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Volume 34; Issue 3
Main
Microelectronics Reliability
Volume 34; Issue 3
Microelectronics Reliability
Volume 34; Issue 3
1
Forecasting time-dependent failure rates of systems operating in series and/or in parallel
N. Singh
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 499 KB
Your tags:
english, 1994
2
Time series analyses of the estimated reliability of systems composed of components operating in series and/or in parallel
N. Singh
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 593 KB
Your tags:
english, 1994
3
Sharp bounds for the mean time to failure (MTTF) using partial moments
Vasanthakumar N. Bhat
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 222 KB
Your tags:
english, 1994
4
Common-cause failure analysis of a k-out-of-n:G system with repairable units
B.S. Dhillon
,
O.C. Anude
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 449 KB
Your tags:
english, 1994
5
Development of statistical theory in reliability engineering: A survey
A.M. Abouammoh
,
I.S. Qamber
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 682 KB
Your tags:
english, 1994
6
Comparison of three-state probabilities under steady-state and transient conditions using both Laplace Transforms and Flow-Graph Methods, when applied to four TVA models
Isa S. Qamber
,
Samir Q. Fakhro
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 390 KB
Your tags:
english, 1994
7
Enumeration of minimal paths of modified networks
J.M. Nahman
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 287 KB
Your tags:
english, 1994
8
A necessary condition for optimal consecutive-k-out-of-n:G system design
Jiankai Shen
,
Ming J. Zuo
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 297 KB
Your tags:
english, 1994
9
Building-in reliability for silver die attached light emitting diodes
W.K. Chim
,
K.Y. Chong
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 772 KB
Your tags:
english, 1994
10
Bayesian sequential estimation of two parameters of a Weibull distribution
K.P. Soman
,
Krishna B. Misra
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 349 KB
Your tags:
english, 1994
11
An M/G/1 queueing system with additional optional service and no waiting capacity
K.C. Madan
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 242 KB
Your tags:
english, 1994
12
An optimal imperfect maintenance policy over a warranty period
N. Jack
,
J.S. Dagpunar
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 178 KB
Your tags:
english, 1994
13
System life data analysis with dependent partial knowledge on the exact cause of system failure
Dennis K.J. Lin
,
Frank M. Guess
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 324 KB
Your tags:
english, 1994
14
Availability study of ETRR-1 primary cooling system
A.M. El Messiry
,
Kh.M. El Said
,
M.A. Gaafar
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 385 KB
Your tags:
english, 1994
15
A technique of realization for one class of two-testable k-valued logic elements
A.I. Timoshkin
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 234 KB
Your tags:
english, 1994
16
Enumeration of node cutsets for an s-t network
Brijendra Singh
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 178 KB
Your tags:
english, 1994
17
Mathematical analysis of a transitional computer communication system
V.S. Rana
,
R.K. Agnihotri
,
Vipin Kumar
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 280 KB
Your tags:
english, 1994
18
Reliability of single stress under n-strengths of life distribution
T.S. Uma Maheswari
,
A. Rekha
,
A.C.N. Raghavachar
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 175 KB
Your tags:
english, 1994
19
The reliability, availability and productiveness of systems: Authors: D. J. Sherwin and A. Bossche Publishers: Chapman and Hall 2 – 6 Boundary Row, London, SE1 8HN, England. Price: £ 35.00 (ISBN 0-412-39320-4) (Published 1993)
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 73 KB
Your tags:
english, 1994
20
Process and device modelling for microelectronics: Edited by: G. Baccarani Publishers: Elsevier Science Publishers, B.V. Sara Burgerhartstraat 25, P.O. Box 211, 1000 AE Amsterdam, the Netherlands. also P.O. Box 945, Madison Square Garden, New York, N.Y. 10160-0757, United States of America. Price: Df1. 350.00 (US$ 200.00). (ISBN 0-444-89962-6) Published August 1993
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 66 KB
Your tags:
english, 1994
21
Calendar of international conferences, symposia, lectures and meetings of interest
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 119 KB
Your tags:
english, 1994
22
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 308 KB
Your tags:
english, 1994
1
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