Volume 37; Issue 9

Microelectronics Reliability

Volume 37; Issue 9
1

MOS technology: Trends and challenges in the ULSI era

Ashwin Shah, Ping Yang
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 559 KB
english, 1997
2

MOS device structure development for ULSI: Low power/high speed operation

Woo-Hyeong Lee
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 433 KB
english, 1997
3

Recent advances and trends in numerical techniques for process simulation

W. Joppich, S. Mijalković
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.04 MB
english, 1997
4

Special mechanisms in thin-film SOI MOSFETs

F. Balestra, S. Cristoloveanu
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 933 KB
english, 1997
5

MOSFET prediction in space environments

I.N. Shvetzov-Shilovsky
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 557 KB
english, 1997
6

Power MOS devices: Structure evolutions and modelling approaches

P. Rossel, H. Tranduc, G. Charitat
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.18 MB
english, 1997
7

Low loss static induction devices (transistors and thyristors)

H. Tadano, M. Ishiko, S. Kawaji, Y. Taga Toyota
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 599 KB
english, 1997
8

Microelectronics based on compound semiconductors

Hans L. Hartnagel
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 306 KB
english, 1997
10

Intelligence implementation on silicon based on four-terminal device electronics

T. Ohmi, T. Shibata
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.06 MB
english, 1997
11

Low temperature characterization of silicon CMOS devices

G. Ghibaudo, F. Balestra
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 951 KB
english, 1997
12

Sensor microsystems

R.S. Popovic, J.A. Flanagan
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 826 KB
english, 1997
13

Editorial

Ninoslav Stojadinović
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 62 KB
english, 1997