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Volume 37; Issue 9
Main
Microelectronics Reliability
Volume 37; Issue 9
Microelectronics Reliability
Volume 37; Issue 9
1
MOS technology: Trends and challenges in the ULSI era
Ashwin Shah
,
Ping Yang
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 559 KB
Your tags:
english, 1997
2
MOS device structure development for ULSI: Low power/high speed operation
Woo-Hyeong Lee
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 433 KB
Your tags:
english, 1997
3
Recent advances and trends in numerical techniques for process simulation
W. Joppich
,
S. Mijalković
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.04 MB
Your tags:
english, 1997
4
Special mechanisms in thin-film SOI MOSFETs
F. Balestra
,
S. Cristoloveanu
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 933 KB
Your tags:
english, 1997
5
MOSFET prediction in space environments
I.N. Shvetzov-Shilovsky
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 557 KB
Your tags:
english, 1997
6
Power MOS devices: Structure evolutions and modelling approaches
P. Rossel
,
H. Tranduc
,
G. Charitat
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.18 MB
Your tags:
english, 1997
7
Low loss static induction devices (transistors and thyristors)
H. Tadano
,
M. Ishiko
,
S. Kawaji
,
Y. Taga Toyota
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 599 KB
Your tags:
english, 1997
8
Microelectronics based on compound semiconductors
Hans L. Hartnagel
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 306 KB
Your tags:
english, 1997
9
Progress in high-speed and high-resolution CMOS data converters
Valentino Liberali
,
Simona Brigati
,
Fabrizio Francesconi
,
Franco Maloberti
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 765 KB
Your tags:
english, 1997
10
Intelligence implementation on silicon based on four-terminal device electronics
T. Ohmi
,
T. Shibata
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.06 MB
Your tags:
english, 1997
11
Low temperature characterization of silicon CMOS devices
G. Ghibaudo
,
F. Balestra
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 951 KB
Your tags:
english, 1997
12
Sensor microsystems
R.S. Popovic
,
J.A. Flanagan
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 826 KB
Your tags:
english, 1997
13
Editorial
Ninoslav Stojadinović
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 62 KB
Your tags:
english, 1997
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