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Volume 26; Issue 5
Main
Microelectronics Reliability
Volume 26; Issue 5
Microelectronics Reliability
Volume 26; Issue 5
1
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 221 KB
Your tags:
english, 1986
2
Operational behaviour of a three state standby redundant electronic equipment under critical human errors
P.P. Gupta
,
Rakesh Kumar Sharma
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 323 KB
Your tags:
english, 1986
3
Reliability behaviour of a power plant by boolean function technique under arbitrary failure time distribution
P.P. Gupta
,
R.K. Sharma
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 276 KB
Your tags:
english, 1986
4
Evaluation of reliability and M.T.T.F. of a power plant with the aid of Boolean function expansion algorithm
P.P. Gupta
,
R.K. Sharma
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 258 KB
Your tags:
english, 1986
5
Reliability and M.T.T.F. analysis of a power plant, connected with one hundred per cent reliable cables by B.F. technique
P.P. Gupta
,
Arvind Kumar
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 350 KB
Your tags:
english, 1986
6
Cost function analysis of a standby redundant non-repairable system subjected to different types of failures
P.P. Gupta
,
Arvind Kumar
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 293 KB
Your tags:
english, 1986
7
Cost analysis of a 2-unit standby redundant electronic system with critical human errors
P.P. Gupta
,
R.K. Gupta
,
R.K. Sharma
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 306 KB
Your tags:
english, 1986
8
Reliability analysis of a two-unit cold standby redundant system with administrative delay and no priority in repair
S.M. Gupta
,
D.K. Pandey
,
Renu Gupta
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 208 KB
Your tags:
english, 1986
9
Reliability analysis of a series-parallel system under different repair disciplines
Angel Vasilev Nikolov
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 309 KB
Your tags:
english, 1986
10
A simple method for calculating the structural importance of a component
Pei-En Lu
,
Ding-Hua Shi
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1986
11
Stochastic analysis of a two unit standby system with two switching devices
L.R. Goel
,
S.C. Sharma
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 195 KB
Your tags:
english, 1986
12
Cost-benefit analysis of a two-unit deteriorating standby system with detector
L.R. Goel
,
G.C. Sharma
,
Praveen Gupta
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 245 KB
Your tags:
english, 1986
13
Reliability analysis of a two-unit redundant system with critical human error
Ashok Kumar
,
Manju Agarwal
,
S.C. Garg
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 283 KB
Your tags:
english, 1986
14
A single server multi-component two-unit cold standby system with inspection and imperfect switching device
Rakesh Gupta
,
C.P. Bajaj
,
S.M. Sinha
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 319 KB
Your tags:
english, 1986
15
Cost-benefit analysis of a multi-component standby system with inspection and slow switch
Rakesh Gupta
,
C.P. Bajaj
,
S.M. Sinha
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 224 KB
Your tags:
english, 1986
16
An algorithm for determining the most reliable path of a network
V.K. Jain
,
Krishna Gopal
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 156 KB
Your tags:
english, 1986
17
Stochastic behaviour of a two-unit cold standby redundant system with administrative delay and two types of repairs
D.K. Pandey
,
N.K. Jaiswal
,
S.M. Gupta
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 260 KB
Your tags:
english, 1986
18
Map differentiation of switching functions
Ali M. Rushdi
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 531 KB
Your tags:
english, 1986
19
Optimum burn-in time: Model and application
Torky I. Sultan
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 217 KB
Your tags:
english, 1986
20
Eigenvalue-eigenvector solutions for two general markov models in reliability
L.Ensign Johnson
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 515 KB
Your tags:
english, 1986
21
Optimal inspection policy with two types of imperfect inspection probabilities
Naoto Kaio
,
Shunji Osaki
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 222 KB
Your tags:
english, 1986
22
Materials quality assurance for VLSI manufacturing
Henry J. Kohoutek
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 642 KB
Your tags:
english, 1986
23
First failure time of dependent parallel systems with safety periods
J.George Shanthikumar
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 538 KB
Your tags:
english, 1986
24
Utilization of symmetric switching functions in the computation of k-out-of-n system reliability
Ali M. Rushdi
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 536 KB
Your tags:
english, 1986
25
Longterm performance studies of electronic components at rated electrical stress
J.S. Bora
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 123 KB
Your tags:
english, 1986
26
Repairable Systems Reliability Modeling, Inference, Misconceptions and Their Causes: Authors: Harold Ascher and Harry Feingold Publishers: Marcel Dekker, Inc., 270, Madison Avenue, New York, N.Y. 10016, United States of America and Hutgasse 4, Postfach 812, CH-4001, Basel, Switzerland. Price: $ 45. 00 (U.S. and Canada) $ 54. 00 (All other countries) (ISBN 0-8247-7276-8). 1984
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 56 KB
Your tags:
english, 1986
27
Human Reliability with Human Factors: Author: Balbir S. Dhillon Publishers: Pergamon Press, Inc., Maxwell House, Fairview Park, Elmsford, New York 10523, United States of America and Headington Hill Hall, Oxford OX3 OBW. Price: U.S. $ 24. 50. (ISBN 0-08-033981-6) Publication 1986
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1986
28
4558346 Highly reliable hermetically sealed package for a semiconductor device
Susumu Kida
,
Hayato Usami
,
Hideji Aoki
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1986
29
4564394 Preventing lateral oxide growth by first forming nitride layer followed by a composite masking layer
Egon Bussmann
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1986
30
4564416 Method for producing a semiconductor device
Kazumoto Homma
,
Masaharu Watanabe
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1986
31
4564807 Method of judging carrier lifetime in semiconductor devices
Hiroyuk Ikezi
,
RichardL Freeman
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 171 KB
Your tags:
english, 1986
32
4564922 Postage meter with power-failure resistant memory
Arno Muller
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1986
33
4566104 Testing digital electronic circuits
GeorgeM Bradshaw
,
PeterL.L. Desyllas
,
Keit McLaren
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1986
34
4566184 Process for making a probe for high speed integrated circuits
J Aiden Higgins
,
Emory Walton
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1986
35
4566940 Manufacturing process for semiconductor integrated circuits
Manabu Itsumi
,
Kohei Ehara
,
Susumu Muramoto
,
Seitaro Matsuo
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1986
36
4567428 Detection of catastrophic failure of dielectric improper connection, and temperature of a printed circuit assembly via one wire
TerryB Zbinden
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 105 KB
Your tags:
english, 1986
37
4567432 Apparatus for testing integrated circuits
DouglasA Buol
,
DeanN Mize
,
John Pattschull
,
Robert Wallace
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 105 KB
Your tags:
english, 1986
38
4567433 Complex probe card for testing a semiconductor wafer
Masao Ohkubo
,
Yasur Yoshimitsu
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 105 KB
Your tags:
english, 1986
39
4567580 Redundancy roll call technique
RameshC Varshney
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 105 KB
Your tags:
english, 1986
40
4567592 Method and apparatus for the stepwise static testing of the respective connections and integrated subsystems of a microprocessor-based system for use by the general public
Jean Minicilli
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1986
41
4570231 Fault finder
RichardH Bunch
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1986
42
4571093 Method of testing plastic-packaged semiconductor devices
G Eugene Gottlieb
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1986
43
4571707 Memory circuit with improved redundant structure
Takayuki Watanabe
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1986
44
4572853 Resin encapsulation type semiconductor device
Hirotoshi Ikeya
,
Shuichi Suzuki
,
Takayuki Oguni
,
Kazutaka Matsumoto
,
Akiko Hatanaka
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1986
45
4573146 Testing and evaluation of a semiconductor memory containing redundant memory elements
AndrewC Graham
,
RobertJ Proebsting
,
Dennis Segers
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 73 KB
Your tags:
english, 1986
46
8505733 High density IC module assembly
JamesE Drye
,
JackA Schroeder
,
VernH Winchell II
Journal:
Microelectronics Reliability
Year:
1986
Language:
english
File:
PDF, 73 KB
Your tags:
english, 1986
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