maintainab. Symp. 148 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

173

Testing—a major concern for VLSI : Matthew C. Graf. Solid St. Technol. 101 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

174

Assembly-packaging technology trends : Dan Rose. Semiconductor Int. 59 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

175

Test structure methodology of IC package material characterization : Darvin R. Edwards, Gail Heinen, George A. Bednarz and Walter H. Schroen. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 560 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

176

New sputtering techniques for semiconductor metallization : G. Hughes and C. Ridge. Vacuum34 (3–4), 365 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 120 KB

english, 1984

177

Surface mounting alters the PC-board scene : Jerry Lyman. Electronics 113 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 122 KB

english, 1984

178

Defining the issues in wafer fab : G. Dan Hutcheson. Semiconductor Int. 44 (January 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

179

Digital GaAs ICs hit gigahertz speed mark : Joseph Barrera, Bruce Hoffman and Duane Wilson. Microwaves RF, 133 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

180

Current transport mechanisms of electrochemically deposited CdS/CdTe heterojunction : S. S. Ou, O. M. Stafsudd and B. M. Basol. Solid-St. Electron.27 (1), 21 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

181

Density of states modifications in amorphous and hydrogenated amorphous germanium and their effect on 3d core levels binding energy : F. Patella, F. Sette, P. Perfetti, C. Quaresima, C. Capasso, M. Capozi, A. Savoia and F. Evangelisti. Solid St. Commun.49 (8), 749 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

182

Raman scattering from gas-evaporated silicon small particles : T. Okada, T. Iwaki, K. Yamamoto, H. Kasahara and K. Abe. Solid St. Commun.49 (8), 809 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

183

The structure of molten germanium : G. Kahl and J. Hafner. Solid St. Commun.49 (12), 1125 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

184

Compensation-induced optical transitions within the ground state of shallow donors in Ge and Si : J. Trylski and J. Glazer. Solid St. Commun.49 (8), 791 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

185

Landau theory of phase transitions in thick films : D. R. Tilley and B. Ẑekš. Solid St. Commun.49 (8), 823 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

186

Thick-film non-reciprocal ferrite elements and gunn hybrid oscillators in modified thick-film technology : Janusz J. Gondek, Jan Koprowski and Marek A. WojcickiElectrocomponent Sci. Technol.11, 147 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

187

Critical component requirements for vapor phase soldering leadless components on circuit board assemblies for military electronics : John K. Hagge. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 443 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

188

Model for reliability prediction of thick film resistors : R. B. Pranchov and D. S. Campbell. Electrocomponent Sci. Technol.11, 185 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

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english, 1984

189

Firing studies with a model thick film resistor system : Joon Lee and Robert W. Vest. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 430 (December 1983)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 127 KB

english, 1984

190

Production of a dense low energy positive hydrogen ion beam : P. J. M. van Bommel, P. Massmann, E. H. A. Granneman, H. J. Hopman and J. Los. Vacuum34 (1–2), 25 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

191

Microwave ion source for high current metal beams : Noriyuki Sakundo, Katsumi Tokiguchi and Hidemi KoikeVacuum34 (1–2), 245 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 136 KB

english, 1984

192

Oxygen distributions in synthesized SiO2 layers formed by high dose O+ implantation into silicon : P. L. F. Hemment, E. Maydell-Ondrusz, K. G. Stevens, J. A. Kilner and J. Butcher. Vacuum34 (1–2), 203 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

193

Damage effects in silicon and MNOS structures caused by beams of ionized and neutral argon atoms with energies below 5 keV : U. Bangert, C. Jeynes, P. Goodhew and I. H. Wilson. Vacuum34 (1–2), 163 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

194

Ion-beam system resolves patterns of 0.5 micrometer : John Gosch. Electronics 73 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

195

The effect of ion species on bombardment induced topography during ion etching of silicon : G. Carter, G. W. Lewis, M. J. Nobes, J. Cox and W. Begemann. Vacuum34 (3–4), 445 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 133 KB

english, 1984

196

E-beam lithography: a story of dual identities : Aaron D. Weiss. Semiconductor Int. 54 (February 1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 67 KB

english, 1984

197

A review of reactive ion beam etching for production : P. J. Revell and G. F. Goldspink. Vacuum34 (3–4), 455 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 67 KB

english, 1984

198

Time-resolved scanned electron beam annealing of ion-implanted polycrystalline silicon : E. F. Krimmel and A. G. K. Lutsch. Microelectron. J.15, (1), 30 (1984)

Journal:

Microelectronics Reliability

Year:

1984

Language:

english

File:

PDF, 67 KB

english, 1984