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Volume 51; Issue 3
Main
Microelectronics Reliability
Volume 51; Issue 3
Microelectronics Reliability
Volume 51; Issue 3
1
Characteristics of the intrinsic defects in unintentionally doped 4H–SiC after thermal annealing
Ping Cheng
,
Yu-ming Zhang
,
Yi-men Zhang
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 580 KB
Your tags:
english, 2011
2
LDMOSFET with drain potential suppression for 100 V Power IC technology
P. Holland
,
M. Elwin
,
I. Anteney
,
J. Ellis
,
L. Armstrong
,
G. Birchby
,
P. Igic
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 2.74 MB
Your tags:
english, 2011
3
Influence of P3HT:PCBM blend preparation on the active layer morphology and cell degradation
V.S. Balderrama
,
M. Estrada
,
A. Cerdeira
,
B.S. Soto-Cruz
,
L.F. Marsal
,
J. Pallares
,
J.C. Nolasco
,
B. Iñiguez
,
E. Palomares
,
J. Albero
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 338 KB
Your tags:
english, 2011
4
The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers
Robert O’Connor
,
Greg Hughes
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 940 KB
Your tags:
english, 2011
5
Molybdenum and low-temperature annealing of a silicon power P–i–N diode
J. Vobecký
,
V. Komarnitskyy
,
V. Záhlava
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 906 KB
Your tags:
english, 2011
6
Effect of Cr additions on interfacial reaction between the Sn–Zn–Bi solder and Cu/electroplated Ni substrates
Jinglin Bi
,
Anmin Hu
,
Jing Hu
,
Tingbi Luo
,
Ming Li
,
Dali Mao
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.37 MB
Your tags:
english, 2011
7
Device linearity and intermodulation distortion comparison of dual material gate and conventional AlGaN/GaN high electron mobility transistor
Sona P. Kumar
,
Anju Agrawal
,
Rishu Chaujar
,
R.S. Gupta
,
Mridula Gupta
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 783 KB
Your tags:
english, 2011
8
Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors
N.A. Hastas
,
N. Arpatzanis
,
C.A. Dimitriadis
,
J. Brochet
,
F. Templier
,
G. Kamarinos
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 307 KB
Your tags:
english, 2011
9
Orthogonal fault-tolerant systolic arrays for matrix multiplication
I.Ž. Milovanović
,
E.I. Milovanović
,
M.K. Stojčev
,
M.P. Bekakos
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.59 MB
Your tags:
english, 2011
10
Mitigation of permanent faults in adaptive equalizers
P. Reviriego
,
S. Liu
,
J.A. Maestro
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 755 KB
Your tags:
english, 2011
11
RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions
Vladimir Milovanović
,
Ramses van der Toorn
,
Ralf Pijper
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 844 KB
Your tags:
english, 2011
12
Determination of residual strains of the EMC in PBGA during manufacturing and IR solder reflow processes
M.Y. Tsai
,
C.W. Ting
,
C.Y. Huang
,
Yi-Shao Lai
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 2.05 MB
Your tags:
english, 2011
13
Compact modeling of short-channel effects in symmetric and asymmetric 3-T/4-T double gate MOSFETs
Saeed Mohammadi
,
Ali Afzali-Kusha
,
Saeed Mohammadi
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.34 MB
Your tags:
english, 2011
14
Analyses of electromagnetic vibration-based generators fabricated with LTCC multilayer and silver spring-inducer
W.L. Lu
,
Y.M. Hwang
,
C.T. Pan
,
S.C. Shen
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.38 MB
Your tags:
english, 2011
15
On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures
Z. Tekeli
,
M. Gökçen
,
Ş. Altındal
,
S. Özçelik
,
E. Özbay
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 608 KB
Your tags:
english, 2011
16
A self-test and dynamics characterization circuit for MEMS electrostatic actuators
Daniel Fernández
,
Jordi Madrenas
,
Jordi Cosp
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 743 KB
Your tags:
english, 2011
17
Reliability challenges in 3D IC packaging technology
K.N. Tu
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 840 KB
Your tags:
english, 2011
18
Cyclic endurance reliability of stretchable electronic substrates
F. Bossuyt
,
J. Guenther
,
T. Löher
,
M. Seckel
,
T. Sterken
,
J. de Vries
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1012 KB
Your tags:
english, 2011
19
Switch-level emulation of strength-base soft error detection
Reza Sedaghat
,
Reza Javaheri
,
Prabhleen K. Kalkat
,
Jalal Mohammad Chikhe
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 535 KB
Your tags:
english, 2011
20
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic
V.V.N. Obreja
,
C. Codreanu
,
D. Poenar
,
O. Buiu
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 793 KB
Your tags:
english, 2011
21
The influence of solder composition on the impact strength of lead-free solder ball grid array joints
H. Tsukamoto
,
T. Nishimura
,
S. Suenaga
,
S.D. McDonald
,
K.W. Sweatman
,
K. Nogita
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.07 MB
Your tags:
english, 2011
22
Acoustic emission for detecting deterioration of capacitors under aging
Janusz Smulko
,
Kazimierz Józwiak
,
Marek Olesz
,
Lech Hasse
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.14 MB
Your tags:
english, 2011
23
Thermal fracture toughness measurement for underfill during temperature change
Soojae Park
,
Claudius Feger
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 796 KB
Your tags:
english, 2011
24
Current transport mechanisms and trap state investigations in (Ni/Au)–AlN/GaN Schottky barrier diodes
Engin Arslan
,
Serkan Bütün
,
Yasemin Şafak
,
Hüseyin Çakmak
,
Hongbo Yu
,
Ekmel Özbay
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 682 KB
Your tags:
english, 2011
25
ACF particle distribution in COG process
Yee-Wen Yen
,
Chun-Yu Lee
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.45 MB
Your tags:
english, 2011
26
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects
F. Djeffal
,
T. Bentrcia
,
M.A. Abdi
,
T. Bendib
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 379 KB
Your tags:
english, 2011
27
High-cycle fatigue life prediction for Pb-free BGA under random vibration loading
Da Yu
,
Abdullah Al-Yafawi
,
Tung T. Nguyen
,
Seungbae Park
,
Soonwan Chung
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.60 MB
Your tags:
english, 2011
28
Simulation and experimental analysis of large area substrate overmolding with epoxy molding compounds
Thomas Schreier-Alt
,
Frank Rehme
,
Frank Ansorge
,
Herbert Reichl
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 2.00 MB
Your tags:
english, 2011
29
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 38 KB
Your tags:
english, 2011
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