books search
books
articles search
articles
Donate
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Explore
Journals
Contribution
Donate
Litera Library
Donate paper books
Add paper books
Open LITERA Point
Volume 7; Issue 3
Main
Microelectronics Reliability
Volume 7; Issue 3
Microelectronics Reliability
Volume 7; Issue 3
1
Precision thin-film resistors for high frequency applications
D.F.A. Maclachlan
,
V.J. Hammond
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 601 KB
Your tags:
english, 1968
2
Rapid determination of the temperature coefficient of thin-film resistors
A. Engelter
,
H. Kappetijn
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 195 KB
Your tags:
english, 1968
3
Evaluation of the interfacial resistance of thin film interconnexions
R.T. Galla
,
H.M. Greenhouse
,
W.C. Vergara
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 1.61 MB
Your tags:
english, 1968
4
The performance and evaluation of thin film insulating crossovers
W.W. Richardson
,
H.M. Greenhouse
,
W.C. Vergara
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 1.26 MB
Your tags:
english, 1968
5
The “pinch” resistor in integrated circuits
R.P. O'Grady
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 189 KB
Your tags:
english, 1968
6
Distribution analysis for reliability improvement
Janez J. Barlič
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 222 KB
Your tags:
english, 1968
7
Some results of long term life tests with p-n-p Alloyed Ge-transistors
M.J.O. Strutt
,
C. Villalaz
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 1018 KB
Your tags:
english, 1968
8
Failure modes of integrated circuits and their relationship to reliability
W. Workman
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 1.23 MB
Your tags:
english, 1968
9
Two experimental methods for the determination of the technical reliabilities of a system and its components
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 60 KB
Your tags:
english, 1968
10
Reliable decisions from unreliable measurements : F. R. van Wagner, Electron. Engr26, No. 4, April (1967), p. 50
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1968
11
Reliability physics for microelectronics : T. J. Nowak, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 193
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1968
12
How accurate are reliability predictions? : A. J. Feduccia and J. Klion, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 280
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1968
13
Reliability and maintainability technical and cost relationships : H. A. Eimstad, Jr., Proc. 1968 Ann. Symp. Reliab. Boston, U.S.A. January (1968), p. 331
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 183 KB
Your tags:
english, 1968
14
Failure mode, effects, and criticality analysis : K. Greene and T. J. Cunningham, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 374
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
15
Analyses of dielectric breakdown in samples and components : R. J. Onufer, C. E. Frahme and D. A. Lupfer, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 335
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
16
In-process control of structural defects in semiconductor manufacture : G. H. Schwuttke. Proc. Int. Symp. Test Methods Measurements Semicond. Dev. (1967), Paper No. 501, p. 1
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
17
Travelling solvent defects on silicon wafers : E. Biedermann, J. Electrochem. Soc.114, No. 2, February (1967), p. 207
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
18
Quality evaluation of welds as they are made by use of a fibre optic-near infrared sensor : S. N. Bobo, Jr., Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 534
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 202 KB
Your tags:
english, 1968
19
Nonelectronic reliability part data collection and analysis : D. Fulton, J. N. Holtz and R. E. Schafer, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 114
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
20
Reliability of microelectronic circuit connections : R. Bryant, M. H. Bester and J. McCormick. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 558
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
21
Further studies into connector field failure data as related to the commercial aviation industry : J. E. Atkinson, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 103
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
22
Predicting integrated circuit reliability via failure mechanisms : D. I. Troxel and B. Tiger. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 217
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 202 KB
Your tags:
english, 1968
23
Semiconductor device life and system removal rates : D. S. Peck, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 593
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
24
What reliability figures can I expect from ICs and how are they derived? : Electron. Des.2, January (1968), p. 108
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
25
Reliability of plastic semiconductors : J. Everitt, Electron. Equip. News, January (1968), p. 34
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
26
Semiconductor radiography: Its strengths, weaknesses and the controls necessary to assure its efficacy : M. M. Roth, Mater. Eval., January (1968), p. 8
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
27
Quality control during resistance welding of electronic components : P. M. Knowlson, Electron. Compon., February (1968), p. 186
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
28
The importance of electric contacts in electronics : H. Hoft, Nachrichtentechnik18, No. 2 (1968), p. 65. (In German.)
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 196 KB
Your tags:
english, 1968
29
Thermische einflusse der schaltfolge auf die lebensdauer des schutzgaskontaktes bei starker induktiver belastung: C. Huber and K. L. Rau, Frequenz22 (1968) 1, p. 17. (In German.)
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
30
Design of digital circuits with respect to their reliability : K. Meyer, Nachrichtentechnik17, No. 8 (1967), p. 312. (In German.)
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
31
Computer partitioning improves long-term reliability in space : M. Ball and F. H. Hardie, Space Aeronaut.47, No. 5, May (1967), p. 114
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
32
Some life-cycle cost estimates for electronic equipments: Methods and results : R. G. Stokes and F. N. Stehle, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 169
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
33
Reliability data from in-flight spacecraft : E. E. Bean and C. E. Bloomquist. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 271
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 199 KB
Your tags:
english, 1968
34
Reliability and maintainability considerations for total ship systems : P. J. Giordano and J. Sacks, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 155
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 102 KB
Your tags:
english, 1968
35
Reliability growth and its upper limit : E. P. Virene, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 265
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 102 KB
Your tags:
english, 1968
36
TIROS: A case history in reliability : R. Hoedemaker, E. Mowle and G. S. Gordon, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A., January (1968), p. 315
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 102 KB
Your tags:
english, 1968
37
System engineering for reliability and ease of maintenance : K. F. Rankin, Radio Electron. Engr, February (1968), p. 67
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 102 KB
Your tags:
english, 1968
38
Ultra reliable submerged repeaters : W. J. Archibald, Electron. Equip. News. February (1968), p. 46
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
39
Thermal analysis of ceramic-based microcircuits : J. H. Martin, V. T. Guntlow and D. P. Burks, Proc. 1967 Electron. Compon. Conf.; Washington DC, p. 354
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
40
Ohmic contacts for GaAs devices : R. H. Cox and H. Strack, Solid-St. Electron.10, (1967), p. 1213
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
41
Diffusion technology in electronics industry : B. L. Sharma, Radio Electron. India, October (1967), p. 15
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 100 KB
Your tags:
english, 1968
42
Field-effect transistor (FET) bibliography : H. F. Storm, IEEE Trans. Electron. Dev.ED 14, No. 10, October (1967), p. 710
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
43
The many facets of gallium arsenide : Electronics, November (1967), p. 105
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
44
A bibliography of metal-insulator-semiconductor studies : E. S. Schlegel, IEEE Trans. Electron. Dev.ED 14, No. 11. November (1967), p. 728
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
45
Microelectronics—another good year and more coming : R. E. Koeper, Electron. Des. News, January (1968), p. 26
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
46
Elastic ceramic material has multi-microcircuit uses : Int. Electron., February/March (1968), p. 15
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 101 KB
Your tags:
english, 1968
47
Transition probability of impact ionization in silicon : S. Ahmad and W. S. Khokley, J. Phys. Chem. Solids28 (1967), p. 2499
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 198 KB
Your tags:
english, 1968
48
Dielectric isolation layers for use in large scale integrated systems : K. C. Bingham and W. R. Cuttell. Proc. 1967 Electron Compon. Conf., Washington DC, p. 371
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
49
A resonant gate transistor, a frequency selective component for integrated circuits : J. R. Davis, R. A. Wickstrom, W. E. Newell. Proc. 1967 Electron. Compon. Conf., Washington, DC, p. 55
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
50
Instability in vacuum deposited silicon oxide : E. J. Swystun, IEEE Trans. Electron. Dev.ED 14, No. 11, November (1967), p. 760
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
51
Diffused diodes in silicon-on-sapphire : D. J. Dumin and R. S. Silver, Solid-St. Electron.11 (1968), p. 353
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
52
Metal-silicon Schottky barriers : M. J. Turner and E. H. Rhoderick, Solid-St. Electron.11. (1968), p. 291
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
53
Electron mobility in polar semiconductors at intermediate and high electric fields : E. de Alba and J. Warman G., J. Phys. Chem. Solids.29, (1968), p. 69
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 199 KB
Your tags:
english, 1968
54
Magnetoreactive element and new solid-state inductor : S. Kataoka, N. Hashizume and S. Iida. Solid-St. Electron.11, (1968), p. 155
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 103 KB
Your tags:
english, 1968
55
Fabrication of planar silicon transistors without photoresist : T. W. O'Keeffe and R. M. Handy. Solid-St. Electron., 11 (1968), p. 261
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 103 KB
Your tags:
english, 1968
56
The Resonistor: A frequency selective device utilizing the mechanical resonance of a silicon substrate : R. J. Wilfinger, P. H. Bardell and D. S. Chabra. IBM J. Res. Dev.12, No. 1, January (1968)
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 103 KB
Your tags:
english, 1968
57
Advances in zone refining : R. H. Heil, Jr.Solid St. Technol., January (1968), p. 21
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
58
Silicon nitride etching : F. Woitsch, Solid St. Technol., January (1968), p. 29
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
59
Analysis of single crystal silicon slices by neutron activation : G. Lunde, Solid St. Technol., January (1968), p. 32
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
60
Diode voltage—Capacitance method for measuring resistivity and impurity profile in a silicon epitaxial layer : D. C. Gupta, Solid St. Technol., February (1968), p. 31
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
61
Silicon device technology : D. H. Roberts, IEEE Spectrum, February (1968), p. 101
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
62
Sputtered thin-film molybdenum resistors : H. J. Degenhart, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 84
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
63
Anodic tantalum oxide capacitors prepared from reactively sputtered tantalum : D. Gerstenberg and J. Klerer, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 77
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 194 KB
Your tags:
english, 1968
64
Thick film field effect transistors based on silk-screened CdS : W. Witt, F. Huber and W. Laznovsky. Proc. 1967 Electron. Compon. Conf., Washington DC, p. 254
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
65
Thin film dielectric capacitors formed by reactive sputtering : R. M. Goldstein and F. W. Leonhard, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 312
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
66
Tantalum thin film “Breadboards” for switching circuit development : W. L. Harrod, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 152
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
67
Thin film hafnium technology : F. Huber, W. Witt and I. H. Pratt, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 66
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
68
Firing characteristics of palladium-silver thick film resistors : R. C. Headley, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 389
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
69
Thallium oxide glaze resistors : F. M. Collins and C. F. Parks, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 432
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
70
Photoconduction and trapping in sputtered tantalum oxide films : F. G. Ullman, J. Phys. Chem. Solids28 (1967), p. 279
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
71
Theory of conduction through thin insulating films with ionic space charge : J. Maserjian, J. Phys. Chem. Solids28 (1967), p. 1957
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
72
Conduction through TiO2 thin films with large ionic space charge : J. Maserjian and C. A. Mead, J. Phys. Chem. Solids28 (1967), p. 1971
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 104 KB
Your tags:
english, 1968
73
Vacuum deposition of silicon on corundum : F. H. Reynolds and A. B. M. Elliot, Solid-St. Electron.10 (1967), p. 1093
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 201 KB
Your tags:
english, 1968
74
Effects of traps on thin film transistors : H. Ishii and K. Yamada, Solid-St. Electron.10 (1967), p. 1201
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
75
Grain size distribution in thin films—I. Conservative systems : B. K. Chakraverty, J. Phys. Chem. Solids28 (1967), p. 2401
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
76
Grain size distribution in thin films—II. Non-conservative systems : B. K. Chakraverty, J. Phys. Chem. Solids. 28 (1967), p. 2413
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
77
Preparation and properties of clean surfaces of aluminum : F. Jona, J. Phys. Chem. Solids28 (1967), p. 2155
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 99 KB
Your tags:
english, 1968
78
Analysis of double-gate thin-film transistor : H. R. Farrah and R. F. Steinberg, IEEE Trans. Electron Dev.ED14, No. 2, February (1967), p. 69
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 194 KB
Your tags:
english, 1968
79
A compatible patterning technique for custom built thin and thick film circuits : W. L. Clough, Electron. Equip. News, June (1967), p. 4
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1968
80
Recent developments in thick-film hybrid modules : E. H. Melan, SCP Solid St. Technol., June (1967), p. 23
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1968
81
Radiation impedance approach to the analysis of a thin film inductor in a microwave integrated circuit : E. Yamashita and R. Mittra. IEEE Jl Solid-St. CircuitsSC2, No. 2, June (1967), p. 47
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1968
82
Properties of insulating thin films deposited by R. F. sputtering : W. A. Pliskin, P. D. Davidse, H. S. Lehman and L. I. Maissel, IBM J., July (1967), p. 461
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1968
83
Galvanomagnetic Thin Film devices : H. Freller and K. G. Gunther, Radio Electron. Engr, August (1967), p. 97
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1968
84
New thin-film resistive memory : J. G. Simmons and R. R. Verderber. Radio Electron. Engr, August (1967), p. 81
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 189 KB
Your tags:
english, 1968
85
A thermoelectric servo control for ultra-high-vacuum applications : D. L. Atherton and S. V. Soanes, SCP Solid St. Technol., September (1967), p. 31
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
86
Co-sputtered cermet films : N. C. Miller and G. A. Shirn, SCP Solid St. Technol., September (1967), p. 28
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
87
Demagnetizing fields in thin magnetic films : D. B. Dove, Bell Syst. Tech. J., September (1967), p. 1527
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
88
Vacuum deposition of glass dielectrics : V. J. Hammond and R. G. Hall, Electron. Compon., November (1967), p. 1273
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
89
Thermal limitations of the thin film transistor : D. J. Page, Solid-St. Electron.11 (1968), p. 87
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
90
A simple non-destructive method of measuring the thickness of transparent thin films between 10 and 600 nm : I. Franz and W. Langheinrich, Solid-St. Electron.11 (1968), p. 59
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
91
Flip-component technology : P. Scharf, T. Coleman and K. Avellar, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 269
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
92
A versatile integrated logarithmic video amplifier : L. E. Sanders and W. S. Henrion, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 173
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
93
A 28 volt logic microcircuit : D. J. Wahl and R. R. Mitchell, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 201
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
94
Power regulation and control using multifunctional integrated circuits : M. L. Embree, P. D. Fisher and B. H. Hamilton, Proc. IEEE55, No. 8, August (1967), p. 1466
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
95
Restoration of high frequencies in photomask line patterns by photographic non-linearity : H. Johnson, SCP Solid St. Technol., July (1967), p. 50
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1968
96
A high accuracy automated microflash camera : R. C. M. Beeh, SCP Solid St. Technol., July (1967), p. 43
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 191 KB
Your tags:
english, 1968
97
Automated mask production for semiconductor technology : H. O. Hook, SCP Solid St. Technol., July (1967), p. 35
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
98
Advances in computer generation of master artwork for micro-miniature circuits : P. R. Strickland and B. J. Crawford, SCP Solid St. Technol., July (1967), p. 31
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
99
A review of process equipment for an integrated circuit facility : V. K. Mitrisin, SCP Solid St. Technol., August (1967), p. 53
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
100
Production techniques for integrated circuits : G. B. Thomas, Electron. Equip. News, September (1967), p. 14
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
101
Diffusion furnaces for semiconductor processing : R. P. Donovan and R. M. Burger, SCP Solid St. Technol., October (1967), p. 40
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
102
Electron beam evaporation of metal oxide dielectric films : F. E. Cariou, V. A. Cajal and M. M. Gajary. Proc. 1967 Electron. Compon. Conf., Washington DC, p. 60
Journal:
Microelectronics Reliability
Year:
1968
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1968
103
Erratum
Journal:
Microelectronics Reliability
Year:
1968
File:
PDF, 11 KB
Your tags:
1968
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×