Volume 33; Issue 6

Microelectronics Reliability

Volume 33; Issue 6

1

Probabilistic analysis of a two-stage production system subject to inspection at first stage and initial buffer

M.N. Gopalan, T. Srinivasa

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 650 KB

english, 1993

2

Reliability of polysilicon thin film resistors with irreversible resistance transition

D.M. Petković, N.D. Stojadinović

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 1.34 MB

english, 1993

3

Analysis of a standby system with Rayleigh down time and gamma failure time distributions

Rakesh Gupta, Alka Chaudhary

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 245 KB

english, 1993

4

Queue dependent probabilistic additional space heterogeneous queueing problem

K.K. Bansal, R.L. Garg

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 260 KB

english, 1993

5

Determination of software release instant using a nonhomogeneous error detection rate model

K.K. Aggarwal, Yogesh Singh

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 334 KB

english, 1993

6

Bayesian analysis of system availability

K.K. Sharma, R.K. Bhutani

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 179 KB

english, 1993

7

On the reliability of links in a ring network

Eltayeb Salih Abuelyaman

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 469 KB

english, 1993

8

Extensions to the Sherif-Dear Simple (SDS) theorem in number theory

Yosef S. Sherif, Roger G. Dear

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 200 KB

english, 1993

9

Two characterizations of geometric distributions

A.Y. Yehia, A.N. Ahmed

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 305 KB

english, 1993

10

Kinetics of red AlGaAs light-emitting diodes degradation

T.V. Torchinskaya

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 477 KB

english, 1993

11

On estimation for mixtures of two Rayleigh distribution with censoring

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 275 KB

english, 1993

12

Dynamics of spin coating on very rough surfaces

M. Hershcovitz, I.E. Klein

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 454 KB

english, 1993

13

Reliability survival equivalence

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 514 KB

english, 1993

14

FACE: A failure analysis and characterization environment for E-beam testing

J.P. Pierrel, D. May, L. Bourdin

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 611 KB

english, 1993

15

Inaccuracy and the best 1:1 code

P.K. Bhatia, H.C. Taneja, R.K. Tuteja

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 175 KB

english, 1993

16

Bayes interval for the Weibull parameters utilizing guessed estimates

S.K. Singh, Umesh Singh, S.K. Upadhyay

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 240 KB

english, 1993

17

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 216 KB

english, 1993

18

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 107 KB

english, 1993