Volume 29; Issue 3

Microelectronics Reliability

Volume 29; Issue 3
1

Editorial

A. Balogh
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 118 KB
english, 1989
2

Human errors: A review

B.S. Dhillon
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 430 KB
english, 1989
3

Design of test architectures for VLSI devices

Manfred Gerner
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 717 KB
english, 1989
4

ASIC Q&R, plans & experiences

Pentti Jääskeläinen
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 132 KB
english, 1989
5

Evaluation of exchange service inaccessibility

N.B. Sutorikhin
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 356 KB
english, 1989
6

Performance assessment of AT&T international switched voice services

Venkita N. Seshadri, C.G. Savolaine
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 460 KB
english, 1989
7

Computer-aided prediction of failure rates for complex electronic telecommunication systems

R. Nitsch
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 332 KB
english, 1989
9

An approach to fault-tolerant system reliability modelling

Zoran Pavlović, Predrag Rakić
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 356 KB
english, 1989
10

Reliability measurement of microprocessors based on functional testing

Axel Hunger
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 335 KB
english, 1989
11

FUNTEST — Functional testgeneration for VLSI-circuits and systems

W. Geisselhardt, W. Mohrs, U. Moeller
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 480 KB
english, 1989
12

Bridging the gap between design and test

Gerald L. Kuzel, Heinz Bonnenberg
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 461 KB
english, 1989
13

Instabilities in MOS transistors

N. Stojadinović, S. Dimitrijev
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 558 KB
english, 1989
15

Optimum topological layout of communication networks

F. Beichelt, A. Stark
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 233 KB
english, 1989
16

A general approach to optimal process control

E.v. Collani
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 279 KB
english, 1989
17

Further applications of fuzzy logic to reliability assessment and safety analysis

A.Z. Keller, C. Kara-Zaitri
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 294 KB
english, 1989
18

Reliability data — A practical view

Roger Guitard
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 487 KB
english, 1989
19

Reliability prediction with MIL handbook and field data collection in FMSs and robotics

Daniele Salini
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 213 KB
english, 1989
20

Allocation of dependability to the telecommunication network

Peter Dirke
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 234 KB
english, 1989
21

Comparative analysis of network reliability algorithms

Srdjan Holovac
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 337 KB
english, 1989
22

Study of local area networks using Petri nets

T. Nowicki, E. Wilczkowiak
Journal:
Microelectronics Reliability
Year:
1989
Language:
english
File:
PDF, 295 KB
english, 1989