Volume 8; Issue 3

Microelectronics Reliability

Volume 8; Issue 3

1

Editorial

Journal:

Microelectronics Reliability

Year:

1969

File:

PDF, 7 KB

1969

2

Reports of conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 231 KB

english, 1969

3

Recent patents in microelectronics

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 132 KB

english, 1969

4

Courses in microelectronics and reliability

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 156 KB

english, 1969

5

The contribution of standardization to the reliability of electronic equipment

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 257 KB

english, 1969

6

A simple guide to the general assessment of MTBF

C.G. Deakin, F.B.I.S.

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 680 KB

english, 1969

7

Study of metal transfer between reed contacts

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 1.64 MB

english, 1969

8

Variable magnitude capacitors and resistors

L. Schaudinischky, N. Moses, A. Schwartz

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 446 KB

english, 1969

9

Fault indicators and the unavailability of redundant circuits

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 1.02 MB

english, 1969

10

Particulate contamination of vacuum-evaporated films

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 389 KB

english, 1969

11

Noise figure of the diode-stabilized linear integrated devices

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 113 KB

english, 1969

12

System reliability in telephone switching equipment

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 298 KB

english, 1969

13

Mikroelektronik 3: Manuskriptdruck der Vorträge zur 3, Mikroelektronik-Tagung in München vom 11, bis 13. November 1968 herausgegeben von Dr. Leo Steipe

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 58 KB

english, 1969

14

Microcircuits and their applications: Edited byW. Gore, 250 pp., 142 Illustrations, 8 Plates, Iliffe Books (1969), 90s

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 58 KB

english, 1969

15

Reliability methodology : A. Sternberg, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8, Transactions, p. 43

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 73 KB

english, 1969

16

Sequential reliability assurance in finite lots : K. T. Wallenius, Stanford Univ. Statistics Dept., Calif., U.S.A. AD 669791. TR-135. NONR-225-52. April (1968), 27 pp

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 73 KB

english, 1969

17

Reliability Physics : G. T. Jacobi, Proc. I.R.E.E. Aust., December (1968), p. 428

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 73 KB

english, 1969

18

Probabilistic reliability: An engineering approach : M. L. Shooman, McGraw Hill, 1968. 524 p. 116 Refs.

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 103 KB

english, 1969

19

The Methods of reliability : W. B. Rossnagel, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8 (1968), Transactions, p. 259

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 103 KB

english, 1969

20

Wanted—Realistic Alternatives to MIL-STD-781 : P. B. Brigham, Proc. 1969 Ann. Symp. Reliab., Chicago, January 21–23 (1969), p. 280

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 103 KB

english, 1969

21

The reliability-design engineer relationship : M. Trieb, 1968 Prod. Ass. Conf. Tech, Exhibition, Long Island, N.Y., June 7–8 (1968), Transactions, p. 1

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 103 KB

english, 1969

22

Using cost data to optimize reliability : K. Weir, 22nd Am. Soc. Quality Control, Ann. Tech. Conf., Philadelphia, May 6–8 (1968), Transactions, p. 491 (A68-31438)

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 103 KB

english, 1969

23

Economical reliability program design : B. L. Blair and A. Fox, Proc. 1969 Ann. Sym. Reliab., Chicago, January 21–23 (1969), p. 181

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 104 KB

english, 1969

24

Sense and nonsense in electronic reliability engineering : J. H. Sharpe, Proc. I.R.E.E. Aust., October (1968), p. 358

Journal:

Microelectronics Reliability

Year:

1969

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english

File:

PDF, 104 KB

english, 1969

25

Automatic test equipment : M. E. Walker, Instrum. Pract.22, December (1968), p. 1016

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 104 KB

english, 1969

26

Reliability tasks vs. product reliability : D. I. Troxel, Proc. 1969 Ann. Symp. Reliab., Chicago, January 21–23 (1969), p. 48

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 104 KB

english, 1969

27

Is reliability necessary? : P. P. Donnelly, Utilization of Reliability, Ann. West Coast Reliab., 9th Century City, Calif., February 16, (1968) Papers, p. 61

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 201 KB

english, 1969

28

How reliable are plastic encapsulated semiconductors? : V. J. Lukach, Insulation, September (1968), p. 14

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

29

Effects of nuclear radiation on a high reliability silicon power diode I-Change in I–V design characteristics : J. F. Been, Natl Aeronaut. Space Admin., Washington, D.C., NASA TN D-4620, June (1968), 36pp

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

30

Stress strength models—A solution to accelerated life testing : S. P. Aranoff, Utilization of Reliability: Ann. West Coast Reliab. Symp., 9th Century City, California, February 16 (1968), Papers, p. 67

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

31

Some investigation of failure mechanism in thin film resistors : C. J. Brett and E. A. Quincey, Proc. Tech. Programme. Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 174

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

32

Measuring microbond integrity with an infrared microradiometer : D. H. Schumacher, Mater. Eval., December (1968), p. 257

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 201 KB

english, 1969

33

Reliability of electrodeposited cylindrical permalloy films : T. Furuoya and Y. Suganuma. Trans. Inst. Electron. Commun. Engrs Japan51, No. 7, July (1968), p. 327

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 104 KB

english, 1969

34

Assuring integrated circuit reliability during production : D. I. Troxel and B. Tiger, 22nd Am. Soc. Quality Control, Ann. Tech. Conf., Philadelphia, May 6–8 (1968), Transactions, p. 347

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 104 KB

english, 1969

35

A process control specification for integrated circuits : W. R. Rodrigues de Miranda, 22nd Am. Soc. Quality Control, Ann. Tech. Conf., Philadelphia, May 6–8 (1968), Transaction, p. 799

Journal:

Microelectronics Reliability

Year:

1969

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english

File:

PDF, 104 KB

english, 1969

36

Reliable soldering of printed circuit boards : P. J. Bud, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8 (1968), Transactions, p. 333

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 104 KB

english, 1969

37

Preliminary analysis of radio component reliability : I-An-Li, in its Transl. on Communist China: Sci Technol. No. 383, 27 June (1967), p. 1 (N67-35606)

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 201 KB

english, 1969

38

Packaging and reliability in integrated circuits : R. L. Coren and T. J. Matcovich, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8, 1968, Transactions, p. 137

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 100 KB

english, 1969

39

Physical analysis of stress testing for failure of electronic components : C. F. Kooi, IEEE Trans. Reliab.R17, June (1968), p. 80

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 100 KB

english, 1969

40

Relay failure analysis techniques : J. J. Lombard, Jr., 16th Ann. Nat. Relay Conf., Oklahoma State University, Stillwater, April 23, 24 (1968), Proceedings, p. 11-1 (Paper 11: A68-28188)

Journal:

Microelectronics Reliability

Year:

1969

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english

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english, 1969

41

Testing high reliability relays by use of automatic equipment : C. C. Bates and J. R. Guth, 16th Ann. Nat. Relay Conf., Oklahoma State University, Stillwater, April 23, 24 (1968), Proceedings, p. 9-1

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 100 KB

english, 1969

42

Aging characteristics of tantalum nitride thin film resistors : J. S. Fisher, 1968 Electron. Compon. Conf., May 8–10 (1968), Proceedings, p. 299

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 29 KB

english, 1969

43

X-Ray vidicon analysis of electronic components : J. J. Lombardi, Jr. and H. F. Padden, 22nd Am. Soc. Quality Control, Ann. Tech. Conf., Philadelphia, May 6–8 (1968), Transactions, p. 479 (A68-31437)

Journal:

Microelectronics Reliability

Year:

1969

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PDF, 90 KB

1969

44

High reliability screening of semiconductor and integrated circuit devices : J. Lombardi, L. McDonough and H. Padden, Washington, NASA, April 1967, 161 p. Refs. (Contract NAS5-9639) (NASA-CR-721: N67-23322) Avail: CFSTI

Journal:

Microelectronics Reliability

Year:

1969

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PDF, 90 KB

1969

45

The reliability of screened metal film resistors : J. P. Mahner, D. P. Burks, W. G. Seeley and H. Geller, 1968 Electron. Compon. Conf., May 8–10 (1968), Proceedings, p. 271

Journal:

Microelectronics Reliability

Year:

1969

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PDF, 90 KB

1969

46

Micropower error-correcting redundant circuit design : R. E. McMahon and N. B. Childs, 23 August (1967), 28 p. Refs (Contract AF 19(628)-5167), (AD-659750: ESD-TR-67-483: TN-1967-27: N68-11273)

Journal:

Microelectronics Reliability

Year:

1969

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PDF, 90 KB

1969

47

Practical aspects of electronic instruments—cost, reliability, and maintenance : J. R. Hileman, Instrum. Tech., No. 5, May (1968), p. 43

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 197 KB

english, 1969

48

A procedure for generating test sequences to detect sequential circuit failures : H. Kubo, NEC Res. Dev., Japan, No. 12, October (1968), p. 69

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

49

Comparison of predicted and demonstrated reliability and maintainability figures : A. Coppola and J. E. Daveau, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8, Transactions, p. 327

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

50

Reliable control systems Part 1. Upgrading instrument performance : P. L. Kenny and H. H. Koppel, Instrum. Tech.15, No. 9, September (1968), p. 39

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

51

7 years of OAO : J. E. Anderson, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8 (1968), Transactions, p. 303

Journal:

Microelectronics Reliability

Year:

1969

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english

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PDF, 101 KB

english, 1969

52

A method for estimated errors in system reliability prediction : S. S. Tung, 22nd Am. Soc. Quality Control, Ann. Tech. Conf., Philadelphia, May 6–8 (1968), Transactions, p. 413 (A68-31433)

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 106 KB

english, 1969

53

Maintainability demonstration procedure and data : C. E. Cunningham, 1968 Prod. Ass. Conf. Tech. Exhibition, Long Island, N.Y., June 7–8, 1968, Transactions, p. 85

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 107 KB

english, 1969

54

A Bayesian reliability growth model : S. M. Pollock, IEEE Trans. Reliab.R17, No. 4, December (1968), p. 187

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 107 KB

english, 1969

55

Operational system effectiveness study a layman's approach : H. Reiche, Proc. 1969 Ann. Symp. Reliab., Chicago, January 21–23 (1969), p. 263

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 107 KB

english, 1969

56

System cost effectiveness—the end of the first era : J. Klion, Utilization of Reliability: Ann. West Coast Reliab. Symp., 9th Century City, California, February 16 (1968), Papers, p. 21

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 196 KB

english, 1969

57

Monolithic circuit test standards : G. O. Compton and J. R. Adame, Fairchild Camera and Instrument Corp. Semiconductor Div., U.S.A. NASA CR 91346. NAS-8-21199 N-68-12972. October (1967), 285 pp

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 91 KB

english, 1969

58

Microelectronic device data handbook : Volume 1: Text. Arinc Res. Corp., Washington, D.C. NASA CR 1110 548-01-7-803. NAS-12-528. July (1968), 260 pp

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 91 KB

english, 1969

59

Will radiation wreck your IC design? : J. J. Kubinec, Electron. Des.4, February 15 (1969), p. 78

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 91 KB

english, 1969

60

The development of large-scale integration : K. J. Dean, Radio Electron. Engr, March (1969), p. 135

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 91 KB

english, 1969

61

The ever increasing complexity of integrated circuits : R. G. Hibberd, Electron. Equip. News, February (1969), p. 6

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 91 KB

english, 1969

62

The economics of micropacking : M. A. Champney, Electron. Equip. News, February (1969), p. 40

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 91 KB

english, 1969

63

The use of simple hybrid integrated circuit methods as a research tool : B. G. King and W. C. G. Ortel, Mikroelektronik 3, Publ. by R. Oldenbourg, München, Germany (1969), p. 9

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 189 KB

english, 1969

64

Comparison of bipolar and MOS integrated circuits : J. Hodgson, Electron. Equip. News, March (1969), p. 6

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

65

High-precision alignment device : Anon, CSIR Tech. Inf. Ind.6, No. 9, September (1968), p. 1

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

66

Thermal considerations for hybrid microcircuit packages and assemblies with high power dissipations : R. C. Chu, Proc. Tech. Programme, Int. Elect. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 411

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

67

Computer aided layout of microcircuits : W. J. Cullyer and S. Tubbs, Signals Res. Dev. Est., Min. of Tech. U.K., SRDE REP-68014, September (1968), 35 pp

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

68

The application of a computer in the design and manufacture of photolithographic masks for LSI interconnection patterns : P. E. Radley, T. J. Rowe and D. J. Moule, Proc. Tech. Programme Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 556

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

69

A high precision alignment device : A. Engelter and P. Bierbaum, Solid St. Technol., 11, No. 11, November (1968), p. 43

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

70

The ultrasonic bonding of silicon integrated circuit chips : Y. Gurler and K. C. Bingham, Proc. Tech. Programme, Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 137

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

71

Computer's aid for integrated circuit mask production : J. P. Vasseur, Onde Elect., January (1969), p. 90. (In French.)

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 99 KB

english, 1969

72

A versatile manufacturing method for the production of complex hybrid microelectronics assemblies : J. T. Law, Proc. Tech. Programme, Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 401

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 202 KB

english, 1969

73

Computer aided integrated circuit design : S. Forte and J. Freeman, Mikroelektronik 3, Publ. by R. Oldenbourg, München, Germany (1969), p. 59

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 106 KB

english, 1969

74

New developments in interconnection for hybrid microelectronics : R. J. Clark, Mikroelektronik 3, Publ. by R. Oldenbourg, München, Germany (1969), p. 665

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 106 KB

english, 1969

75

Design and applications of metal oxide silicon array integrated circuits (Mosaics's) to data handling systems : G. R. Parsons and G. D. Shenton, Mikroelektronik 3, Publ. R. Oldenbourg, München, Germany (1969), p. 589

Journal:

Microelectronics Reliability

Year:

1969

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english

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76

Power supplies for ICs : Anon, Int. Electron.14, No. 5, October/November (1968), p. 34

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 110 KB

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77

All-IC hybrid computer eliminates the patchwork from programming : K. Kurokawa, Electronics, March 17 (1969), p. 100

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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english, 1969

78

MOST capacitor memory : O. Enomoto and K. Ichijo, NEC Res. Dev., Japan No. 12, October (1968), p. 29

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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english, 1969

79

A microwave integrated transistor amplifier and the high-frequency limit of transistors : K. Fujinuma and T. Akiyama, Mikroelektronik 3, Publ. by R. Oldenbourg, München, Germany (1969), p. 73

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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80

Some new integrated circuits for computers and desk calculators : K. Odagawa, Mikroelektronik 3, Publ. R. Oldenbourg, München, Germany (1969), p. 455

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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english, 1969

81

Semiconductor memories : R. C. Baron, Mikroelektronik 3, Publ. R. Oldenbourg, München, Germany (1969), p. 231

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 111 KB

english, 1969

82

Integrated color televison receiver : E. Sugata, T. Namekawa, K. Miyawaki and J. Nakai, Mikroelektronik 3, Publ. R. Oldenbourg, München, Germany (1969), p. 619

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 111 KB

english, 1969

83

Epitaxial processing and equipment : I. A. Lesk, Proc. Tech. Programme, Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 618

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 111 KB

english, 1969

84

Handling and bonding of beam-lead sealed-junction integrated circuits : M. P. Eleftherion, Proc. Tech. Programme, Int. Electron Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 123

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 214 KB

english, 1969

85

Current-voltage and current-temperature characteristics of alloyed pGe-nSi heterojunctions : M. Grynglas and E. Janik, Electron Technol.1, No. 1 (1968), p. 85

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 108 KB

english, 1969

86

Metallization, dicing and circuit assembly : E. D. Metz, Proc. Tech. Programme, Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 639

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 108 KB

english, 1969

87

Pseudopotential impurity theory and covalent bonding in semiconductors : M. Jaros and P. Kostecky, J. Phys. Chem. Solids30 (1969), p. 497

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 108 KB

english, 1969

88

Normalized thermionic-field (T-F) emission in metal-semiconductor (Schottky) barriers : C. R. Crowell and V. L. Rideout. Solid-St. Electron.12 (1969), p. 89

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 204 KB

english, 1969

89

Germanium IC's point the way towards picosecond computers : A. Reisman, Electronics 3 March (1969), p. 88

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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english, 1969

90

Non-ohmic microwave conductivity in semiconductor posts : K. Hess, G. Nimtz and K. Seeger, Solid-St. Electron.12 (1969), p. 79

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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english, 1969

91

Schottky diodes speed up digital IC's : R. H. Cushman. Electron. Des. News, 1 January (1969), p. 37

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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92

Preparation of high purity silicon : K. Singh and L. P. Pandey, J. Sci. Ind. Res., India 27, No. 10, October (1968), p. 386

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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93

A ceramic based thin film system for low cost production of modules : N. L. Sigournay and H. N. Evans, Proc. Tech. Programme, Int. Electron. Packaging Prod. Conf., Brighton, October 8–10 (1968), p. 155

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

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PDF, 101 KB

english, 1969

94

The deposition of tantalum from the vapour-gas phase : Ya M. Polyakov and G. Z. Zamesova, Rep FTD-MT-65-20: AD-666896, May 1967, p. 167. Sci. Tech. Aerospace Reps6 (13), 2018 N68-23838

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

95

The physics of thin film deposition : B. Lewis, Electron. Equip. News, March (1969), p. 42

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 199 KB

english, 1969

96

Adhesive strength of evaporated gold films on glass substrate : T. Horiuchiet al. J. Vac. Soc. Japan11, No. 8 (1968), p. 285. (In Japanese.)

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

97

Low-density tantalum : B. H. Vromen, Bell Labs Rec., November (1968), p. 327

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

98

Four point mercury contact probe for electrical resistivity measurements of thin films : R. A. Cooper and E. Lerner, Rev. Sci. Instrum.39, No. 8 (1968), p. 1207

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

99

Getter-ion pumps of the magnetron type and an attempted interpretation of the discharge mechanism : M. Wutz, Vacuum10, No. 1 (1968), p. 1

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

100

R-F sputtering processes : J. L. Vossen and J.J. O'Neill, RCA Rev.29, No. 2 (1968), p. 149

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

101

Thin-film transistors : J. C. Anderson, Electron. Pwr, March (1969), p. 90

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 101 KB

english, 1969

102

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 132 KB

english, 1969

103

Papers to be published in future issues

Journal:

Microelectronics Reliability

Year:

1969

Language:

english

File:

PDF, 26 KB

english, 1969