Volume 29; Issue 1

Microelectronics Reliability

Volume 29; Issue 1
1

Editorial Board

Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 84 KB
english, 1989
2

RAM/COST special edition

G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 23 KB
english, 1989
3

Economic design of maintained reliability systems

Celestine A. Ntuen
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 201 KB
english, 1989
4

Cost-space optimal (N∗, m, n∗) parallel-series systems

N. Venugopal, Y. Krishna Reddy, M. Meenakshi Bai
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 379 KB
english, 1989
5

Optimal repair stage for K-out-of-N systems

N. Venugopal, S. Shaffi Ahamed, C. Rami Reddy
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 183 KB
english, 1989
7

Economic analysis of the M/M/R machine repair problem with warm standbys

B.D. Sivazlian, K.H. Wang
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 407 KB
english, 1989
11

Optimum scheduling of a new maintenance program under stochastic degradation

B.D. Sivazlian
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 433 KB
english, 1989
12

A simple approximation for IFR weibull renewal functions

Mark L. Spearman
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 358 KB
english, 1989