Volume 44; Issue 6

Microelectronics Reliability

Volume 44; Issue 6

1

Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface

Markus P.K Turunen, Pekka Marjamäki, Matti Paajanen, Jouko Lahtinen, Jorma K Kivilahti

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 604 KB

english, 2004

2

Dynamic modeling for resin self-alignment mechanism

J.M. Kim, Y.E. Shin, K. Fujimoto

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 494 KB

english, 2004

3

Reliability of 70 nm metamorphic HEMTs

M. Dammann, A. Leuther, R. Quay, M. Meng, H. Konstanzer, W. Jantz, M. Mikulla

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 307 KB

english, 2004

4

Voltage acceleration and t63.2 of 1.6–10 nm gate oxides

R.-P. Vollertsen, E.Y. Wu

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 415 KB

english, 2004

5

Deformation measurement of RF MEMS switches by optical interference

Yu Ying, Peter Grant

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 524 KB

english, 2004

6

Boundary element analysis of thermal fatigue effects on high power IGBT modules

Z. Khatir, S. Lefebvre

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 678 KB

english, 2004

7

Smart MEMS concept for high secure RF and millimeterwave communications

D. Dubuc, M. Saddaoui, S. Melle, F. Flourens, L. Rabbia, B. Ducarouge, K. Grenier, P. Pons, A Boukabache, L. Bary, A. Takacs, H. Aubert, O. Vendier, J.L. Roux, R. Plana

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 554 KB

english, 2004

8

Rigorous modeling of high-speed semiconductor devices

Vassil Palankovski, Siegfried Selberherr

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 634 KB

english, 2004

9

New observations on intermetallic compound formation in gold ball bonds: general growth patterns and identification of two forms of Au4Al

C.D. Breach, F. Wulff

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 596 KB

english, 2004

10

Operating limits for RF power amplifiers at high junction temperatures

Z. Radivojevic, K. Andersson, J.A. Bielen, P.J. van der Wel, J. Rantala

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 770 KB

english, 2004

11

Oversampled delta-sigma modulators: analysis applications and novel topologies; Mücahit Kozak, Izzet Kale. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 226, plus XII, 112 euro. ISBN 1-4020-7420-4.

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 201 KB

english, 2004

12

FPGA-based Monte Carlo simulation for fault tree analysis

Alireza Ejlali, Seyed Ghassem Miremadi

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 311 KB

english, 2004

13

Representation of the SiGe HBT's thermal impedance by linear and recursive networks

Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 360 KB

english, 2004

14

Effects of annealing on the electric noise in semiconductor lasers

Yingxue Shi, Jing Li, Guijun Hu, Sumei Zhang, Xuedan Wang, Jiawei Shi

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 415 KB

english, 2004

15

Analysis of the reservoir effect on electromigration reliability

Insu Jeon, Young-Bae Park

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 903 KB

english, 2004

16

Wire-bond failure mechanisms in plastic encapsulated microcircuits and ceramic hybrids at high temperatures

Frøydis Oldervoll, Frode Strisland

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 446 KB

english, 2004