Volume 32; Issue 6

Microelectronics Reliability

Volume 32; Issue 6

1

A weighted estimator for the scale parameter of an exponential distribution

G.C. Mishra, B.N. Pandey

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 156 KB

english, 1992

2

Burn-in to improve which measure of reliability?

Frank Guess, Esteban Walker, Dorinda Gallant

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 304 KB

english, 1992

3

Reliability of a reparable system with preventive maintenance and imperfect switch

M.A.W. Mahmoud, M.M. Mohie El-Din, M.E. Moshref

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 280 KB

english, 1992

4

The determination of zero temperature coefficient point in CMOS transistors

Z.D. Prijić, S.S. Dimitrijev, N.D. Stojadinović

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 289 KB

english, 1992

5

Cost analysis of a two-unit chargeable standby system with interchangeable units and two types of failure

L.R. Goel, P.K. Tyagi, Rakesh Gupta

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 255 KB

english, 1992

6

Stochastic analysis of a xenix operating computer system with two down modes

L.R. Goel, Rakesh Gupta, V.S. Rana

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 595 KB

english, 1992

7

A warm standby redundant system with correlated failures and repairs

L.R. Goel, Preeti Shrivastava

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 259 KB

english, 1992

8

A stochastic model of a system with two phases of operation

S.E. Moafi B., L.R. Goel, Rakesh Gupta

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 273 KB

english, 1992

9

Time-dependent queueing model having heterogeneous servers

Miss Sharda, Prem Chand Garg

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 228 KB

english, 1992

10

Asymptotic behaviour of a multiple parallel system attended by a multiple repairstation

E.J. Vanderperre

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 148 KB

english, 1992

11

Approximated reliability of r-out-of-n(F) system with common cause failure and maintenance

Toshimitsu Hidaka

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 536 KB

english, 1992

12

Ascertaining the value of reliability for a software package before release

K.K. Aggarwal, Yogesh Singh

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 188 KB

english, 1992

13

Optimal replacement policy for a warrantied system with imperfect preventive maintenance operations

Young Ho Chun, Chang Shin Lee

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 219 KB

english, 1992

14

Mean life of k-to-l-out-of-n systems with nonidentical Weibull distribution components

Hoang Pham, Hanh K. Phan

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 180 KB

english, 1992

15

The reliability of a dynamic warm standby redundant system of n components with imperfect switching

Mustafa M. Alidrisi

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 258 KB

english, 1992

16

Analyzing the effect of permanent, intermittent and transient faults on a gracefully degrading microcomputer

Cristian Constantinescu

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 288 KB

english, 1992

17

Reliability knowledge and fractal evaluation of chaos

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 471 KB

english, 1992

18

Asymptotic analysis of a heterogeneous renewable complex system with random environments

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 422 KB

english, 1992

19

Electromigration behavior analysis of aluminum alloys thin film conductors using maximum likelihood methods

E.A. Weis, E. Kinsbron, M.M. Snyder, B. Vogel, N. Croitoru

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 683 KB

english, 1992