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Volume 29; Issue 1
Main
Microelectronics Reliability
Volume 29; Issue 1
Microelectronics Reliability
Volume 29; Issue 1
1
Editorial Board
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1989
2
RAM/COST special edition
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 23 KB
Your tags:
english, 1989
3
Economic design of maintained reliability systems
Celestine A. Ntuen
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 201 KB
Your tags:
english, 1989
4
Cost-space optimal (N∗, m, n∗) parallel-series systems
N. Venugopal
,
Y. Krishna Reddy
,
M. Meenakshi Bai
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 379 KB
Your tags:
english, 1989
5
Optimal repair stage for K-out-of-N systems
N. Venugopal
,
S. Shaffi Ahamed
,
C. Rami Reddy
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 183 KB
Your tags:
english, 1989
6
Profit evaluation of a two unit cold standby system with random appearance and disappearance time of the service facility
S.K. Singh
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 227 KB
Your tags:
english, 1989
7
Economic analysis of the M/M/R machine repair problem with warm standbys
B.D. Sivazlian
,
K.H. Wang
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 407 KB
Your tags:
english, 1989
8
Network reliability and availability analysis to minimize downtime costs for communication networks
Simin Pulat
,
Lawrence Leemis
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 377 KB
Your tags:
english, 1989
9
Optimal replacement time of an equipment via simulation for truncated failure distributions
K.S. Venkatakrishnan
,
S. Venmathi
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 222 KB
Your tags:
english, 1989
10
The calculation of the present worth single payment factors for reliability systems when life cycle is arbitrary
Celestine A. Ntuen
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 203 KB
Your tags:
english, 1989
11
Optimum scheduling of a new maintenance program under stochastic degradation
B.D. Sivazlian
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 433 KB
Your tags:
english, 1989
12
A simple approximation for IFR weibull renewal functions
Mark L. Spearman
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 358 KB
Your tags:
english, 1989
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