Volume 28; Issue 2

Microelectronics Reliability

Volume 28; Issue 2

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 127 KB

english, 1988

2

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 413 KB

english, 1988

3

Reliability Centered Maintenance

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 31 KB

english, 1988

4

Liability aspects of procurement contracts

Richard M. Jacobs, Lawrence A. Hoffman

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 571 KB

english, 1988

5

On the correlation between inter-arrival delays of shocks

Suddhendu Biswas, Vijay Kumar Sehgal

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 216 KB

english, 1988

6

Fault tolerance in N-MOS random access memories with dynamic redundancy methods

R.Venkatapathi Naidu, S. Mahapatra

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 620 KB

english, 1988

7

A k-out-of-N:G redundant system with dependent failure rates and common-cause failures

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 141 KB

english, 1988

8

Changes in electrical characteristics of AlTi contacts on silicon

G. Brezeanu, D. Dascalu, P.A. Dan, S. Negru, V. Traistaru

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 657 KB

english, 1988

9

Reliability analysis of the feeding system in the paper industry

Dinesh Kumar, I.P. Singh, Jai Singh

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 153 KB

english, 1988

10

Bayesian inference in mixtures of two exponentials

M. Pandey, S.K. Upadhyay

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 325 KB

english, 1988

11

On simulation of resist profiles in electron beam lithography

P.R. Deshmukh, N.K.L. Raja, W.S. Khokle

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 354 KB

english, 1988

12

Microprocessor controlled pre-, post- and instant-gauging with corrective feedback for automatic grinding and cutting machines in line production

P.S. Tiwari, K.L. Sharma

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 356 KB

english, 1988

13

An efficient solution procedure for transient Markov processes

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 199 KB

english, 1988

14

Electromigration on oxide steps

Andreas Wild, Markos Triantafyllou

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 1.23 MB

english, 1988

15

Probabilistic properties of the exponential distribution

Lawrence M. Leemis

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 160 KB

english, 1988

16

Trafficability and reliability analysis for the digital switching network

Kang W. Lee, Jae J. Suh, Hun Lee

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 310 KB

english, 1988

17

An algorithm for fault-tree probabilities using the factoring theorem

Lavon B. Page, Jo Ellen Perry

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 984 KB

english, 1988

18

Optimum planned policies with minimal repair

Naoto Kaio, Shunji Osaki

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 219 KB

english, 1988

19

Metastable states in asynchronous digital systems: Avoidable or unavoidable?

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 694 KB

english, 1988

20

Effect of statistical dependencies in strict consecutive-k-out-of-n:F systems

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 332 KB

english, 1988

21

GERT analysis of two-stage attribute sampling plans based on an exponential failure model

H.R. Singh, Gauri Shankar

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 167 KB

english, 1988

22

The physics of VLSI systems: Author: Robert W. Keyes. Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ. England. Price: £ 19.95. (ISBN 0-201-15402-1)

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 48 KB

english, 1988

23

Failure mechanisms in semiconductor devices: Authors: E.A. Amerasekera and D.S. Campbell. Publishers: John Wiley and Sons Limited, Baffins Lane, PO19 1UD. Chichester, West Sussex, England. Price: £ 19.95. (ISBN 0-471-91434-7)

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 102 KB

english, 1988

24

Computer aids for VLSI design: Author: Steven M. Rubin. Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ, England. Price: £ 24.95. (ISBN 0-201-05824-3)

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 112 KB

english, 1988

25

CMOS3cell library: Author: Dennis V. Heibuch Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ, England. Price: £ 49.95. (ISBN 0-201-11257-4)

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 104 KB

english, 1988

26

4686468 Contact set for test apparatus for testing integrated circuit package

Kenneth Lee, ErnestL Kallander

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 88 KB

english, 1988

27

4686606 Device for cooling integrated circuit chip

Minoru Yamada, Mitsuru Usui, Akira Masaki, Keiichiro Nakanishi, Masahide Tokuda

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 88 KB

english, 1988

28

4687988 Weighted random pattern testing apparatus and method

EdwardB Eichelberger, RogerN Langmaid, Eric Lindbloom, Franco Motika, John Sinchak, JohnA Waicukauski

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 180 KB

english, 1988

29

4688223 Weighted random pattern testing apparatus and method

Franco Motika, JohnA Waicukauski

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 92 KB

english, 1988

30

4691287 IC device and a system for testing the same

Soichi Suzuki, Mitsuo Aihara, Mitsuo Fujii

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 92 KB

english, 1988

31

4691301 Semiconductor memory with redundant column circuitry

DanielF Anderson

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 92 KB

english, 1988

32

4691831 IC test equipment

Kempei Suzuki, Yushi Iwanag, Hiroshi Sato, Kohei Satoo, Noriyuk Igarashi, Shinichi Koya

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 94 KB

english, 1988

33

4692694 Load testing apparatus for electronic components

Satoru Yokoi, Hirokazu Kondo

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 94 KB

english, 1988

34

4692904 Semiconductor integrated circuit device

Nobuyuki Sato, Kazuaki Ujiie, Masaaki Terasawa, Shinji Nabetani

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 94 KB

english, 1988

35

4692923 Fault tolerant memory

AlanD Poeppelman

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 186 KB

english, 1988

36

4693777 Apparatus for producing semiconductor devices

Shigeki Hazano, Masahir Shibagaki, Hidetaka Jyo, Reiichiro Sensui, Munenori Iwami, Noboru Suzuki

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 93 KB

english, 1988

37

4694193 Fault recognition circuit for parallel power supply devices feeding a user

Manfred Schlenk, PN Chadwick

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 93 KB

english, 1988

38

4694242 Integrated circuit tester and remote pin electronics therefor

JohnL Peterson, Mavin Swapp

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 93 KB

english, 1988

39

4694372 Circuit diagnosis and control device

Jean-Paul Sibeud

Journal:

Microelectronics Reliability

Year:

1988

Language:

english

File:

PDF, 128 KB

english, 1988

40

Erratum

Journal:

Microelectronics Reliability

Year:

1988

File:

PDF, 18 KB

1988