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Volume 35; Issue 8
Main
Microelectronics Reliability
Volume 35; Issue 8
Microelectronics Reliability
Volume 35; Issue 8
1
Evaluation of protocols for availability, reliability and consistency of replicated files
Roger G. Dear
,
Joseph S. Sherif
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 225 KB
Your tags:
english, 1995
2
Reliability of systems with two failure modes by using structure functions
Totsushi Yuge
,
Masafumi Sasaki
,
Shigeru Yanagi
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 403 KB
Your tags:
english, 1995
3
Early-life reliability prediction methodology for integrated circuits
S.S. Menon
,
K.F. Poole
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 687 KB
Your tags:
english, 1995
4
Optimal operation of a markovian queueing system with a removable and non-reliable server
Kuo-Hsiung Wang
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 403 KB
Your tags:
english, 1995
5
A new approach to optimal replacement times for complex systems
Hendrik Schäbe
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 387 KB
Your tags:
english, 1995
6
Using formal methods in a design for reliability as applied to an electronic system that integrates software and hardware to perform a function
B.A.L. Gwandu
,
D.J. Creasey
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 1995
7
World abstracts on microelectronics and reliability
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 2.90 MB
Your tags:
english, 1995
8
Particles on surfaces detection, adhesion, and removal: K. L. MITTAL MARCEL DEKKER, INC., 270 Madison Avenue, NEW YORK, NY 10016, UNITED STATES OF AMERICA. $ 175.00 (ISBN : 0-8247-9535-0) 1995
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 52 KB
Your tags:
english, 1995
9
Practical methods for reliability data analysis (Oxford statistical science series - 14): J.I. ANSELL M.J. PHILLIPS OXFORD UNIVERSITY PRESS, Saxon Way West, CORBY NN18 9ES, England. £ 30.00.(ISBN: 0-19-853664-X). Published 1994.
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1995
10
Calendar of international conferences, symposia, lectures and meetings of interest
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 123 KB
Your tags:
english, 1995
11
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 135 KB
Your tags:
english, 1995
12
An efficient minimizing algorithm for sum of disjoint products
Lian-Chang Zhao
,
Jun-Chen Xu
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 351 KB
Your tags:
english, 1995
13
Analysis of a two unit standby system with preparation time and correlated failures and repairs
L.R. Goel
,
Rakesh Gupta
,
P.K. Tyagi
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 175 KB
Your tags:
english, 1995
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