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Volume 24; Issue 5
Main
Microelectronics Reliability
Volume 24; Issue 5
Microelectronics Reliability
Volume 24; Issue 5
1
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 143 KB
Your tags:
english, 1984
2
On the fabrication of thin film MICs from substrate cleaning to pattern delineation
R.K. Nahar
,
N.M. Devashrayee
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 398 KB
Your tags:
english, 1984
3
Equivalent matrix parameter functions for two-port sub-networks of non-uniform thin-film Y-Z-KY structure
Kamal U. Ahmed
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 281 KB
Your tags:
english, 1984
4
Matrix parameters of non-uniform distributed parameter thin film C-R-KC micro-systems of circular geometry
Kamal U. Ahmed
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 209 KB
Your tags:
english, 1984
5
Cost analysis of a two-unit standby system with two types of repairmen
Vibha Goyal
,
K. Murari
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 409 KB
Your tags:
english, 1984
6
Stochastic behaviour of a maintained system with protection system
Ashok Kumar
,
Vipin B. Kapoor
,
A.K. Rastogi
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 246 KB
Your tags:
english, 1984
7
Computer-aided design of an eight bit binary counter N-MOS chip for large scale integration (LSI)
Ashok Srivastava
,
S.N. Gupta
,
Chandra Shekhar
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 736 KB
Your tags:
english, 1984
8
Reliability analysis of two special three-state devices
J. Luis Roca
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1984
9
Nework topology for maximizing the terminal reliability in a Computer Communication Network
Y.C. Chopra
,
B.S. Sohi
,
R.K. Tiwari
,
K.K. Aggarwal
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 202 KB
Your tags:
english, 1984
10
Software reliability analysis based on a nonhomogeneous error detection rate model
Shigeru Yamada
,
Hiroyuki Narihisa
,
Hiroshi Ohtera
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 351 KB
Your tags:
english, 1984
11
Stochastic models for evaluating probability of system failure due to human error
Balbir S. Dhillon
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 230 KB
Your tags:
english, 1984
12
Incoming inspection and delivery quality of integrated circuits
F.M. Wurnik
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 644 KB
Your tags:
english, 1984
13
Simplified algorithm for optimum availability allocation and redundancy optimization subject to cost constraint
K.K. Govil
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 257 KB
Your tags:
english, 1984
14
Power GaAs MESFET: Reliability aspects and failure mechanisms
C. Canali
,
F. Castaldo
,
F. Fantini
,
D. Ogliari
,
M. Vanzi
,
M. Zicolillo
,
E. Zanoni
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 1.45 MB
Your tags:
english, 1984
15
Reliability evaluation of protective system with scheduled and unscheduled maintenance
Takehisa Kohda
,
Kohji Akinari
,
Hiromitsu Kumamoto
,
Koichi Inoue
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 282 KB
Your tags:
english, 1984
16
Sputter etched molybdenum-oxidation technique for fine patterns
Awatar Singh
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 70 KB
Your tags:
english, 1984
17
Thick film polyester screen on glass as photomask
Awatar Singh
,
M. Prudenziati
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 446 KB
Your tags:
english, 1984
18
Guidelines for establishing an effective ESD program : Donald L. Denton. Solid St. Technol. 127 (January 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1984
19
Contracting for liability relief : Richard M. Jacobs, PE. and Lawrence A. Hoffman. Proc. a. Reliab. Maintainab. Symp. 67 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1984
20
Reliability of optoelectronic semiconductor components : T. I. Bajenescu. Feinwerktechnik Messtechnik92, (1) 20 (1984) (in German)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1984
21
Factors affecting fiber optics reliability : Claude F. Veraa. Proc. a. Reliab. Maintainab. Symp. 236 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1984
22
Pulse propagation properties of multilayer ceramic multichip modules for VLSI circuits : Panangattur N. Venkatachalam. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 480 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 233 KB
Your tags:
english, 1984
23
Influence of the chip temperature on the moisture-induced failure rate of plastic-encapsulated devices : Dieter Stroehle. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 537 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
24
A program for reliable high power μW transistors (the AN/SPS-40 solid-state transmitter) : Michael H. Diamant. Proc. a. Reliab. Maintainab. Symp. 262 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
25
IC failure rate estimates from field data : Darwin F. Simonaitis. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 568 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
26
Failure analysis in semiconductor devices—rationale, methodology and practice : B. P. Richards and P. K. Footner. Microelectron. J.15 (1), 5 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
27
Nondestructive screening for low voltage failure in multilayer ceramic capacitors : Robert C. Chittick, Edmund Gray, John H. Alexander, Miles P. Drake and Eric L. Bush. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 510 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
28
Event tree modeling on a small computer : James M. Koren, George B. Rothbart and Blake F. Putney. Proc. a. Reliab. Maintainab. Symp. 330 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1984
29
Maintenance processors for mainframe computers : Tze-Shiu Liu. IEEE Spectrum, 36 (February 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1984
30
Nonparametric tests for testing the homogeneity of k(>2) exponential, Gamma and Weibull populations using censored data: A. R. Padmanabhan and N. Singh. Microelectron. Reliab.23 (5), 953 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1984
31
Analysis of series deviance in a parallel state transition diagram and applications to fault tolerant computing : Fabrizio Lombardi and Steve Ratheal. Microelectron. Reliab.23 (5), 963 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1984
32
Managing test-procedures to achieve reliable software : Peter Kubat and Harvey S. Koch. IEEE Trans. Reliab.R-32 (3), 299 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 256 KB
Your tags:
english, 1984
33
Fuzzy-network planning—FNET : Igor Gazdík. IEEE Trans. Reliab.R-32 (3), 304 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
34
Interval reliability for initiating and enabling events : Colin Dunglinson and Howard Lambert. IEEE Trans. Reliab.R-32 (2), 150 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
35
Fault tree synthesis from a directed graph model for a power distribution network : Daniel L. Cummings, Steven A. Lapp and Gary J. Powers. IEEE Trans. Reliab.R-32 (2), 140 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
36
A variance expression for a security-of-supply model : Ole Platz. IEEE Trans. Reliab.R-32 (2), 191 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
37
The effect of preventive maintenance on a system with imperfect switchover : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (5), 821 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
38
Slection of Weibull shape parameter, based on adaptive estimation : M. Pandey and S. K. Upadhyay. IEEE Trans. Reliab.R-32 (2), 205 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
39
The effect of preventive maintenance on a two-dissimilar unit standby system : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (3), 485 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
40
Shrunken estimators of Weibull shape parameter in censored samples : M. Pandey. IEEE Trans. Reliab.R-32 (2), 200 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1984
41
Prediction intervals using exceedances for an additional thirdstage sample : D. B. Owen and Youn-Min Chou. IEEE Trans. Reliab.R-32 (3), 314 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 261 KB
Your tags:
english, 1984
42
Computer aided quality management in electronics and production—a challenge for the entire enterprise : B. P. Davis. Feinwerktechnik Messtechnik91 (8), 365 (1983) (in German)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
43
On the determination of all tie sets and minimal cut sets between any two nodes of a graph through Petri nets : G. S. Hura. Microelectron. Reliab.23 (3), 471 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
44
A new technique to optimize system reliability : Ryoichi Sasaki, Tateo Okada and Sadanori Shingai. IEEE Trans. Reliab.R-32 (2), 175 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
45
Credible and HPD intervals of the parameter and reliability of Rayleigh distribution : S. K. Sinha and H. A. Howlader. IEEE Trans. Reliab.R-32 (2), 217 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
46
Folded equations for a Weibull maximum likelihood ratio test : J. Edward Bilikam and Raykun R. Chang. IEEE Trans. Reliab.R-32 (2), 197 (June 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
47
Steiner trees in probabilistic networks : Joseph A. Wald and Charles J. Colbourn. Microelectron. Reliab.23 (5), 837 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1984
48
Quality control techniques for “Zero Defects” : Thomas W. Calvin. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (3), 323 (September 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 261 KB
Your tags:
english, 1984
49
Availability measures for an intermittently used repairable system : P. K. Kapur, T. V. Natarajan and Debashish Chakrabarty. Microelectron. Reliab.23 (5), 841 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
50
Reliability programs for commercial communication satellites : Francis Edward Erdle, Irwin Arthur Feigenbaum and John Wallace Talcott, Jr., IEEE Trans. Reliab.R-32 (3), 236 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
51
Probabilistic delay evaluation in combinational digital circuits by Petri Nets : Francesco Corsi and B. Castagnolo. Microelectron. Reliab.23 (3), 541 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
52
Busy-period analysis of a two-unit warm standby system with inspection time : R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.23 (2), 341 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
53
A reliability physics model for parallel system : M. N. Gopalan and P. Venkateswarlu. Microelectron. Reliab.23 (2), 367 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
54
Cost limit replacement policy under minimal repair : Kyung S. ParkMicroelectron. Reliab.23 (2), 347 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
55
Stochastic behaviour of a two-unit cold standby system with three modes and allowed down time : S. M. Gupta, N. K. Jaiswal and L. R. Goel. Microelectron. Reliab.23 (2), 333 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1984
56
Analysis of a two-unit repairable system with random inspection subject to two types of failure : R. Subramanyam Naidu and M. N. Gopalan, Microelectron. Reliab.23 (3), 449 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 260 KB
Your tags:
english, 1984
57
Floating redundancy in digital systems : P. G. Anderson and Z. G. Vranesic. Microelectron. Reliab.23 (3), 519 (1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
58
BIT detectability/reliability in expendable weapons : R. Owen Holbrook. Proc. a. Reliab. Maintainab. Symp. 306 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
59
Determining operating and support costs with USAF D056 maintenance data collection system : Ronald S. Morris and Bruce E. Bartels. Proc. a. Reliab. Maintainab. Symp. 197 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
60
Reliability and maintainability acquisition handbook : Herbert Dagen and Stanley Grubman. Proc. a. Reliab. Maintainab. Symp. 78 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
61
VLSI packaging reliability : Eugene C. Blackburn. Solid St. Technol. 113 (January 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
62
Reliability prediction: improving the crystal ball : Norman Harris and Patrick D. T. O'Connor. Proc. a. Reliab. Maintainab. Symp. 108 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1984
63
Contractor experience using RADC ORACLE : Charles W. Plotkin. Proc. a. Reliab. Maintainab. Symp. 222 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
64
A Bayes procedure combining black box estimates and laboratory tests : Gary G. Brush, John D. Healy and Burton, S. Liebesman. Proc. a. Reliab. Maintainab. Symp. 242 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
65
On criterion of comparison of reliabilities : Julius Goodman. Proc. a. Reliab. Maintainab. Symp. 231 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
66
Classifying combined hardware/software R models : Jorge L. Romeu and Kieron A. Dey. Proc. a. Reliab. Maintainab. Symp. 282 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
67
Optimization of spares in a maintenance scenario : Robert J. Coughlin. Proc. a. Reliab. Maintainab. Symp. 371 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
68
Storage reliability with periodic test : Eugene C. Martinez. Proc. a. Reliab. Maintainab. Symp. 181 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
69
Low energy electron microscopy utilized in dynamic circuit analysis and failure detection on LSI-VLSI internal circuits : Louis Kotorman. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 527 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
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english, 1984
70
A management guide to reliability predictions : Frank A. Stovall. Proc. a. Reliab. Maintainab. Symp. 114 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
71
Generalized acceleration factor in reliability : Der-Yang Guan. Proc. a. Reliab. Maintainab. Symp. 54 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
72
Failure to safety in process-control systems : Donald Smith. Electronics Power, 227 (March 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
73
Common errors in application of MIL-STD-781 : Terrance W. Elliott. Proc. a. Reliab. Maintainab. Symp. 139 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
74
DoD/industry—R & M case study analysis : Paul F. Goree and Thomas A. Musson. Proc. a. Reliab. Maintainab. Symp. 91 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
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english, 1984
75
The operational readiness: the reliability and maintainability connection : Martin M. Meth and Kurt Greene. Proc. a. Reliab. Maintainab. Symp. 83 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
76
Predicted vs test MTBF's… why the disparity? : Jeffrey B. Lynch and Lawrence J. Phaller. Proc. a. Reliab. Maintainab. Symp. 117 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1984
77
A maintenance philosophy for mainframe computers : Harold L. Platzer. Proc. a. Reliab. Maintainab. Symp. 359 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 134 KB
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english, 1984
78
R/M design for long term dormant storage : George Kasouf and David A. McGoye. Proc. a. Reliab. Maintainab. Symp. 168 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 268 KB
Your tags:
english, 1984
79
Establishing realistic requirements for reliability, maintainability, and built-in-test : R. C. Trakas. Proc. a. Reliab. Maintainab. Symp. 103 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
80
Field data: the final measure : Harold S. Balaban and Richard A. Kowalski. Proc. a. Reliab. Maintainab. Symp. 123 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
81
Cost savings by establishing life limits : William Ireland. Proc. a. Reliab. Maintainab. Symp. 72 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
82
Reliability-growth programmes for undersea communication systems : Robert H. Murphy. IEEE Trans. Reliab.R-32 (3), 240 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
83
Quality circles—an experience in Jyoti Limited : A. V. Dandekar. QR J. (India). 107 (September 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
84
Reliability investment and life-cycle cost : James K. Seger. IEEE Trans. Reliab.R-32 (3), 259 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1984
85
Management of logistic support costs in the equipment acquisition phase : Dwight E. Collins. IEEE Trans. Reliab.R-32 (3), 264 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 271 KB
Your tags:
english, 1984
86
Procedures and tables for construction and selection of multiple deferred state (MDS-1) (c1, c2)) plans: V. Soundararajan and Raju. QR J. (India), 101 (September 1983)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1984
87
Environmental stress screening—lessons learned : Ronald J. Decristoforo. Proc. a. Reliab. Maintainab. Symp. 129 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1984
88
Optimum warranty policies for nonreparable items : Marlin U. Thomas. IEEE Trans. Reliab.R-32 (3), 282 (August 1983)
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1984
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89
CAD's interface between design and mask-making : Semiconductor Int. 128 (January 1984)
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1984
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90
Planning of production reliability stress-screening programs : E. Fiorentino and A. E. Saari. IEEE Trans. Reliab.R-32 (3), 247 (August 1983)
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Microelectronics Reliability
Year:
1984
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91
VLSI test systems: facing the challenge of tomorrow : Peter H. Singer. Semiconductor Int. 82 (January 1984)
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1984
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92
Trends in LSI/VLSI testing : Jon Turino and Ray Chapman. Semiconductor Int. 70 (January 1984)
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1984
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93
Review: dry etching of silicon oxide : Alfred J. van Roosmalen. Vacuum34 (3–4), 429 (1984)
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1984
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94
Interconnecting and packaging VLSI chips : A. H. Mones and R. K. Spielberger. Solid St. Technol. 119 (January 1984)
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1984
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95
Alcohol modified RTV silicone encapsulation for integrated circuit device packaging : Ching-Ping Wong and Deni M. Rose. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 485 (December 1983)
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Microelectronics Reliability
Year:
1984
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96
Hot spots caused by voids and cracks in the chip mount-down medium in power semiconductor packaging : A. J. Yerman, James F. Burgess, Richard O. Carlson and Constantine A. Neugebauer. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 473 (December 1983)
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Microelectronics Reliability
Year:
1984
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97
Structured copper: a pliable high conductance material for bonding to silicon power devices : Homer H. Glascock, II and Harold F. Webster. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 460 (December 1983)
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Microelectronics Reliability
Year:
1984
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98
The quality of die-attachment and its relationship to stresses and vertical die-cracking : C. G. M. van Kessel, Stephen A. Gee and James J. Murphy. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 414 (December 1983)
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99
Parasitic MOSFETs in an oxide-isolated bipolar technology: process-control measurements : E. H. Stevens. Microelectron. J.15 (1), 50 (1984)
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1984
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100
Solder side up—the move to surface mounting : Roger Dettmer. Electronics Power, 117 (February 1984)
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101
Flexible circuits offer a simple solution to chip-carrier mounting : Peter Kirby. Electronics 149 (February 1984)
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1984
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102
Influence of DC bias sputtering during aluminum metallization : James F. Smith. Solid St. Technol. 135 (January 1984)
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1984
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103
Development of adhesive die attach technology in cerdip packages; material issues : F. K. Moghadam. Solid St. Technol. 149 (January 1984)
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1984
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104
CAD in electronics construction effects on the designing engineer and on the construction result : R. W. Mayer. Feinwerktechnik Messtechnik92 (2), 71 (1984) (in German)
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1984
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105
Injection-coupled logic leads bipolar RAMs to VLSI : S. K. Wiedmann, K. Heuber, F. Wernicke, W. Klein, R. Brosch, E. Klink and H. Heimeier. Electronics 139 (February 1984)
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1984
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106
Processing linear devices for performance and reliability : Brian E. Hollins. Semiconductor Int. 76 (February 1984)
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1984
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107
Monitored burn-in of MOS 64K dynamic RAMs : Jim Eachus, Jon Klema and Scott Walker. Semiconductor Int. 104 (February 1984)
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1984
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108
A gaseous detector device for an environmental SEM : G. D. Danilatos. Micron Microscopica Acta.14 (4), 307 (1983)
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1984
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109
Carrier mobility in inversion layers and rf plasma induced radiation defects at the Si-SiO2 interface : J. Kassabov, E. Atanassova and E. Goranova. Solid-St. Electron.27(1), 13 (1984)
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1984
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110
On speeding-up of iteration convergence in semiconductor problems : B. S. Polsky. Solid-St. Electron.27 (2), 191 (1984)
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1984
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111
Theory of the surface depletion region for semiconductors with linearly graded impurity profiles : S. W. Tarasewicz and C. A. T. Salama. Solid-St. Electron.27 (1), 33 (1984)
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112
Diffusion length and surface recombination velocity measurements with the scanning electron microscope: the highly-doped emitter of a p-n junction: D. E. Burk and R. Sundaresan. Solid-St. Electron.27 (1), 59 (1984)
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1984
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113
Computer analysis on the collection of alpha-generated charge for reflecting and absorbing surface conditions around the collector : K. Terrill, C. Hu and A. Neureuther. Solid-St. Electron.27 (1), 45 (1984)
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Microelectronics Reliability
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1984
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114
Spatially resolved optical spectroscopy of plasma etching systems : D. Field, A. J. Hydes and D. F. Klemperer. Vacuum34 (3–4), 347 (1984)
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115
Measurement of the tunneling and hopping parameters in RuO2 thick films : N. C. Halder and R. J. Snyder. Electrocomponent Sci. Technol.11, 123 (1984)
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1984
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116
The influence of fast infrared firing on thick film materials : Kenneth R. Bube and Clark Fisher. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 436 (December 1983)
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117
Evaporation characteristics of electron beam gun heated sources : Paul C. Baynes and T. Nagarajan. Electrocomponent Sci. Technol.11, 175 (1984)
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118
Mid-film interconnects for multilayer microcircuit packages : R. Sue and H. M. Naguib. Electrocomponent Sci. Technol.11, 97 (1984)
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1984
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119
Adhesive techniques in microelectronics : M. Hof. Feinwerktechnik Messtechnik92 (2), 67 (1984) (in German)
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1984
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120
Fabrication of Schottky-barrier diodes using a thick film technique : R. Sarin and Y. R. Pradeep. Electrocomponent Sci. Technol.11, 173 (1984)
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1984
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121
Ta-SiC thin film resistors for highly reliable thermal printing heads : Keiji Nunomura, Nobuyoshi Koyama and Tetsujin Matsubara. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 377 (December 1983)
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1984
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122
For hybrids: a way to higher chip yields : William K. Garrett. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 421 (December 1983)
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1984
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123
Development of nondestructive pull test requirements for gold wires on multilayer thick-film hybrid microcircuits : Roy J. Blazek. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 503 (December 1983)
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Microelectronics Reliability
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1984
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124
A comparison of SIMS with other techniques based on ion-beam solid interactions : H. W. Werner and P. R. Boudewijn. Vacuum34 (1–2), 83 (1984)
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1984
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125
The ion optics of low-energy ion beams : I. W. Drummond. Vacuum34 (1–2), 51 (1984)
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1984
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126
The effects of plasma and ion beam processing on the propertives of n-GaAs Schottky diodes: P. J. Smith and D. A. Allan. Vaccum34 1–2, 209 (1984)
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1984
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127
Beam-induced broadening effects in sputter depth profiling : Klaus Wittmaack. Vacuum34 (1–2), 119 (1984)
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1984
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128
Nanometre structures in semiconductors formed by low energy ion implantation : J. M. Shannon and J. B. Clegg. Vacuum34 (1–2), 193 (1984)
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1984
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129
Shallow ion implantation in gallium arsenide : J. D. Grange, D. C. Bartle, B. R. Brown, C. Dineen, K. S. Knight, J. D. Medland, D. K. Wickenden and M. G. Dowsett. Vacuum34 (1–2), 199 (1984)
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130
Plasma enhanced deposition of “silicon nitride” for use as an encapsulant for silicon ion-implanted gallium arsenide : D. C. Bartle, D. C. Andrews, J. D. Grange, P. G. Harris, A. D. Trigg and D. K. Wickenden. Vacuum34 (1–2), 315 (1984)
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131
Some mechanisms of sputtered negative ion production : M. C. Underwood. Vacuum34, 1–2, 153 (1984)
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1984
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132
Ion beam etching GaAs for integrated optical applications : A. P. Webb and C. D. W. WilkinsonVacuum34 (1–2), 159 (1984)
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1984
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133
Recoil profiles produced by ion implantation through dielectric layers : R. T. Blunt, R. Sweda and I. R. Sanders. Vacuum34 (1–2), 281 (1984)
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1984
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134
CORDIS—an improved high-current ion source for gases : R. Keller, F. Nöhmayer, P. Spadtke and M-H. Schönenberg. Vacuum34 (1–2), 31 (1984)
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1984
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135
Process and film characterization of PECVD borophos-phosilicate films for VLSI applications : Jerry E. Tong, Kurt Schertenleib and Ronald A. Carpio. Solid St. Technol. 161 (January 1984)
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1984
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136
Capabilities of molecular beam epitaxy and materials prospects : W. Bardsley. Vacuum34 (3–4), 391 (1984)
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1984
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137
Argon and reactive ion beam etching for SAW devices : R. E. Chapman. Vacuum34 (3–4), 417 (1984)
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1984
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138
Publication, Notice, Call for Papers, etc.
Journal:
Microelectronics Reliability
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1984
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139
Failure modes and effects analysis (FMEA/FMECA)
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Microelectronics Reliability
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1984
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140
Optimal policies in a two-unit standby system with two types of repairmen
Vibha Goyal
,
K. Murari
Journal:
Microelectronics Reliability
Year:
1984
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english
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141
State space representation of Petri nets
G.S. Hura
Journal:
Microelectronics Reliability
Year:
1984
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142
Analysis of a two unit standby system with partial failure and two types of repairs
L.R. Goel
,
Ashok Kumar
,
A.K. Rastogi
Journal:
Microelectronics Reliability
Year:
1984
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english
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143
Analysis of a k-out-of-n unit system with two types of failure and preventive maintenance
L.R. Goel
,
Praveen Gupta
Journal:
Microelectronics Reliability
Year:
1984
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english
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144
Stochastic analysis of a two-unit parallel system with partial and catastrophic failures and preventive maintenance
L.R. Goel
,
Praveen Gupta
Journal:
Microelectronics Reliability
Year:
1984
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english
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145
A fast algorithm to formulate Markov system equations
J. Luis Roca
Journal:
Microelectronics Reliability
Year:
1984
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146
Algebraical algorithm for computing complex systems reliability
J. Luis Roca
Journal:
Microelectronics Reliability
Year:
1984
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147
Design of a comprehensive process evaluation vehicle for development of small geometry CMOS process
A. Bandyopadhyay
,
P.A. Govindacharyulu
,
M.J. Zarabi
Journal:
Microelectronics Reliability
Year:
1984
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148
Analysis of systems subject to inspection and repair: A state-of-the-art survey
R. Subramanyam Naidu
,
M.N. Gopalan
Journal:
Microelectronics Reliability
Year:
1984
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149
Optimal inspection when the system is repaired upon detection of failure
Terje Aven
Journal:
Microelectronics Reliability
Year:
1984
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english
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150
Some applications of semi-regenerative processes to two-unit warm standby system
Kouya Uematsu
,
Toshio Nishida
,
Masashi Kowada
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
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151
New Information Technology: Author: Alan Burns Publishers: Ellis Horwood Limited, Market Cross House, Cooper Street, Chichester, West Sussex, PO19 1EB, England. Price: £ 8.95. (ISBN 0 85312 674 7)
G.W.A.D.
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Microelectronics Reliability
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1984
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152
Choosing a practical MTTF model for ECC memory chip : D. Y. Koo and H. B. Chenoweth. Proc. a. Reliab. Maintainab. Symp. 255 (1984)
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Microelectronics Reliability
Year:
1984
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153
Low firing temperature multilayer glass—ceramic substrate : Yuzo Shimada, Kazuaki Utsumi, M. Suzuki, Hideo Takamizawa, Mitsuru Nitta and Toshihiko Watari. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 382 (December 1983)
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1984
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154
Cumulative sum control charts for the mean of an exponential distribution using extremes : H. R. Singh and Gauri Shankar. QR J. (India) 97 (September 1983)
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Year:
1984
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155
Stochastic behaviour of a standby redundant system with three modes : S. M. Gupta, N. K. Jaiswal and L. R. Goel. Microelectron. Reliab.23 (2), 329 (1983)
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1984
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156
Analysis of 1-out-of-n: G adjustable operating system: P Sarmah and A. D. DharmadhikariMicroelectron. Reliab.23 (3), 477 (1983)
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Year:
1984
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157
Modified periodic preventive maintenance policies : Toshio Nakagawa, Kenjiro Nishi and Yoshiya Sawa. Microelectron. Reliab.23 (5), 945 (1983)
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1984
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158
Reliability and availability analysis of systems operating in multiple environments : B. S. Dhillon and J. Natesan. Micro-electron. Reliab. 23 (5), 883 (1983)
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Year:
1984
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159
System comparisons can simplify selection of parametric tester : Michael Levis. Electronics 127 (January 1984)
Journal:
Microelectronics Reliability
Year:
1984
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160
Worst case reliability bounds : Suresh Govindachar. Microelectron Reliab.23 (5), 855 (1983)
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Year:
1984
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161
Parallel/series dependency and equivalence in generalized Markov's chains : Fabrizio Lombardi. Microelectron. Reliab.23 (3), 501 (1983)
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Year:
1984
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162
Shifting shape-parameter in life tests: a Bayes analysis : G. S. Lingappaiah. IEEE Trans. Reliab.R-32 (3), 317 (August 1983)
Journal:
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Year:
1984
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163
On profit evaluation in a modular system with two types of failures : M. C. Gupta and Ashok Kumar. Microelectron. Reliab.23 (5), 823 (1983)
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Year:
1984
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164
Software reliability models: a review : J. G. Shanthikumar. Microelectron. Reliab.23 (5), 903 (1983)
Journal:
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1984
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165
Software configuration management and its contribution to reliability program management : Ray Foulkes and Michael P. Mills. IEEE Trans. Reliab.R-32 (3), 289 (August 1983)
Journal:
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Year:
1984
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166
Spacecraft anomalies and lifetimes : Charles E. Bloomquist. Proc. a. Reliab. Maintainab. Symp. 186 (1984)
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1984
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167
Power-system reliability in perspective : R. Billinton and R. N. Allan. Electronics Power 231 (March 1984)
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1984
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168
Assessment of reliability prior distribution : A. Zonnenshain and M. Haim. Proc. a. Reliab. Maintainab. Symp. 44 (1984)
Journal:
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Year:
1984
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169
ITAD—A CAD system for environmental reliability design : Arnold H. Mayer. Proc. a. Reliab. Maintainab. Symp. 23 (1984)
Journal:
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Year:
1984
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170
Managerial decision-making in establishing R & M design goals : Anthony F. Czajkowski. IEEE Trans. Reliab.R-32 (3), 253 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
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171
Reliability cost estimation: managerial perspectives : T. L. Regulinski and Yash P. Gupta. IEEE Trans. Reliab.R-32 (3), 276 (August 1983)
Journal:
Microelectronics Reliability
Year:
1984
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172
Status report on the JLC panel on automatic testing : Howard A. Churchill and John W. Yates. Proc. a. Reliab. Maintainab. Symp. 148 (1984)
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1984
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173
Testing—a major concern for VLSI : Matthew C. Graf. Solid St. Technol. 101 (January 1984)
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1984
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174
Assembly-packaging technology trends : Dan Rose. Semiconductor Int. 59 (January 1984)
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1984
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175
Test structure methodology of IC package material characterization : Darvin R. Edwards, Gail Heinen, George A. Bednarz and Walter H. Schroen. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 560 (December 1983)
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1984
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176
New sputtering techniques for semiconductor metallization : G. Hughes and C. Ridge. Vacuum34 (3–4), 365 (1984)
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1984
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177
Surface mounting alters the PC-board scene : Jerry Lyman. Electronics 113 (February 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
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178
Defining the issues in wafer fab : G. Dan Hutcheson. Semiconductor Int. 44 (January 1984)
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Microelectronics Reliability
Year:
1984
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179
Digital GaAs ICs hit gigahertz speed mark : Joseph Barrera, Bruce Hoffman and Duane Wilson. Microwaves RF, 133 (February 1984)
Journal:
Microelectronics Reliability
Year:
1984
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180
Current transport mechanisms of electrochemically deposited CdS/CdTe heterojunction : S. S. Ou, O. M. Stafsudd and B. M. Basol. Solid-St. Electron.27 (1), 21 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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181
Density of states modifications in amorphous and hydrogenated amorphous germanium and their effect on 3d core levels binding energy : F. Patella, F. Sette, P. Perfetti, C. Quaresima, C. Capasso, M. Capozi, A. Savoia and F. Evangelisti. Solid St. Commun.49 (8), 749 (1984)
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Microelectronics Reliability
Year:
1984
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182
Raman scattering from gas-evaporated silicon small particles : T. Okada, T. Iwaki, K. Yamamoto, H. Kasahara and K. Abe. Solid St. Commun.49 (8), 809 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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183
The structure of molten germanium : G. Kahl and J. Hafner. Solid St. Commun.49 (12), 1125 (1984)
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Microelectronics Reliability
Year:
1984
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184
Compensation-induced optical transitions within the ground state of shallow donors in Ge and Si : J. Trylski and J. Glazer. Solid St. Commun.49 (8), 791 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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185
Landau theory of phase transitions in thick films : D. R. Tilley and B. Ẑekš. Solid St. Commun.49 (8), 823 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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186
Thick-film non-reciprocal ferrite elements and gunn hybrid oscillators in modified thick-film technology : Janusz J. Gondek, Jan Koprowski and Marek A. WojcickiElectrocomponent Sci. Technol.11, 147 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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english
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187
Critical component requirements for vapor phase soldering leadless components on circuit board assemblies for military electronics : John K. Hagge. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 443 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
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188
Model for reliability prediction of thick film resistors : R. B. Pranchov and D. S. Campbell. Electrocomponent Sci. Technol.11, 185 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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189
Firing studies with a model thick film resistor system : Joon Lee and Robert W. Vest. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 430 (December 1983)
Journal:
Microelectronics Reliability
Year:
1984
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190
Production of a dense low energy positive hydrogen ion beam : P. J. M. van Bommel, P. Massmann, E. H. A. Granneman, H. J. Hopman and J. Los. Vacuum34 (1–2), 25 (1984)
Journal:
Microelectronics Reliability
Year:
1984
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191
Microwave ion source for high current metal beams : Noriyuki Sakundo, Katsumi Tokiguchi and Hidemi KoikeVacuum34 (1–2), 245 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 136 KB
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192
Oxygen distributions in synthesized SiO2 layers formed by high dose O+ implantation into silicon : P. L. F. Hemment, E. Maydell-Ondrusz, K. G. Stevens, J. A. Kilner and J. Butcher. Vacuum34 (1–2), 203 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
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193
Damage effects in silicon and MNOS structures caused by beams of ionized and neutral argon atoms with energies below 5 keV : U. Bangert, C. Jeynes, P. Goodhew and I. H. Wilson. Vacuum34 (1–2), 163 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
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english, 1984
194
Ion-beam system resolves patterns of 0.5 micrometer : John Gosch. Electronics 73 (February 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
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english, 1984
195
The effect of ion species on bombardment induced topography during ion etching of silicon : G. Carter, G. W. Lewis, M. J. Nobes, J. Cox and W. Begemann. Vacuum34 (3–4), 445 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 133 KB
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196
E-beam lithography: a story of dual identities : Aaron D. Weiss. Semiconductor Int. 54 (February 1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 67 KB
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197
A review of reactive ion beam etching for production : P. J. Revell and G. F. Goldspink. Vacuum34 (3–4), 455 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 67 KB
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english, 1984
198
Time-resolved scanned electron beam annealing of ion-implanted polycrystalline silicon : E. F. Krimmel and A. G. K. Lutsch. Microelectron. J.15, (1), 30 (1984)
Journal:
Microelectronics Reliability
Year:
1984
Language:
english
File:
PDF, 67 KB
Your tags:
english, 1984
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