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Volume 29; Issue 1
Main
Micron
Volume 29; Issue 1
Micron
Volume 29; Issue 1
1
In situ high-resolution electron spectroscopic imaging of precipitate growth in an AlAg alloy
A.A. Csontos
,
M.M. Tsai
,
J.M. Howe
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 722 KB
Your tags:
english, 1998
2
Elemental contents in vacuolar granules of ectomycorrhizal fungi measured by EELS and EDXS. A comparison of different methods and preparation techniques
H. Bücking
,
S. Beckmann
,
W. Heyser
,
I. Kottke
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 887 KB
Your tags:
english, 1998
3
Quantitative chemical phase analysis of EFTEM elemental maps using scatter diagrams
Werner Grogger
,
Ferdinand Hofer
,
Gerald Kothleitner
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 777 KB
Your tags:
english, 1998
4
Characterisation of thick film Ti/Al nanolaminates
L. Coast-Smith
,
R. Brydson
,
P. Tsakiropoulos
,
F. Hofer
,
W. Grogger
,
D.V. Dunford
,
C.M. Ward-Close
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 1.23 MB
Your tags:
english, 1998
5
Characterization of deposits in human lung tissue by a combination of different methods of analytical electron microscopy
Ferdinand Hofer
,
Maria A. Pabst
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 872 KB
Your tags:
english, 1998
6
A post-column imaging energy filter with a 20482-pixel slow-scan CCD camera
Alexander J. Gubbens
,
Harold A. Brink
,
Mike K. Kundmann
,
Stuart L. Friedman
,
Ondrej L. Krivanek
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 620 KB
Your tags:
english, 1998
7
Plasmon dispersion measurements in the electron microscope: Application to carbon solids
W.E. McBride
,
D.G. Mc Culloch
,
D.R. McKenzie
,
D.C. Green
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 408 KB
Your tags:
english, 1998
8
On the application of energy-filtering TEM in materials science: III. Precipitates in steel
Peter Warbichler
,
Ferdinand Hofer
,
Peter Hofer
,
Ernst Letofsky
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 1.21 MB
Your tags:
english, 1998
9
An EFTEM and conical dark field investigation of co-sputtered CoPt+Yttria stabilized zirconia thin films
R.A. Ristau
,
F. Hofer
,
K. Barmak
,
K.R. Coffey
,
J.K. Howards
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 871 KB
Your tags:
english, 1998
10
Editorial Board
Journal:
Micron
Year:
1998
Language:
english
File:
PDF, 80 KB
Your tags:
english, 1998
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