Volume 34; Issue 2

Microelectronics Reliability

Volume 34; Issue 2

1

Accelerated hot electron effects in DRAMs

Tony T. Yuliasto, Joseph H. Nevin, H.Thurman Henderson

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 194 KB

english, 1994

2

Interrelationship between queueing models with balking and reneging and machine repair problem with warm spares

Surendra M. Gupta

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 300 KB

english, 1994

3

Residual lifetime distribution and its applications

M.M. Siddiqui, M. Çaǧlar

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 555 KB

english, 1994

4

Reliability physics of electronic devices through material characterization and environmental stress testing techniques

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 551 KB

english, 1994

5

Reliability bounds and tolerance limits of two inverse Gaussian models

Loon Ching Tang, Dong Shang Chang

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 402 KB

english, 1994

6

Critical time of the lognormal distribution

Dong Shang Chang

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 167 KB

english, 1994

7

Polygon-to-chain reductions work for networks with imperfect vertices

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 466 KB

english, 1994

8

Parametric what-if analysis in MTTF: A single-run Monte-Carlo-based approach

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 345 KB

english, 1994

9

Reliability enhancement by the reversal of token for a basic token ring in the case of a single component failure

Rabindra Nath Chakraborty, Ece Yaprak, Lisa Anneberg

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 234 KB

english, 1994

10

Probability analysis of a 2-out-of-n: F system with common cause failure, multiple failure and dependent failure

Koosuke Harada, Toshimitsu Hidaka

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 268 KB

english, 1994

11

Design and analysis of a fault-tolerant reconfigurable random access memory chip

Kamal A. Mehdi, J.M. Kontoleon

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 604 KB

english, 1994

12

Comparing of system reliabilities of repairable coherent systems in a changing environment

Yonglu Deng, Bihai Tang

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 236 KB

english, 1994

13

Modeling and analysis of standby redundant computing systems

N.R. Chaganty, R. Mukkamala

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 440 KB

english, 1994

14

A new hardware-based fault-tolerant clock synchronization scheme for real-time multiprocessor systems

Yunju Baek, Heung-Kyu Lee, Kiyeol Ryu

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 512 KB

english, 1994

15

Bayes prediction results for the inverse gaussian distribution utilizing guess values of parameters

S.K. Upadhyay, R. Agrawal, U. Singh

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 276 KB

english, 1994

16

Reliability analysis of a repairable system without being repaired “as good as new”

Wu Shao-Ming, Huang Ren, Wan De-jun

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 200 KB

english, 1994

17

Quality assessment criteria in C++ classes

Kyu Jung Han, Jung-Mo Yoon, Jeong Ah Kim, Kyung Whan Lee

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 567 KB

english, 1994

18

Reliability analysis of the naphtha fuel oil system in a thermal power plant

Sudhakar Kaushik, I.P. Singh

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 178 KB

english, 1994

19

A system with pre-inspection and two types of repairman

R.K. Tuteja, S.C. Malik

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 269 KB

english, 1994

20

Analysis of posterior availability distributions of series and parallel systems

K.K. Sharma, R.K. Bhutani

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 206 KB

english, 1994

21

Analysis of a standby system with dependent repair time and slow switching device

L.R. Goel, P.K. Tyagi, Rakesh Gupta

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 180 KB

english, 1994

22

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1994

Language:

english

File:

PDF, 93 KB

english, 1994