Volume 26; Issue 1

Microelectronics Reliability

Volume 26; Issue 1

1

Editorial Board

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 93 KB

english, 1986

2

Calendar of International Conferences, Symposia, Lectures and Meetings of Interest

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

3

Reliability — An update

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 112 KB

english, 1986

4

Cost-benefit analysis of a one-server two-unit standby system subject to imperfect switching device, random inspection and k-failure modes

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 297 KB

english, 1986

5

Probabilistic analysis of a two-unit cold standby system with two-phase repair and preventive maintenance

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 357 KB

english, 1986

6

Stochastic analysis of standby system with duplex units

L.R. Goel, S.K. Singh, Rakesh Gupta

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 290 KB

english, 1986

7

Stochastic analysis of a two-unit warm standby system with slow switching device

G.C. Sharma, L.R. Goel, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 266 KB

english, 1986

8

N-unit parallel redundant system with multiple correlated failures

Angel Vasilev Nikolov

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 217 KB

english, 1986

9

Application of the surrogate constraints algorithm to optimal reliability design of systems

Mitsunori Hikita, Yuji Nakagawa, Kyoichi Nakashima, Kazuharu Yamato

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 292 KB

english, 1986

10

Testing whether F is “more NBU” than is G

Myles Hollander, Dong Ho Park, Frank Proschan

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 383 KB

english, 1986

11

On the expected net revenue of a one-server two-unit system with arbitrary installation time

M.N. Gopalan, R. Radhakrishnan

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 199 KB

english, 1986

12

On the expected revenue of a two-unit system supported by independent service facilities for installation and repair

M.N. Gopalan, R. Radhakrishnan

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 183 KB

english, 1986

13

MTTF and availability evaluation of a two-unit, two-state, parallel redundant complex system with constant human failure

P.P. Gupta, Arvind Kumar

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 222 KB

english, 1986

14

Availability and MTTF analysis of a three state repairable redundant electronic equipment under critical human errors

P.P. Gupta, Rakesh Kumar Sharma

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 325 KB

english, 1986

15

Availability and MTTF analysis of a three-state parallel redundant multi-component system under critical human failures

P.P. Gupta, Rakesh Kumar Sharma

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 350 KB

english, 1986

16

Cost analysis of a three-state repairable redundant complex system under various modes of failures

P.P. Gupta, Rakesh Kumar Sharma

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 349 KB

english, 1986

17

The search for quality: The case of planned obsolescence

Yosef S. Sherif, Ellen L. Rice

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 366 KB

english, 1986

18

Optimum ordering policies for an equipment with a sensing device

C.S. Sung, Yeon Ki Park

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 380 KB

english, 1986

19

Bibliography of literature on reliability in civil engineering

Balbir S. Dhillon, J.Stephen Belland

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 1.35 MB

english, 1986

20

Stochastic behaviour of man-machine systems operating under different weather conditions

Balbir S. Dhillon, Subramanyam N. Rayapati

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 193 KB

english, 1986

21

Bibliography of literature on computer hardware reliability

Balbir S Dhillon, Kenneth I Ugwu

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 1.35 MB

english, 1986

22

Hot carriers' effects in short channel devices

R. Petrova, R. Kamburova, P. Vitanov

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 257 KB

english, 1986

23

Reliability and maintainability of a multicomponent series-parallel system with simultaneous failure under preemptive repeat repair discipline

Masanori Kodama, Isao Sawa

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 651 KB

english, 1986

24

A note on “A finite range distribution of failure times”

C.D. Lai, S.P. Mukherjee

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 238 KB

english, 1986

25

Analysis of 1-server n-unit parallel system subject to different service strategies

M.N. Gopalan, T.K. Ramesh

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 176 KB

english, 1986

26

Introduction to microcomputer engineering: Authors: D.A. Fraser, R. Gregory, B. Hawken, B. Holdsworth, G. Jones and M. Ryal Publishers: Ellis Horwood Limited, Cooper Street, Chichester, Sussex. Price: £ 13.75. 1985. (ISBN 0 85312888X)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 42 KB

english, 1986

27

Handbook of microelectronics packaging and inter connection technologies: Author: F. N. Sinnadurai Publishers: Electrochemical Publications Limited, 8, Barns Street, AYR, Scotland, KA7 1XA. Price: £ 42.00 (U.S. $ 73.00). 1985. (ISBN 0 901150 19 3)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 33 KB

english, 1986

28

Announcement

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 52 KB

english, 1986

29

4520309 System for testing the malfunctioning or correct operation of a circuit with logic components

Andre Berard, Claud Laviron

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 79 KB

english, 1986

30

4520313 Semiconductor testing and apparatus therefor

LaurenceL Allred, Bradley Lange

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 79 KB

english, 1986

31

4520448 Method of characterizing reliability in bipolar semiconductor devices

Bernard Tremintin

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 163 KB

english, 1986

32

4521086 Objective for an IC mask testing device

Hiroyuki Kurita

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 85 KB

english, 1986

33

4523144 Complex probe card for testing a semiconductor wafer

Masao Okubo, Yasuro Yoshimitsu

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 85 KB

english, 1986

34

4523145 Apparatus for the automated handling and testing of electronic modules

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 171 KB

english, 1986

35

4523312 IC tester

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

36

4523975 Integrated circuit planarizing process

ChristopherK Groves, Kevin Duncan, EdwardCD Darwall

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

37

4525789 Programmable network tester with data formatter

KyranB Kemper, Harvey Rubin

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 165 KB

english, 1986

38

4528504 Pulsed linear integrated circuit tester

MaxC Thornton, Paul Kuntz, Russell Meyer, KennethM Rosier

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски