Volume 7; Issue 3

Microelectronics Reliability

Volume 7; Issue 3

1

Precision thin-film resistors for high frequency applications

D.F.A. Maclachlan, V.J. Hammond

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 601 KB

english, 1968

2

Rapid determination of the temperature coefficient of thin-film resistors

A. Engelter, H. Kappetijn

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 195 KB

english, 1968

3

Evaluation of the interfacial resistance of thin film interconnexions

R.T. Galla, H.M. Greenhouse, W.C. Vergara

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 1.61 MB

english, 1968

4

The performance and evaluation of thin film insulating crossovers

W.W. Richardson, H.M. Greenhouse, W.C. Vergara

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 1.26 MB

english, 1968

5

The “pinch” resistor in integrated circuits

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 189 KB

english, 1968

6

Distribution analysis for reliability improvement

Janez J. Barlič

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 222 KB

english, 1968

7

Some results of long term life tests with p-n-p Alloyed Ge-transistors

M.J.O. Strutt, C. Villalaz

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

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PDF, 1018 KB

english, 1968

8

Failure modes of integrated circuits and their relationship to reliability

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 1.23 MB

english, 1968

9

Two experimental methods for the determination of the technical reliabilities of a system and its components

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 60 KB

english, 1968

10

Reliable decisions from unreliable measurements : F. R. van Wagner, Electron. Engr26, No. 4, April (1967), p. 50

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 86 KB

english, 1968

11

Reliability physics for microelectronics : T. J. Nowak, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 193

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 86 KB

english, 1968

12

How accurate are reliability predictions? : A. J. Feduccia and J. Klion, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 280

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 86 KB

english, 1968

13

Reliability and maintainability technical and cost relationships : H. A. Eimstad, Jr., Proc. 1968 Ann. Symp. Reliab. Boston, U.S.A. January (1968), p. 331

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 183 KB

english, 1968

14

Failure mode, effects, and criticality analysis : K. Greene and T. J. Cunningham, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 374

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

15

Analyses of dielectric breakdown in samples and components : R. J. Onufer, C. E. Frahme and D. A. Lupfer, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 335

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

16

In-process control of structural defects in semiconductor manufacture : G. H. Schwuttke. Proc. Int. Symp. Test Methods Measurements Semicond. Dev. (1967), Paper No. 501, p. 1

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

17

Travelling solvent defects on silicon wafers : E. Biedermann, J. Electrochem. Soc.114, No. 2, February (1967), p. 207

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

18

Quality evaluation of welds as they are made by use of a fibre optic-near infrared sensor : S. N. Bobo, Jr., Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 534

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 202 KB

english, 1968

19

Nonelectronic reliability part data collection and analysis : D. Fulton, J. N. Holtz and R. E. Schafer, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 114

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

20

Reliability of microelectronic circuit connections : R. Bryant, M. H. Bester and J. McCormick. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 558

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

21

Further studies into connector field failure data as related to the commercial aviation industry : J. E. Atkinson, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 103

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

22

Predicting integrated circuit reliability via failure mechanisms : D. I. Troxel and B. Tiger. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 217

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 202 KB

english, 1968

23

Semiconductor device life and system removal rates : D. S. Peck, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 593

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

24

What reliability figures can I expect from ICs and how are they derived? : Electron. Des.2, January (1968), p. 108

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

25

Reliability of plastic semiconductors : J. Everitt, Electron. Equip. News, January (1968), p. 34

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

26

Semiconductor radiography: Its strengths, weaknesses and the controls necessary to assure its efficacy : M. M. Roth, Mater. Eval., January (1968), p. 8

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

27

Quality control during resistance welding of electronic components : P. M. Knowlson, Electron. Compon., February (1968), p. 186

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

28

The importance of electric contacts in electronics : H. Hoft, Nachrichtentechnik18, No. 2 (1968), p. 65. (In German.)

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 196 KB

english, 1968

29

Thermische einflusse der schaltfolge auf die lebensdauer des schutzgaskontaktes bei starker induktiver belastung: C. Huber and K. L. Rau, Frequenz22 (1968) 1, p. 17. (In German.)

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

30

Design of digital circuits with respect to their reliability : K. Meyer, Nachrichtentechnik17, No. 8 (1967), p. 312. (In German.)

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

31

Computer partitioning improves long-term reliability in space : M. Ball and F. H. Hardie, Space Aeronaut.47, No. 5, May (1967), p. 114

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

32

Some life-cycle cost estimates for electronic equipments: Methods and results : R. G. Stokes and F. N. Stehle, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 169

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

33

Reliability data from in-flight spacecraft : E. E. Bean and C. E. Bloomquist. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 271

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 199 KB

english, 1968

34

Reliability and maintainability considerations for total ship systems : P. J. Giordano and J. Sacks, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 155

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 102 KB

english, 1968

35

Reliability growth and its upper limit : E. P. Virene, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 265

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 102 KB

english, 1968

36

TIROS: A case history in reliability : R. Hoedemaker, E. Mowle and G. S. Gordon, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 315

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 102 KB

english, 1968

37

System engineering for reliability and ease of maintenance : K. F. Rankin, Radio Electron. Engr, February (1968), p. 67

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 102 KB

english, 1968

38

Ultra reliable submerged repeaters : W. J. Archibald, Electron. Equip. News. February (1968), p. 46

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

39

Thermal analysis of ceramic-based microcircuits : J. H. Martin, V. T. Guntlow and D. P. Burks, Proc. 1967 Electron. Compon. Conf.; Washington DC, p. 354

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

40

Ohmic contacts for GaAs devices : R. H. Cox and H. Strack, Solid-St. Electron.10, (1967), p. 1213

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

41

Diffusion technology in electronics industry : B. L. Sharma, Radio Electron. India, October (1967), p. 15

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 100 KB

english, 1968

42

Field-effect transistor (FET) bibliography : H. F. Storm, IEEE Trans. Electron. Dev.ED 14, No. 10, October (1967), p. 710

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

43

The many facets of gallium arsenide : Electronics, November (1967), p. 105

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

44

A bibliography of metal-insulator-semiconductor studies : E. S. Schlegel, IEEE Trans. Electron. Dev.ED 14, No. 11. November (1967), p. 728

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

45

Microelectronics—another good year and more coming : R. E. Koeper, Electron. Des. News, January (1968), p. 26

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

46

Elastic ceramic material has multi-microcircuit uses : Int. Electron., February/March (1968), p. 15

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 101 KB

english, 1968

47

Transition probability of impact ionization in silicon : S. Ahmad and W. S. Khokley, J. Phys. Chem. Solids28 (1967), p. 2499

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 198 KB

english, 1968

48

Dielectric isolation layers for use in large scale integrated systems : K. C. Bingham and W. R. Cuttell. Proc. 1967 Electron Compon. Conf., Washington DC, p. 371

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

49

A resonant gate transistor, a frequency selective component for integrated circuits : J. R. Davis, R. A. Wickstrom, W. E. Newell. Proc. 1967 Electron. Compon. Conf., Washington, DC, p. 55

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

50

Instability in vacuum deposited silicon oxide : E. J. Swystun, IEEE Trans. Electron. Dev.ED 14, No. 11, November (1967), p. 760

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

51

Diffused diodes in silicon-on-sapphire : D. J. Dumin and R. S. Silver, Solid-St. Electron.11 (1968), p. 353

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

52

Metal-silicon Schottky barriers : M. J. Turner and E. H. Rhoderick, Solid-St. Electron.11. (1968), p. 291

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

53

Electron mobility in polar semiconductors at intermediate and high electric fields : E. de Alba and J. Warman G., J. Phys. Chem. Solids.29, (1968), p. 69

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 199 KB

english, 1968

54

Magnetoreactive element and new solid-state inductor : S. Kataoka, N. Hashizume and S. Iida. Solid-St. Electron.11, (1968), p. 155

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 103 KB

english, 1968

55

Fabrication of planar silicon transistors without photoresist : T. W. O'Keeffe and R. M. Handy. Solid-St. Electron., 11 (1968), p. 261

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 103 KB

english, 1968

56

The Resonistor: A frequency selective device utilizing the mechanical resonance of a silicon substrate : R. J. Wilfinger, P. H. Bardell and D. S. Chabra. IBM J. Res. Dev.12, No. 1, January (1968)

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 103 KB

english, 1968

57

Advances in zone refining : R. H. Heil, Jr.Solid St. Technol., January (1968), p. 21

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

58

Silicon nitride etching : F. Woitsch, Solid St. Technol., January (1968), p. 29

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

59

Analysis of single crystal silicon slices by neutron activation : G. Lunde, Solid St. Technol., January (1968), p. 32

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

60

Diode voltage—Capacitance method for measuring resistivity and impurity profile in a silicon epitaxial layer : D. C. Gupta, Solid St. Technol., February (1968), p. 31

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

61

Silicon device technology : D. H. Roberts, IEEE Spectrum, February (1968), p. 101

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

62

Sputtered thin-film molybdenum resistors : H. J. Degenhart, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 84

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

63

Anodic tantalum oxide capacitors prepared from reactively sputtered tantalum : D. Gerstenberg and J. Klerer, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 77

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 194 KB

english, 1968

64

Thick film field effect transistors based on silk-screened CdS : W. Witt, F. Huber and W. Laznovsky. Proc. 1967 Electron. Compon. Conf., Washington DC, p. 254

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

65

Thin film dielectric capacitors formed by reactive sputtering : R. M. Goldstein and F. W. Leonhard, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 312

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

66

Tantalum thin film “Breadboards” for switching circuit development : W. L. Harrod, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 152

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

67

Thin film hafnium technology : F. Huber, W. Witt and I. H. Pratt, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 66

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

68

Firing characteristics of palladium-silver thick film resistors : R. C. Headley, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 389

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

69

Thallium oxide glaze resistors : F. M. Collins and C. F. Parks, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 432

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

70

Photoconduction and trapping in sputtered tantalum oxide films : F. G. Ullman, J. Phys. Chem. Solids28 (1967), p. 279

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

71

Theory of conduction through thin insulating films with ionic space charge : J. Maserjian, J. Phys. Chem. Solids28 (1967), p. 1957

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

72

Conduction through TiO2 thin films with large ionic space charge : J. Maserjian and C. A. Mead, J. Phys. Chem. Solids28 (1967), p. 1971

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 104 KB

english, 1968

73

Vacuum deposition of silicon on corundum : F. H. Reynolds and A. B. M. Elliot, Solid-St. Electron.10 (1967), p. 1093

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 201 KB

english, 1968

74

Effects of traps on thin film transistors : H. Ishii and K. Yamada, Solid-St. Electron.10 (1967), p. 1201

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

75

Grain size distribution in thin films—I. Conservative systems : B. K. Chakraverty, J. Phys. Chem. Solids28 (1967), p. 2401

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

76

Grain size distribution in thin films—II. Non-conservative systems : B. K. Chakraverty, J. Phys. Chem. Solids. 28 (1967), p. 2413

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

77

Preparation and properties of clean surfaces of aluminum : F. Jona, J. Phys. Chem. Solids28 (1967), p. 2155

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 99 KB

english, 1968

78

Analysis of double-gate thin-film transistor : H. R. Farrah and R. F. Steinberg, IEEE Trans. Electron Dev.ED14, No. 2, February (1967), p. 69

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 194 KB

english, 1968

79

A compatible patterning technique for custom built thin and thick film circuits : W. L. Clough, Electron. Equip. News, June (1967), p. 4

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 97 KB

english, 1968

80

Recent developments in thick-film hybrid modules : E. H. Melan, SCP Solid St. Technol., June (1967), p. 23

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 97 KB

english, 1968

81

Radiation impedance approach to the analysis of a thin film inductor in a microwave integrated circuit : E. Yamashita and R. Mittra. IEEE Jl Solid-St. CircuitsSC2, No. 2, June (1967), p. 47

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 97 KB

english, 1968

82

Properties of insulating thin films deposited by R. F. sputtering : W. A. Pliskin, P. D. Davidse, H. S. Lehman and L. I. Maissel, IBM J., July (1967), p. 461

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 97 KB

english, 1968

83

Galvanomagnetic Thin Film devices : H. Freller and K. G. Gunther, Radio Electron. Engr, August (1967), p. 97

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

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english, 1968

84

New thin-film resistive memory : J. G. Simmons and R. R. Verderber. Radio Electron. Engr, August (1967), p. 81

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 189 KB

english, 1968

85

A thermoelectric servo control for ultra-high-vacuum applications : D. L. Atherton and S. V. Soanes, SCP Solid St. Technol., September (1967), p. 31

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

86

Co-sputtered cermet films : N. C. Miller and G. A. Shirn, SCP Solid St. Technol., September (1967), p. 28

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

87

Demagnetizing fields in thin magnetic films : D. B. Dove, Bell Syst. Tech. J., September (1967), p. 1527

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

88

Vacuum deposition of glass dielectrics : V. J. Hammond and R. G. Hall, Electron. Compon., November (1967), p. 1273

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

89

Thermal limitations of the thin film transistor : D. J. Page, Solid-St. Electron.11 (1968), p. 87

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

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english, 1968

90

A simple non-destructive method of measuring the thickness of transparent thin films between 10 and 600 nm : I. Franz and W. Langheinrich, Solid-St. Electron.11 (1968), p. 59

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

91

Flip-component technology : P. Scharf, T. Coleman and K. Avellar, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 269

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

92

A versatile integrated logarithmic video amplifier : L. E. Sanders and W. S. Henrion, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 173

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

93

A 28 volt logic microcircuit : D. J. Wahl and R. R. Mitchell, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 201

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

94

Power regulation and control using multifunctional integrated circuits : M. L. Embree, P. D. Fisher and B. H. Hamilton, Proc. IEEE55, No. 8, August (1967), p. 1466

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

95

Restoration of high frequencies in photomask line patterns by photographic non-linearity : H. Johnson, SCP Solid St. Technol., July (1967), p. 50

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 98 KB

english, 1968

96

A high accuracy automated microflash camera : R. C. M. Beeh, SCP Solid St. Technol., July (1967), p. 43

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 191 KB

english, 1968

97

Automated mask production for semiconductor technology : H. O. Hook, SCP Solid St. Technol., July (1967), p. 35

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

98

Advances in computer generation of master artwork for micro-miniature circuits : P. R. Strickland and B. J. Crawford, SCP Solid St. Technol., July (1967), p. 31

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

99

A review of process equipment for an integrated circuit facility : V. K. Mitrisin, SCP Solid St. Technol., August (1967), p. 53

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

100

Production techniques for integrated circuits : G. B. Thomas, Electron. Equip. News, September (1967), p. 14

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

101

Diffusion furnaces for semiconductor processing : R. P. Donovan and R. M. Burger, SCP Solid St. Technol., October (1967), p. 40

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

102

Electron beam evaporation of metal oxide dielectric films : F. E. Cariou, V. A. Cajal and M. M. Gajary. Proc. 1967 Electron. Compon. Conf., Washington DC, p. 60

Journal:

Microelectronics Reliability

Year:

1968

Language:

english

File:

PDF, 95 KB

english, 1968

103

Erratum

Journal:

Microelectronics Reliability

Year:

1968

File:

PDF, 11 KB

1968