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Volume 28; Issue 2
Main
Microelectronics Reliability
Volume 28; Issue 2
Microelectronics Reliability
Volume 28; Issue 2
1
Calendar of international conferences, symposia, lectures and meetings of interest
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1988
2
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 413 KB
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english, 1988
3
Reliability Centered Maintenance
H. Reiche
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 31 KB
Your tags:
english, 1988
4
Liability aspects of procurement contracts
Richard M. Jacobs
,
Lawrence A. Hoffman
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 571 KB
Your tags:
english, 1988
5
On the correlation between inter-arrival delays of shocks
Suddhendu Biswas
,
Vijay Kumar Sehgal
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 216 KB
Your tags:
english, 1988
6
Fault tolerance in N-MOS random access memories with dynamic redundancy methods
R.Venkatapathi Naidu
,
S. Mahapatra
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 620 KB
Your tags:
english, 1988
7
A k-out-of-N:G redundant system with dependent failure rates and common-cause failures
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 141 KB
Your tags:
english, 1988
8
Changes in electrical characteristics of AlTi contacts on silicon
G. Brezeanu
,
D. Dascalu
,
P.A. Dan
,
S. Negru
,
V. Traistaru
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 657 KB
Your tags:
english, 1988
9
Reliability analysis of the feeding system in the paper industry
Dinesh Kumar
,
I.P. Singh
,
Jai Singh
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 153 KB
Your tags:
english, 1988
10
Bayesian inference in mixtures of two exponentials
M. Pandey
,
S.K. Upadhyay
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 325 KB
Your tags:
english, 1988
11
On simulation of resist profiles in electron beam lithography
P.R. Deshmukh
,
N.K.L. Raja
,
W.S. Khokle
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 354 KB
Your tags:
english, 1988
12
Microprocessor controlled pre-, post- and instant-gauging with corrective feedback for automatic grinding and cutting machines in line production
P.S. Tiwari
,
K.L. Sharma
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 356 KB
Your tags:
english, 1988
13
An efficient solution procedure for transient Markov processes
D. Eddaifi
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 199 KB
Your tags:
english, 1988
14
Electromigration on oxide steps
Andreas Wild
,
Markos Triantafyllou
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 1.23 MB
Your tags:
english, 1988
15
Probabilistic properties of the exponential distribution
Lawrence M. Leemis
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 160 KB
Your tags:
english, 1988
16
Trafficability and reliability analysis for the digital switching network
Kang W. Lee
,
Jae J. Suh
,
Hun Lee
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 310 KB
Your tags:
english, 1988
17
An algorithm for fault-tree probabilities using the factoring theorem
Lavon B. Page
,
Jo Ellen Perry
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 984 KB
Your tags:
english, 1988
18
Optimum planned policies with minimal repair
Naoto Kaio
,
Shunji Osaki
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 219 KB
Your tags:
english, 1988
19
Metastable states in asynchronous digital systems: Avoidable or unavoidable?
R. Männer
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 694 KB
Your tags:
english, 1988
20
Effect of statistical dependencies in strict consecutive-k-out-of-n:F systems
Ali M. Rushdi
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 332 KB
Your tags:
english, 1988
21
GERT analysis of two-stage attribute sampling plans based on an exponential failure model
H.R. Singh
,
Gauri Shankar
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 167 KB
Your tags:
english, 1988
22
The physics of VLSI systems: Author: Robert W. Keyes. Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ. England. Price: £ 19.95. (ISBN 0-201-15402-1)
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 48 KB
Your tags:
english, 1988
23
Failure mechanisms in semiconductor devices: Authors: E.A. Amerasekera and D.S. Campbell. Publishers: John Wiley and Sons Limited, Baffins Lane, PO19 1UD. Chichester, West Sussex, England. Price: £ 19.95. (ISBN 0-471-91434-7)
D.J.S.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 102 KB
Your tags:
english, 1988
24
Computer aids for VLSI design: Author: Steven M. Rubin. Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ, England. Price: £ 24.95. (ISBN 0-201-05824-3)
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 112 KB
Your tags:
english, 1988
25
CMOS3cell library: Author: Dennis V. Heibuch Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ, England. Price: £ 49.95. (ISBN 0-201-11257-4)
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1988
26
4686468 Contact set for test apparatus for testing integrated circuit package
Kenneth Lee
,
ErnestL Kallander
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
27
4686606 Device for cooling integrated circuit chip
Minoru Yamada
,
Mitsuru Usui
,
Akira Masaki
,
Keiichiro Nakanishi
,
Masahide Tokuda
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
28
4687988 Weighted random pattern testing apparatus and method
EdwardB Eichelberger
,
RogerN Langmaid
,
Eric Lindbloom
,
Franco Motika
,
John Sinchak
,
JohnA Waicukauski
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 180 KB
Your tags:
english, 1988
29
4688223 Weighted random pattern testing apparatus and method
Franco Motika
,
JohnA Waicukauski
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1988
30
4691287 IC device and a system for testing the same
Soichi Suzuki
,
Mitsuo Aihara
,
Mitsuo Fujii
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1988
31
4691301 Semiconductor memory with redundant column circuitry
DanielF Anderson
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1988
32
4691831 IC test equipment
Kempei Suzuki
,
Yushi Iwanag
,
Hiroshi Sato
,
Kohei Satoo
,
Noriyuk Igarashi
,
Shinichi Koya
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1988
33
4692694 Load testing apparatus for electronic components
Satoru Yokoi
,
Hirokazu Kondo
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1988
34
4692904 Semiconductor integrated circuit device
Nobuyuki Sato
,
Kazuaki Ujiie
,
Masaaki Terasawa
,
Shinji Nabetani
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1988
35
4692923 Fault tolerant memory
AlanD Poeppelman
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 186 KB
Your tags:
english, 1988
36
4693777 Apparatus for producing semiconductor devices
Shigeki Hazano
,
Masahir Shibagaki
,
Hidetaka Jyo
,
Reiichiro Sensui
,
Munenori Iwami
,
Noboru Suzuki
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1988
37
4694193 Fault recognition circuit for parallel power supply devices feeding a user
Manfred Schlenk
,
PN Chadwick
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1988
38
4694242 Integrated circuit tester and remote pin electronics therefor
JohnL Peterson
,
Mavin Swapp
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1988
39
4694372 Circuit diagnosis and control device
Jean-Paul Sibeud
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 128 KB
Your tags:
english, 1988
40
Erratum
Journal:
Microelectronics Reliability
Year:
1988
File:
PDF, 18 KB
Your tags:
1988
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